Elastic membrane for semiconductor wafer polishing apparatus
Granted 20 Mar 2018 · no office action yet
Assignee: Ebara Corporation
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Makoto Fukushima, Osamu Nabeya, Keisuke Namiki, Shingo Togashi +2 · Examiner: Elizabeth J Oswecki · AU 2912 · TC 2900
Life of the patent
4 dated eventsDescription
1 parts›FIG. 1 is a top plan view of…
FIG. 1 is a top plan view of a first embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 2 is a bottom plan view thereof;
FIG. 3 is a front side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a left side view thereof;
FIG. 6 is a cross sectional view taken along section line 6 - 6 in FIG. 1 ;
FIG. 7 is an enlarged perspective view of a portion labeled FIG. 7 in FIG. 1 ;
FIG. 8 is an opposite side view of FIG. 7 ;
FIG. 9 is a top plan view of a second embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 10 is a bottom plan view thereof;
FIG. 11 is a front side view thereof;
FIG. 12 is a right side view thereof;
FIG. 13 is a left side view thereof;
FIG. 14 is a cross sectional view taken along section line 14 - 14 in FIG. 9 ;
FIG. 15 is an enlarged perspective view of a portion labeled FIG. 15 in FIG. 9 ; and,
FIG. 16 is an opposite side view of FIG. 15 .
The broken lines shown in the drawings represent portions of the elastic membrane for semiconductor wafer polishing apparatus that form no part of the claimed design. The dashed-dot-dashed lines represent the boundary lines of the claimed design.
All surfaces not shown form no part of the claimed design.
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