USPatentGranted
S

Wafer prober

Granted 16 Sep 1997 · no office action yet

Assignee: Tokyo Electron Limited

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Munetoshi Nagasaka, Haruhiko Yoshioka, Osamu Kamata, Kazumi Yamagata +1 · Examiner: Antoine Duval Davis · AU 293 · TC 2900

Application
Not granted yet
filed 25 Apr 1996
Publication
Not published
not published
Patent· this page
US D383683
granted 16 Sep 1997

Life of the patent

3 dated events
⤢ drag to zoom19961998200020022004200620082010201220142016ProsecutionTerm & fees
ProsecutionTerm & feeshover for detail · click to open

Description

1 parts
›FIG. 1 is a top/front/left side perspective view…

FIG. 1 is a top/front/left side perspective view of a wafer prober showing our new design;

FIG. 2 is a top/front/left side perspective view thereof with a front cover open;

FIG. 3 is a front view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a back view thereof;

FIG. 7 is a left side view thereof; and,

FIG. 8 is a bottom view thereof.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D10/75

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this patent are not paired with the granted ones in what we hold.

File wrapper

Pendency
1.4 y
509 days filing → grant
Office actions
0
on the grant's record
Examiner
Antoine Duval Davis
art unit 293 · TC 2900
Citations: 4 back · 0 forward

Term & fees

See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.

Log in to unlock

Validity challenges

See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.

Log in to unlock

Citations

See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.

Log in to unlock