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Inventor

Haruhiko Yoshioka

Inventor
Yamanashi, JP

Overview

15→
Patents
1989–2007
Patent span
Physics
Primary field (CPC G)

Patents· 15 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables52%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1036%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors4%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices4%
LOC104%
PatentTitleYear
7,221,176'Vacuum prober and vacuum probe method'20077,106,082'Stage driving apparatus and probe method'20066,933,736'Prober'20056,927,587'Probe apparatus'20056,850,052'Probing method'20056,634,245'Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism'20036,262,570'Probe apparatus'20016,140,828'Prober and probe method'20005,912,555'Probe apparatus'19995,804,983'Probe apparatus with tilt correction mechanisms'1998D0383683'Wafer prober'19975,642,056'Probe apparatus for correcting the probe card posture before testing'19975,640,101'Probe system and probe method'19975,585,738'Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment'19964,812,201'Method of ashing layers, and apparatus for ashing layers'1989

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989–2007Patents assigned to TOKYO ELECTRON LTD (15)· patent assignee history
1989–2001Based in Yamanashi, JP· patent location history
1996–1997Patents assigned to TEL YAMANISHI KK (3)· patent assignee history
1997Based in Yamanishi-ken, JP· patent location history
2003–2005Based in Nishikamo-gun, JP· patent location history
2005–2007Based in Nirasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOKYO ELECTRON LTD151989–2007
TEL YAMANISHI KK31996–1997
Locations
LocationPatentsSpan
Yamanashi, JP81989–2001
Nirasaki, JP42005–2007
Nishikamo-gun, JP22003–2005
Yamanishi-ken, JP11997