Inventor
Kazumi Yamagata
Inventor
Yamanashi, JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables50%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them10%
H04NPictorial communication, e.g. television10%
LOC1010%
PatentTitleYear
11,076,072Image capturing apparatus improved in heat dissipation efficiency while avoiding increase in size20217,944,200'Probe apparatus'20117,701,236'Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer'20106,118,290'Prober and method for cleaning probes provided therein'20006,060,892'Probe card attaching mechanism'2000D0383683'Wafer prober'19975,640,100'Probe apparatus having probe card exchanging mechanism'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2011Patents assigned to TOKYO ELECTRON LTD (6)· patent assignee history
1997Patents assigned to TEL YAMANISHI KK (1)· patent assignee history
1997–2000Based in Yamanashi, JP· patent location history
2010–2011Based in Nirasaki, JP· patent location history
2021Patents assigned to CANON KK (1)· patent assignee history
2021Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOKYO ELECTRON LTD | 6 | 1997–2011 |
| CANON KK | 1 | 2021 |
| TEL YAMANISHI KK | 1 | 1997 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yamanashi, JP | 4 | 1997–2000 |
| Nirasaki, JP | 2 | 2010–2011 |
| Kanagawa, JP | 1 | 2021 |