USPatentGranted
B2

Film forming method, film forming apparatus, pattern forming method, and manufacturing method of semiconductor apparatus

Granted 21 Sep 2010 · 8 office actions

Current assignee: Kabushiki Kaisha Toshiba · originally Toshiba

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Inventors: Tatsuhiko Ema, Nobuhide Yamada, Shinichi Ito, Kei Hayasaki +2 · Examiner: Kirsten C Jolley · AU 1715 · TC 1700

Life of the patent

16 dated events
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Abstract

There is disclosed a film forming method comprising continuously discharging a solution adjusted so as to spread over a substrate by a given amount to the substrate through a discharge port disposed in a nozzle, moving the nozzle and substrate with respect to each other, and holding the supplied solution onto the substrate to form a liquid film, wherein a distance h between the discharge port of the nozzle and the substrate is set to be not less than 2 mm and to be in a range less than 5×10 −5 qγ (mm) given with respect to a surface tension γ (N/m) of the solution, discharge speed q (m/sec) of the solution continuously discharged through the discharge port, and a constant of 5×10 −5 (m·sec/N).

Claims

10 · 1 independent · depth 5
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10 granted claims

Classifications

8 codes
IPC · International Patent Classification
Section B — Performing operations; transporting
  • B05D3/12
USPC · US Patent Classification
427/8118/665427/240427/377118/712118/52438/758

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File wrapper

⤢ drag to zoomJan 2008Jul 2008Jan 2009Jul 2009Jan 2010Jul 2010USPTOApplicantRestriction requirementNon-final rejectionResponse after non-finalFinal rejectionRequest for continued examinationRequest for continued examination
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Pendency
2.8 y
1,023 days filing → grant
Office actions
4
after a restriction
Responses
4
2 RCE
Interviews
1
examiner interview summaries
Examiner
Kirsten C Jolley
art unit 1715 · TC 1700
Citations: 65 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20080090001 A117 Apr 2008

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Citations

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