Film forming method, film forming apparatus, pattern forming method, and manufacturing method of semiconductor apparatus
Granted 21 Sep 2010 · 8 office actions
Current assignee: Kabushiki Kaisha Toshiba · originally Toshiba
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Inventors: Tatsuhiko Ema, Nobuhide Yamada, Shinichi Ito, Kei Hayasaki +2 · Examiner: Kirsten C Jolley · AU 1715 · TC 1700
Life of the patent
16 dated eventsAbstract
There is disclosed a film forming method comprising continuously discharging a solution adjusted so as to spread over a substrate by a given amount to the substrate through a discharge port disposed in a nozzle, moving the nozzle and substrate with respect to each other, and holding the supplied solution onto the substrate to form a liquid film, wherein a distance h between the discharge port of the nozzle and the substrate is set to be not less than 2 mm and to be in a range less than 5×10 −5 qγ (mm) given with respect to a surface tension γ (N/m) of the solution, discharge speed q (m/sec) of the solution continuously discharged through the discharge port, and a constant of 5×10 −5 (m·sec/N).
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10 · 1 independent · depth 5Classifications
8 codes- B05D3/12
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20080090001 A1 | 17 Apr 2008 |
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