Probe pin
Granted 10 Dec 2019 · no office action yet
Assignee: Kabushiki Kaisha Nihon Micronics
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Attorney: Attorney · Log in to unlock
Inventors: Mika Nasu · Examiner: Antoine Duval Davis · AU 2917 · TC 2900
Life of the application
6 dated eventsDescription
1 parts›FIG. 1 is a perspective view of a…
FIG. 1 is a perspective view of a portion of a probe pin, showing the claimed design;
FIG. 2 is a front view of the probe pin;
FIG. 3 is a rear view of the probe pin;
FIG. 4 is a left side view of the probe pin;
FIG. 5 is a right side view of the probe pin;
FIG. 6 is a top plan view of the probe pin;
FIG. 7 is a bottom plan view of the probe pin;
FIG. 8 is an enlarged view of the section of the probe pin identified by the reference numbers 8 - 8 in FIG. 2 ; and,
FIG. 9 is an enlarged left side view of the probe pin.
The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.
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