Inventor
Mika Nasu
Inventor
Tokyo, JP
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
LOC10primary
LOC1038%
G01RMeasuring electric variables27%
LOC1323%
H01RElectrically-conductive connections8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
PatentTitleYear
11,022,627Probe and electric connecting apparatus202110,775,411Probe card and contact inspection device2020D0874958Electric contact2020D0873683Electric contact2020D0873684Electric contact2020D0873685Electric contact2020D0873686Electric contact2020D0873160Electric contact2020D0873159Electric contact2020D0873161Electric contact2020D0869305Probe pin2019D0867183Probe pin2019D0847757Probe pin201910,215,801Contact inspection device having a probe head and rotation restricting portions201910,024,908Probe and contact inspection device20189,583,857'Electrical contactor and electrical connecting apparatus'2017D0770986'Plunger housing body'2016D0770985'Electric contact'2016D0766187'Plunger housing body'2016D0766188'Plunger housing body'2016D0765602'Electric contact'20169,435,854'Electrical contactor and contact method for the same'20169,164,130'Method for manufacturing a probe'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2021Patents assigned to NIHON MICRONICS KK (23)· patent assignee history
2015Based in Oita-shi, JP· patent location history
2016Patents assigned to KK NIHON MICRONIC (1)· patent assignee history
2016–2020Based in Tokyo, JP· patent location history
2017Patents assigned to KK MIHON MICRONICS (1)· patent assignee history
2018–2020Based in Musashino, JP· patent location history
2021Based in Oita, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NIHON MICRONICS KK | 23 | 2015–2021 |
| KK MIHON MICRONICS | 1 | 2017 |
| KK NIHON MICRONIC | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 19 | 2016–2020 |
| Musashino, JP | 2 | 2018–2020 |
| Oita, JP | 1 | 2021 |
| Oita-shi, JP | 1 | 2015 |