USPatent applicationPatented

Charged particle beam lens and exposure apparatus using the same

Granted 2 Dec 2014 · 1 office action

Assignee: Canon Inc.

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Inventors: Yutaka Setomoto, Takahisa Kato · Examiner: Michael Logie · AU 2881 · TC 2800

Life of the application

6 dated events
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Abstract

An electrostatic charged particle beam lens includes an electrode including a flat plate having a first surface having a normal line extending in a direction of an optical axis and a second surface opposite to the first surface, the electrode having a through-hole extending from the first surface to the second surface. When an opening cross section is defined as a cross section of the through-hole taken along a plane perpendicular to the normal line and a representative diameter is defined as a diameter of a circle obtained by performing regression analysis of the opening cross section, a representative diameter of the opening cross section in a first region that is on the first surface side and a representative diameter of the opening cross section in a second region that is on the second surface side are smaller than a representative diameter of the opening cross section in a third region that is a region in the electrode disposed between the first surface and the second surface.

Claims as granted

9 claims

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Classifications

5 codes
IPC · International Patent Classification
Section H — Electricity
  • H01J37/18
  • H01J37/12
USPC · US Patent Classification
250/396.R250/492.3250/492.2

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File wrapper

⤢ drag to zoomJul 2012Jan 2013Jul 2013Jan 2014Jul 2014Jan 2015USPTOApplicantNotice of allowanceRequest for continued examination
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Pendency
2.7 y
993 days filing → grant
Office actions
0
none on record
Responses
1
1 RCE
Examiner
Michael Logie
art unit 2881 · TC 2800
Citations: 21 back · 0 forward

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