Charged particle beam lens and exposure apparatus using the same
Granted 2 Dec 2014 · 2 office actions
Assignee: Canon Inc.
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Yutaka Setomoto, Takahisa Kato · Examiner: Michael Logie · AU 2881 · TC 2800
Life of the patent
7 dated eventsAbstract
An electrostatic charged particle beam lens includes an electrode including a flat plate having a first surface having a normal line extending in a direction of an optical axis and a second surface opposite to the first surface, the electrode having a through-hole extending from the first surface to the second surface. When an opening cross section is defined as a cross section of the through-hole taken along a plane perpendicular to the normal line and a representative diameter is defined as a diameter of a circle obtained by performing regression analysis of the opening cross section, a representative diameter of the opening cross section in a first region that is on the first surface side and a representative diameter of the opening cross section in a second region that is on the second surface side are smaller than a representative diameter of the opening cross section in a third region that is a region in the electrode disposed between the first surface and the second surface.
Claims
9 · 1 independent · depth 3Classifications
5 codes- H01J37/18
- H01J37/12
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20140151570 A1 | 5 Jun 2014 |
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