Electrical test probe wedge tip
Granted 3 Jul 2001
Current assignee: Lecroy Corporation · originally LeCroy Corporation
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Attorney: Attorney · Log in to unlock
Inventors: Julie A. Campbell · Examiner: Antoine Duval Davis · AU 2913 · TC 2900
Life of the application
14 dated eventsDescription
1 parts›FIG. 1 is a general perspective view of…
FIG. 1 is a general perspective view of an electrical test probe wedge tip showing the new design, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 2 is a front view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 3 is a right side view of the electrical test probe wedge tip, the left side view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 4 is a back view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 5 is a top view of the electrical test probe wedge tip; and,
FIG. 6 is a bottom view of the electrical test probe wedge tip.
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