FIG. 1 is a general perspective view of an electrical test probe wedge tip showing the new design, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 2 is a front view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 3 is a right side view of the electrical test probe wedge tip, the left side view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 4 is a back view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.

FIG. 5 is a top view of the electrical test probe wedge tip; and,

FIG. 6 is a bottom view of the electrical test probe wedge tip.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1

1 granted claims

›1.independentThe ornamental design for an electrical test probe wedge tip, as shown and described.

Classifications

1 codes

USPC · US Patent Classification

D10/80

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337 days filing → grant

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Examiner

Antoine Duval Davis

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