Data transmission circuit and data communication system
Granted 19 Jul 2011 · 1 office action
Assignee: Fujitsu Limited
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Attorney: Attorney · Log in to unlock
Inventors: Hisakatsu Yamaguchi · Examiner: Lam T Mai · AU 2819 · TC 2800
Life of the application
8 dated eventsAbstract
A data transmission circuit that converts parallel data signals into a serial data signal to transmit the serial data signal includes a clock generation circuit, an output circuit, and a shift register circuit for securely conducting data communication among internal elements regardless of the improvement in data transfer rate, the increase in manufacturing variance, the variation in power supply voltage and temperature, and the like. The clock generation circuit generates a clock signal. The output circuit is provided to output the serial data signal. The shift register circuit acquires the parallel data signals and sequentially transfers the acquired parallel data signals to the output circuit in a bitwise manner with the use of a shift operation synchronized with the clock signal from the clock generation circuit.
Description
10 parts›CROSS-REFERENCE TO RELATED APPLICATION
This application is a Continuation Application of International Application No. PCT/JP2007/053534, filed Feb. 26, 2007, designating the U.S., the entire contents of which are incorporated herein by reference.
›FIELD
The embodiment is related to a data transmission circuit and a data communication system applied for performing data communication among elements or circuit blocks.
›BACKGROUND · 1 of 2
FIG. 5 illustrates an example of a data transmission circuit in a related art. A data transmission circuit 100 includes a PLL (Phase Locked Loop) circuit 101 , dividers 102 to 104 , a FIFO (First-In First-Out) 105 , multiplexers (MUXs) 106 to 109 , and an output driver 110 . The PLL circuit 101 generates a clock signal CKA (frequency: 20 GHz) based on a clock signal REF_CK (frequency: 625 MHz). The divider 102 frequency-divides the clock signal CKA into ½ to generate a clock signal CKB (frequency: 10 GHz). The divider 103 frequency-divides the clock signal CKB into ½ to generate a clock signal CKC (frequency: 5 GHz). The divider 104 frequency-divides the clock signal CKC into ½ to generate a clock signal CKD (frequency: 2.5 GHz).
The FIFO 105 sequentially acquires parallel data signals USR_DT (16 bits) in synchronization with a clock signal USR_CK (frequency: 2.5 GHz), and outputs them as data signals DTE (16 bits) in response to a rising transition of the clock signal CKD in order from the earliest acquired data signals. The multiplexer 106 converts the data signal DTE into data signals DTD (8 bits) synchronized with the clock signal CKD. The multiplexer 107 converts the data signals DTD into data signals DTC (4 bits) synchronized with the clock signal CKC. The multiplexer 108 converts the data signals DTC into data signals DTB (2 bits) synchronized with the clock signal CKB. The multiplexer 109 converts the data signals DTB into a data signal DTA (1 bit) synchronized with the clock signal CKA. The output driver 110 receives the data signal DTA and outputs it as a serial data signal TX_DT.
FIG. 6 illustrates a part of the data transmission circuit of FIG. 5 . The divider 102 includes a flip-flop FD and an inverter INV. In synchronization with a rising transition of the clock signal CkA supplied from the PLL circuit 101 ( FIG. 5 ), the flip-flop FD acquires an output signal of the inverter INV and outputs it. The inverter INV inverts the output signal of the flip-flop FD and outputs it. By such a configuration, the clock signal CKB formed by frequency-dividing the clock signal CKA into ½ is generated.
The multiplexer 108 includes latch circuits LM 0 to LM 9 and selectors SEL 0 and SELL for converting 4-bit data signals DTC 0 to DTC 3 supplied from the multiplexer 107 ( FIG. 5 ) into 2-bit data signals DTB 0 and DTB 1 synchronized with the clock signal CKB. In synchronization with a rising transition of the clock signal CKB, the latch circuit LM 0 acquires the data signal DTC 0 and outputs it. In synchronization with a falling transition of the clock signal CKB, the latch circuit LM 1 acquires an output signal of the latch circuit LM 0 and outputs it. In synchronization with a rising transition of the clock signal CKB, the latch circuit LM 2 acquires the data signal DTC 2 and outputs it. In synchronization with a falling transition of the clock signal CKB, the latch circuit LM 3 acquires an output signal of the latch circuit LM 2 and outputs it. In synchronization with a rising transition of the clock signal CKB, the latch circuit LM 4 acquires an output signal of the latch circuit LM 3 and outputs it. The selector SEL 0 selects an output signal of the latch circuit LM 1 to output it as the data signal DTB 0 during a high level period of the clock signal CKB, and selects an output signal of the latch circuit LM 4 to output it as the data signal DTB 0 during a low level period of the clock signal CKB.
In synchronization with a rising transition of the clock signal CKB, the latch circuit LM 5 acquires the data signal DTC 1 and outputs it. In synchronization with a falling transition of the clock signal CKB, the latch circuit LM 6 acquires an output signal of the latch circuit LM 5 and outputs it. In synchronization with a rising transition of the clock signal CKB, the latch circuit LM 7 acquires the data signal DTC 3 and outputs it. In synchronization with a falling transition of the clock signal CKB, the latch circuit LM 8 acquires an output signal of the latch circuit LM 7 and outputs it. In synchronization with a rising transition of the clock signal CKB, the latch circuit LM 9 acquires an output signal of the latch circuit LM 8 and outputs it. The selector SEL 1 selects an output signal of the latch circuit LM 6 to output it as the data signal DTB 1 during a high level period of the clock signal CKB, and selects an output signal of the latch circuit LM 9 to output it as the data signal DTB 1 during a low level period of the clock signal CKB. By the configuration as described above, the 4-bit data signals DTC 0 to DTC 3 are converted into the 2-bit data signals DTB 0 and DTB 1 synchronized with the clock signal CKB.
The multiplexer 109 includes latch circuits LM 10 to LM 14 and a selector SEL 2 for converting the 2-bit data signals DTB 0 and DTB 1 into 1-bit data signal DTA synchronized with the clock signal CKA. In synchronization with a rising transition of the clock signal CKA, the latch circuit LM 10 acquires the data signal DTB 0 and outputs it. In synchronization with a falling transition of the clock signal CKA, the latch circuit LM 11 acquires an output signal of the latch circuit LM 10 and outputs it. In synchronization with a rising transition of the clock signal CKA, the latch circuit LM 12 acquires the data signal DTB 1 and outputs it. In synchronization with a failing transition of the clock signal CKA, the latch circuit LM 13 acquires an output signal of the latch circuit LM 12 and outputs it. In synchronization with a rising transition of the clock signal CKA, the latch circuit LM 14 acquires an output signal of the latch circuit LM 13 and outputs it. The selector SEL 2 selects an output signal of the latch circuit LM 11 to output it as the data signal DTA during a high level period of the clock signal CKA, and selects an output signal of the latch circuit LM 14 to output it as the data signal DTA during a low level period of the clock signal CKA. By the configuration as described above, the 2-bit data signals DTB 0 and DTB 1 are converted into the 1-bit data signal DTA synchronized with the clock signal CKA.
›BACKGROUND · 2 of 2
FIG. 7 and FIG. 8 illustrate a state of data communication between the multiplexers in FIG. 6 . A transmission timing of the data signals DTB 0 and DTB 1 in the multiplexer 108 is defined by the rising transition or the failing transition of the clock signal CKB, and a reception timing of the data signals DTB 0 and DTB 1 in the multiplexer 109 is defined by the rising transition of the clock signal CKA. Therefore, in order to securely conduct the data communication between the multiplexers 108 and 109 , a sum of a delay time t 1 from an occurrence of the rising transition of the clock signal CKA to an occurrence of the rising transition or the failing transition of the clock signal CKB in the divider 102 and a delay time t 2 from an occurrence of the rising transition or the falling transition of the clock signal CKB until a determination of the data signals DTB 0 and DTB 1 in the multiplexer 108 , has to be shorter than a cycle T of the clock signal CKA.
As illustrated in FIG. 7 , when the delay times t 1 and t 2 are short and there is a sufficient timing margin in a phase relationship among the clock signal CKA and the data signals DTB 0 and DTB 1 , the data communication is correctly conducted between the multiplexers 108 and 109 . Meanwhile, as illustrated in FIG. 8 , when the delay times t 1 and t 2 are long and there is no sufficient timing margin in the phase relationship among the clock signal CKA and the data signals DTB 0 and DTB 1 , there is a possibility that the data signals DTB 0 and DTB 1 are not determined at the time of the occurrence of the rising transition of the clock signal CKA, and in that case, the multiplexer 109 (latch circuits LM 10 and LM 12 ) cannot correctly receive the data signals DTB 0 and DTB 1 .
Further, a technology relevant to a parallel-to-serial conversion circuit which converts parallel data signals into a serial data signal is disclosed in, for example, Patent Documents 1 and 2.
Patent Document 1: Japanese Laid-open Patent Publication No. 08-056240
Patent Document 2: International Publication Pamphlet No. WO 03/028221
Recently, an information amount to be processed tends to be increased in computer (information processing) and information communication fields, and in order to deal with the increase in the information amount, a data transfer rate (data communication speed) among LSIs configuring a system has been increased. Even though only on a research level, a CMOS (Complementary Metal Oxide Semiconductor)—10 Gbps transceiver was announced in 2002. Subsequently, an attention has been paid to a research regarding a CMOS-40 Gbps transceiver. In a region in which a high data transfer rate is required, a leading-edge technology is applied and, for example, regarding the CMOS-40 Gbps transceiver, a research has been carried out by assuming a technology of 0.1 μm or less.
In a data communication system to which a high data transfer rate is required, there is a need to increase a frequency of a clock signal inside a LSI. Further, in accordance with a microfabrication of a semiconductor process, a performance of a transistor is improved, but, a manufacturing variance becomes quite large. Conventionally, circuit blocks that conduct the data communication were designed to be brought close to one another as much as possible in a layout design of the LSI, to thereby secure a timing margin at the time of receiving data. However, owing to the improvement in data transfer rate, the increase in manufacturing variance, and the like, such a method almost reaches its limits. Specifically, it has been getting difficult to securely conduct the data communication between the multiplexers as illustrated in FIG. 8 with the use of the data transmission circuit illustrated in FIG. 5 .
Further, a parallel-to-serial conversion circuit of Patent Document 1 includes a plurality of registers that acquire parallel data signals, a plurality of AND gates that receive an output signal of a corresponding register among the plurality of registers and a corresponding clock signal among a plurality of clock signals having mutually different phases, and OR gates that generate a serial data signal from output signals of the plurality of AND gates. In the parallel-to-serial conversion circuit of Patent Document 1, the AND gate relating to the serial data signal is sequentially switched, so that a variation in drivability of the AND gates and a mutual influence among the AND gates occurred at the time of switching the AND gates are likely to appear on an eye pattern of the serial data signal. Accordingly, the circuit is not suitably used when a high data transfer rate is required.
A parallel-to-serial conversion circuit of Patent Document 2 includes a plurality of switch circuits that output corresponding bits of parallel data signals for a period of time corresponding to a phase difference of a corresponding pair of clock signals among a plurality of clock signals having mutually different phases, and an adder that adds output signals of the plurality of switch circuits to generate a serial data signal. In the parallel-to-serial conversion circuit of Patent Document 2, the switch circuit relating to the serial data signal is sequentially switched, so that, for the same reason as that of the parallel-to-serial conversion circuit of Patent Document 1, the conversion circuit is not suitably used when a high data transfer rate is required.
A proposition of the embodiment is to provide a technology with which data communication among internal elements in a data transmission circuit is securely conducted regardless of the improvement in data transfer rate, the increase in manufacturing variance, the variation in power supply voltage and temperature, and the like.
›SUMMARY
According to an aspect of the embodiment, a data transmission circuit of a data communication system is a data transmission circuit that converts parallel data signals into a serial data signal to transmit the serial data signal, and includes a clock generation circuit, an output circuit, and a shift register circuit. The clock generation circuit generates a clock signal. For instance, the clock generation circuit is embodied by a voltage controlled oscillator configured by annularly distributing inductance components and capacitance components. The output circuit is provided to output the serial data signal. The shift register circuit acquires the parallel data signals and sequentially transfers the acquired parallel data signals to the output circuit in a bitwise manner with the use of a shift operation synchronized with the clock signal from the clock generation circuit.
The object and advantages will be realized and attained by means of the elements and combinations particularly pointed out in the claims.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are not restrictive, as claimed.
›BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is an explanatory diagram illustrating a basic concept;
FIG. 2 is an explanatory diagram illustrating one embodiment;
FIG. 3 is an explanatory diagram illustrating an internal configuration of a parallel-to-serial conversion circuit of FIG. 2 ;
FIG. 4 is an explanatory diagram illustrating an internal operation of the parallel-to-serial conversion circuit of FIG. 2 ;
FIG. 5 is an explanatory diagram illustrating an example of a data transmission circuit in a related art;
FIG. 6 is an explanatory diagram illustrating a part of the data transmission circuit of FIG. 5 ;
FIG. 7 is an explanatory diagram (No. 1) illustrating a state of data communication between multiplexers in FIG. 6 ; and
FIG. 8 is an explanatory diagram (No. 2) illustrating a state of data communication between the multiplexers in FIG. 6 .
›DESCRIPTION OF THE EMBODIMENTS · 1 of 4
Before explaining an embodiment, a basic concept will be described with reference to the drawings. FIG. 1 illustrates the basic concept. In the embodiment, a data transmission circuit that converts parallel data signals PD into a serial data signal SD to transmit the serial data signal includes a clock generation circuit CKGEN, an output circuit OUT, and a shift register circuit SHREG. The clock generation circuit CKGEN generates a clock signal CK. The output circuit OUT is provided to output the serial data signal SD. The shift register circuit SHREG acquires the parallel data signals PD and sequentially transfers, with the use of a shift operation synchronized with the clock signal CK, the acquired parallel data signals PD to the output circuit OUT in a bitwise manner.
In order to securely perform data communication among registers (flip-flops) configuring the shift register circuit SHREC, it is only required that a time from an occurrence of a rising transition (falling transition) of the clock signal CK until a determination of an output signal of the register is shorter than a cycle of the clock signal CK. Accordingly, it is possible to conduct the data communication among internal elements in the data transmission circuit with a sufficiently large timing margin. The embodiment has been made based on such a basic concept.
Hereinafter, an embodiment will be described with reference to the drawings. FIG. 2 illustrates one embodiment. A data transmission circuit 10 includes a FIFO 11 , a timing control circuit 12 , and a parallel-to-serial conversion circuit 13 . In a data communication system having a data transmission unit that converts parallel data signals synchronized with a low-speed clock signal into a serial data signal synchronized with a high-speed clock signal to transmit the serial data signal, and a data reception unit that receives the serial data signal synchronized with the high-speed clock signal and converts it into the parallel data signals synchronized with the low-speed clock signal, the data transmission circuit 10 embodies the data transmission unit.
The FIFO 11 sequentially acquires parallel data signals USR_DT 0 to USR_DT 15 in synchronization with a clock signal USR_CK, and outputs them as data signals D 0 to D 15 In response to a rising transition of a read enable signal READ_EN in order from the earliest acquired data signals. The timing control circuit 12 temporality sets, in response to a rising transition of a timing signal TIME_REF, the read enable signal READ_EN and selection signals SEL_EVEN and SEL_ODD at a high level at a desired timing. The parallel-to-serial conversion circuit 13 uses the selection signals SEL_EVEN and SEL_ODD to convert the parallel data signals D 0 to D 15 into a serial data signal TX_DT. In addition, the parallel-to-serial conversion circuit 13 temporality sets the timing signal TIME_REF at a high level at a desired timing.
FIG. 3 illustrates an internal configuration of the parallel-to-serial conversion circuit of FIG. 2 . The parallel-to-serial conversion circuit 13 includes a voltage controlled oscillator (VCO) OSC, clock buffers CB 0 to CB 7 , flip-flops F 0 to F 15 , selectors S 0 to S 13 , a selector SX, an output driver DR, and flip-flops FT 0 to FT 7 .
The voltage controlled oscillator OSC is a voltage controlled oscillator configured by annularly distributing inductance components and capacitance components. The voltage controlled oscillator with such a configuration is disclosed in, for example, a reference (Nestoras Tzartzanis and William W. Walker, “A Reversible Poly-Phase Distributed VCO,” IEEE ISSCC Dig. Tech. Papers, pp. 596-597, 2006.), so that detailed explanation will be omitted here. An oscillation frequency fosc of the voltage controlled oscillator OSC (frequency of a clock signal VCO_CK generated by the voltage controlled oscillator OSC) is represented by 1/(2π×√{square root over ( )}L×√{square root over ( )}C) by using an inductance component L and a capacitance component C configuring the voltage controlled oscillator OSC. Accordingly, in order to lower the oscillation frequency fosc of the voltage controlled oscillator OSC, there is a need to significantly enlarge the inductance component L and the capacitance component C. However, the data transmission circuit 10 is configured by assuming a high data transfer rate of about 40 Gbps, so that it is possible to apply the voltage controlled oscillator OSC.
In synchronization with a falling transition of the clock signal VCO_CK of the voltage controlled oscillator OSC supplied via the clock buffer CB 7 , the flip-flop F 14 acquires the data signal D 14 and outputs it as a data signal DA 14 . The selector S 12 (S 10 , S 8 , S 6 , S 4 , S 2 , S 0 ) selects the data signal D 12 (D 10 , D 8 , D 6 , D 4 , D 2 , D 0 ) to output it during a high level period of the selection signal SEL_EVEN, and selects the data signal DA 14 (DA 12 , DA 10 , DA 8 , DA 6 , DA 4 , DA 2 ) to output it during a low level period of the selection signal SEL_EVEN. In synchronization with a falling transition of the clock signal VCO_CK of the voltage controlled oscillator OSC supplied via the clock buffer CB 6 (CB 5 , CB 4 , CB 3 , CB 2 , CB 1 , CB 0 ), the flip-flop F 12 (F 10 , F 8 , F 6 , F 4 , F 2 , F 0 ) acquires an output signal of the selector S 12 (S 10 , S 8 , S 6 , S 4 , S 2 , S 0 ) and outputs it as the data signal DA 12 (DA 10 , DA 8 , DA 6 , DA 4 , DA 2 , DA 0 ).
In synchronization with a rising transition of the clock signal VCO_CK of the voltage controlled oscillator OSC supplied via the clock buffer CB 7 , the flip-flop F 15 acquires the data signal D 15 and outputs it as a data signal DA 15 . The selector S 13 (S 11 , S 9 , S 7 , S 5 , S 3 , S 1 ) selects the data signal D 13 (D 11 , D 9 , D 7 , D 5 , D 3 , D 1 ) to output it during a high level period of the selection signal SEL_ODD, and selects the data signal DA 15 (DA 13 , DA 11 , DA 9 , DA 7 , DA 5 , DA 3 ) to output it during a low level period of the selection signal SEL_ODD. In synchronization with a rising transition of the clock signal VCO_CK of the voltage controlled oscillator OSC supplied via the clock buffer CB 6 (CB 5 , CB 4 , CB 3 , CB 2 , CB 1 , CB 0 ), the flip-flop F 13 (F 11 , F 9 , F 7 , F 5 , F 3 , F 1 ) acquires an output signal of the selector S 13 (S 11 , S 9 , S 7 , S 5 , S 3 , S 1 ) and outputs it as the data signal DA 13 (DA 11 , DA 9 , DA 7 , DA 5 , DA 3 , DA 1 ). The selector SX selects the data signal DA 0 to output it during a high level period of the clock signal VCO_CK of the voltage controlled oscillator OSC supplied via the clock buffer CB 0 , and selects the data signal DA 1 to output it during a low level period of the clock signal VCO_CK of the voltage controlled oscillator OSC supplied via the clock buffer CB 0 . The output driver DR receives an output signal of the selector SX and outputs it as serial data signal TX_DT.
›DESCRIPTION OF THE EMBODIMENTS · 2 of 4
In synchronization with a rising transition of the clock signal VCO_CK of the voltage controlled oscillator OSC supplied via the clock buffer CB 0 (CB 1 to CB 7 ), the flip-flop FT 0 (FT 1 to FT 7 ) acquires an output signal of the flip-flop FT 1 (FT 2 to FT 7 , FT 0 ) and outputs it. Incidentally, an output signal of the flip-flop FT 0 is also supplied to the timing control circuit 12 ( FIG. 2 ) as the timing signal TIME_REF. One of the flip-flops FT 0 to FT 7 is initialized to a set state in response to the operation start request to the data transmission circuit 10 , and the rest of the flip-flops FT 0 to FT 7 are initialized to a reset state in response to the operation start request to the data transmission circuit 10 . Namely, an output signal of one of the flip-flops FT 0 to FT 7 is initialized to a high level in response to the operation start request to the data transmission circuit 10 , and output signals of the rest of the flip-flops FT 0 to FT 7 are initialized to a low level in response to the operation start request to the data transmission circuit 10 . Accordingly, the timing signal TIME_REF is set at a high level as long as one cycle of a clock signal CKA for every eight cycles of the clock signal CKA.
Note that a clock transmission path in the voltage controlled oscillator OSC, a data transmission path through the flip-flops F 14 , F 12 , F 10 , F 8 , F 6 , F 4 , F 2 , and F 0 , a data transmission path through the flip-flops F 15 , F 13 , F 11 , F 9 , F 7 , F 5 , F 3 , and F 1 , and a data transmission path through the flip-flops FT 7 to FT 0 are laid out for signal transmissions to run in parallel (signals are transmitted in the same direction) among these transmission paths.
FIG. 4 illustrates an internal operation of the parallel-to-serial conversion circuit of FIG. 2 . When a rising transition of the timing signal TIME_REF is occurred at time ta, a rising transition of the selection signal SEL_EVEN supplied from the timing control circuit 12 is occurred. Further, although the illustration is omitted, when the rising transition of the timing signal TIME_REF is occurred, a rising transition of the read enable signal READ_EN from the timing control circuit 12 to the FIFO 11 is occurred, and the data signals D 0 to D 15 supplied from the FIFO 11 are set to desired logic values d 0 to d 15 .
When a falling transition of the clock signal VCO_CK is occurred, at time tb, in a state where the selection signal SEL_EVEN is set at a high level, since the selector S 12 (S 10 , S 8 , S 6 , S 4 , S 2 , S 0 ) selects the data signal D 12 (D 10 , D 8 , D 6 , D 4 , D 2 , D 0 ), the data signal DA 14 (DA 12 , DA 10 , DA 8 , DA 6 , DA 4 , DA 2 , DA 0 ) supplied from the flip-flop FR 4 (F 12 , F 10 , F 8 , F 6 , F 4 , F 2 , F 0 ) is set to the logic value d 14 (d 12 , d 10 , d 8 , d 6 , d 4 , d 2 , d 0 ). Further, at the time tb, a rising transition of the selection signal SEL_ODD supplied from the timing control circuit 12 is occurred.
When a rising transition of the clock signal VCO_CK is occurred, at time tc, in a state where the selection signal SEL_ODD is set at a high level, since the selector S 13 (S 11 , S 9 , S 7 , S 5 , S 3 , S 1 ) selects the data signal D 13 (D 11 , D 9 , D 7 , D 5 , D 3 , D 1 ), the data signal DA 15 (DA 13 , DA 11 , DA 9 , DA 7 , DA 5 , DA 3 , DA 1 ) supplied from the flip-flop F 15 (F 13 , F 11 , F 9 , F 7 , F 5 , F 3 , F 1 ) is set to the logic value d 15 (d 13 , d 11 , d 9 , d 7 , d 5 , d 3 , d 1 ). In addition, when the rising transition of the clock signal VCO_CK is occurred, the selector SX selects the data signal DA 0 , so that the serial data signal TX_DT is set to the logic value do. Further, at the time tc, a falling transition of the selection signal SEL_EVEN is occurred.
When a falling transition of the clock signal VCO_CK is occurred, at time td, in a state where the selection signal SELEVEN is set at a low level, since the selector S 12 (S 10 , S 8 , S 6 , S 4 , S 2 , S 0 ) selects the data signal DA 14 (DA 12 , DA 10 , DA 8 , DA 6 , DA 4 , DA 2 ), the data signal DA 12 (DA 10 , DA 8 , DA 6 , DA 4 , DA 2 , DA 0 ) supplied from the flip-flop F 12 (F 10 , F 8 , F 6 , F 4 , F 2 , F 0 ) is set to the logic value d 14 (d 12 , d 10 , d 8 , d 6 , d 4 , d 2 ). In addition, when the falling transition of the clock signal VCO_CK is occurred, the selector SX selects the data signal DA 1 , so that the serial data signal TX_DT is set to the logic value d 1 . Further, at the time td, a falling transition of the selection signal SEL_ODD is occurred.
When a rising transition of the clock signal VCO_CK is occurred, at time te, in a state where the selection signal SEL_ODD is set at a low level, since the selector S 13 (S 11 , S 9 , S 7 , S 5 , S 3 , S 1 ) selects the data signal DA 15 (DA 13 , DA 11 , DA 9 , DA 7 , DA 5 , DA 3 ), the data signal DA 13 (DA 11 , DA 9 , DA 7 , DA 5 , DA 3 , DA 1 ) supplied from the flip-flop F 13 (F 11 , F 9 , F 7 , F 5 , F 3 , F 1 ) is set to the logic value d 15 (d 13 , d 11 , d 9 , d 7 , d 5 , d 3 ). In addition, when the rising transition of the clock signal VCO_CK is occurred, the selector SX selects the data signal DA 0 , so that the serial data signal TX_DT is set to the logic value d 2 . Thereafter, the same operation as that at the time td is performed every time a falling transition of the clock signal VCO_CK is occurred, and the same operation as that at the time te is performed every time a rising transition of the clock signal VCO_CK is occurred, to thereby sequentially set the serial data signal TX_DT to the logic values d 3 to d 15 .
Further, at time tf (time at which a period of time corresponding to eight cycles of the clock signal VCO_CK elapses from the time ta), a rising transition of the timing signal TIME_REF is occurred again. In accordance with this, a rising transition of the selection signal SEL_EVEN is occurred. Further, when the rising transition of the timing signal TIME_REF is occurred, a rising transition of the read enable signal READ_EN from the timing control circuit 12 to the FIFO 11 is occurred, and the data signals D 0 to D 15 supplied from the FIFO 11 are set to desired logic values d 0 ′ to d 15 ′.
›DESCRIPTION OF THE EMBODIMENTS · 3 of 4
When a falling transition of the clock signal VCO_CK is occurred, at time tg, in a state where the selection signal SEL_EVEN is set at a high level, since the selector S 12 (S 10 , S 8 , S 6 , S 4 , S 2 , S 0 ) selects the data signal D 12 (D 10 , D 8 , D 6 , D 4 , D 2 , D 0 ), the data signal DA 14 (DA 12 , DA 10 , DA 8 , DA 6 , DA 4 , DA 2 , DA 0 ) supplied from the flip-flop F 14 (F 12 , F 10 , F 8 , F 6 , F 4 , F 2 , F 0 ) is set to the logic value d 14 ′ (d 12 ′, d 10 ′, d 8 ′, d 6 ′, d 4 ′, d 2 ′, d 0 ′). Further, at the time tg, a rising transition of the selection signal SEL_ODD is occurred.
When a rising transition of the clock signal VCO_CK is occurred, at time th, in a state where the selection signal SEL_ODD is set at a high level, since the selector S 13 (S 11 , S 9 , S 7 , S 5 , S 3 , S 1 ) selects the data signal D 13 (D 11 , D 9 , D 7 , D 5 , D 3 , D 1 ), the data signal DA 15 (DA 13 , DA 11 , DA 9 , DA 7 , DA 5 , DA 3 , DA 1 ) supplied from the flip-flop F 15 (F 13 , F 11 , F 9 , F 7 , F 5 , F 3 , F 1 ) is set to the logic value d 15 ′ (d 13 ′, d 11 ′, d 9 ′, d 7 ′, d 5 ′; d 3 ′, d 1 ′). In addition, when the rising transition of the clock signal VCO_CK is occurred, the selector SX selects the data signal DA 0 , so that the serial data signal TX_DT is set to the logic value d 0 ′. Further, at the time th, a falling transition of the selection signal SEL_EVEN is occurred. Thereafter, the same operation as that at the time td is performed every time a falling transition of the clock signal VCO_CK is occurred, and the same operation as that at the time te is performed every time a rising transition of the clock signal VCO_CK is occurred, to thereby sequentially set the serial data signal TX_DT to the logic values d 1 ′ to d 15 ′.
In the one embodiment such as described above, the conversion from the parallel data signals USR_DT into the serial data signal TX_DT is not conducted in stages with the use of a configuration in which dividers and multiplexers are used, but conducted at one stroke with the use of a configuration in which the voltage controlled oscillator OSC and the shift register circuit formed of the flip-flops F 0 to F 15 and the selectors S 0 to S 13 and SX are used. Since there is no delay time caused by the dividers that affects a phase relationship of the clock signal and the data signal relevant to the data communication among internal elements, it is possible to conduct the data communication among the internal elements with a sufficiently large timing margin. Accordingly, it is possible to securely conduct the data communication among the internal elements in the data transmission circuit 10 regardless of the improvement in data transfer rate, the Increase in manufacturing variance, the variation in power supply voltage and temperature, and the like. Therefore, it Is possible to configure a data transmission circuit with higher possibility of realization and higher data transfer rate compared to that in the related art ( FIG. 5 ).
Further, the clock transmission path in the voltage controlled oscillator OSC, the data transmission path through the flip-flops F 14 , F 12 , F 10 , F 8 , F 6 , F 4 , F 2 , and F 0 , the data transmission path through the flip-flops F 15 , F 13 , F 11 , F 9 , F 7 , F 5 , F 3 , and F 1 , and the data transmission path through the flip-flops FT 7 to FT 0 are laid out for the signal transmissions to run in parallel among these transmission paths, and therefore the data communication among the internal elements can be carried out with a more increased timing margin. Accordingly, it becomes possible to further increase the data transfer rate in the data transmission circuit 10 .
Aforementioned embodiment may be applied to a data transmission circuit and a data communication system applied for performing data communication among elements or circuit blocks inside an LSI (Large Scale Integration), data communication among LSIs, data communication among boards or packages, and the like.
In accordance with the progress of a microfabrication of semiconductor process, an influence of a manufacturing variance becomes significant, so that a circuit technology according to the embodiment in which even the influence of the manufacturing variance is taken into consideration becomes an important element technology in the future in realizing an LSI.
According to the embodiments, for example, the data transmission circuit may includes a loop circuit. The loop circuit is configured by annularly coupling a plurality of registers and sequentially transfers a timing signal in synchronization with the clock signal from the clock generation circuit among the plurality of registers. For example, the timing signal in the loop circuit is generated in response to an operation start request to the data transmission circuit. The shift register circuit acquires the parallel data signals in accordance with a transfer of the timing signal from one of the plurality of registers in the loop circuit. Further, a transmission path of the clock signal in the voltage controlled oscillator, a transmission path of the parallel data signals in the shift register circuit, and a transmission path of the timing signal in the loop circuit are laid out for signal transmissions to run in parallel among the transmission path of the clock signal, the transmission path of the parallel data signals, and the transmission path of the timing signal.
According to the embodiments, for example, in the data transmission circuit configured as above, the conversion from the parallel data signals into the serial data signal is not conducted in stages with the use of a configuration in which dividers and multiplexers are used, but conducted at one stroke with the use of a configuration in which the clock generation circuit (voltage controlled oscillator) and the shift register circuit are used. Since there is no delay time caused by the dividers that affects a phase relationship of the clock signal and the data signal relevant to the data communication among the internal elements, it is possible to conduct the data communication among the internal elements with a sufficiently large timing margin. Accordingly, it is possible to securely conduct the data communication among the internal elements in the data transmission circuit regardless of the improvement in data transfer rate, the increase in manufacturing variance, the variation in power supply voltage and temperature, and the like.
›DESCRIPTION OF THE EMBODIMENTS · 4 of 4
According to the embodiment, it is possible to securely conduct data communication among internal elements in a data transmission circuit regardless of the improvement in data transfer rate, the increase in manufacturing variance, the variation in power supply voltage and temperature, and the like. In other words, it is possible to realize a data transmission circuit which is not affected by the improvement in data transfer rate, the increase in manufacturing variance, the variation in power supply voltage and temperature, and the like.
All examples and conditional language recited herein are intended for pedagogical purposes to aid the reader in understanding the invention and the concepts contributed by the inventor to furthering the art, and are to be construed as being without limitation to such specifically recited examples and conditions, nor does the organization of such examples in the specification relate to a showing of the superiority and inferiority. Although the embodiments of the present invention have been described in detail, it should be understood that the various changes, substitutions, and alterations could be made hereto without departing from the spirit and scope.
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