USPatent applicationPatented

Probe thermometer

Granted 18 Dec 2001

Current assignee: Chaney Instrument Company · originally Combex, Inc.

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Inventors: Ronald J. Kovarsky, Ho Wai Ming, Paul Mayer · Examiner: Antoine Duval Davis · AU 2913 · TC 2900

Application· this page
123913
filed 26 May 2000
Publication
Not published
not published
Patent
US D452178
granted 18 Dec 2001

Life of the application

4 dated events
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Description

1 parts
›FIG. 1 is a perspective view of the…

FIG. 1 is a perspective view of the probe thermometer showing our new design;

FIG. 2 is a right side elevation view of the probe thermometer shown in FIG. 1, the left side elevation view being a mirror image thereof;

FIG. 3 is a front elevation view of the probe thermometer of FIG. 1;

FIG. 4 is a top plan view of the probe thermometer shown in FIG. 1;

FIG. 5 is a bottom plan view of the probe thermometer shown in FIG. 1;

FIG. 6 is a back plan view of the probe thermometer shown in FIG. 1;

FIG. 7 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;

FIG. 8 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;

FIG. 9 is a right side elevation view of the probe thermometer of FIG. 7, with the left side elevation view being a mirror image thereof;

FIG. 10 is a front elevation view of the probe thermometer of FIG. 7;

FIG. 11 is a top plan view of the probe thermometer of FIG. 7; and,

FIG. 12 is a back elevation of the probe thermometer of FIG. 7.

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Claims as granted

1 claim

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Classifications

1 codes
USPC · US Patent Classification
D10/57

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File wrapper

Pendency
1.6 y
571 days filing → grant
Office actions
0
on the grant's record
Examiner
Antoine Duval Davis
art unit 2913 · TC 2900
Citations: 4 back · 0 forward

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Chain of title

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