Probe thermometer
Granted 18 Dec 2001 · no office action yet
Current assignee: Chaney Instrument Company · originally Combex, Inc.
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Attorney: Attorney · Log in to unlock
Inventors: Ronald J. Kovarsky, Ho Wai Ming, Paul Mayer · Examiner: Antoine Duval Davis · AU 2913 · TC 2900
Life of the patent
2 dated eventsDescription
1 parts›FIG. 1 is a perspective view of the…
FIG. 1 is a perspective view of the probe thermometer showing our new design;
FIG. 2 is a right side elevation view of the probe thermometer shown in FIG. 1, the left side elevation view being a mirror image thereof;
FIG. 3 is a front elevation view of the probe thermometer of FIG. 1;
FIG. 4 is a top plan view of the probe thermometer shown in FIG. 1;
FIG. 5 is a bottom plan view of the probe thermometer shown in FIG. 1;
FIG. 6 is a back plan view of the probe thermometer shown in FIG. 1;
FIG. 7 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;
FIG. 8 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;
FIG. 9 is a right side elevation view of the probe thermometer of FIG. 7, with the left side elevation view being a mirror image thereof;
FIG. 10 is a front elevation view of the probe thermometer of FIG. 7;
FIG. 11 is a top plan view of the probe thermometer of FIG. 7; and,
FIG. 12 is a back elevation of the probe thermometer of FIG. 7.
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