USPatent applicationPatented

Method of forming film, method of manufacturing semiconductor device, and film forming apparatus

Granted 15 Feb 2005 · 2 office actions

Current assignee: Applied Materials Israel · originally Applied Materials, Inc.

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Inventors: Tsutomu Shimayama, Yoichi Suzuki · Examiner: David Nelms · AU 2818 · TC 2800

Life of the application

9 dated events
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Abstract

The present invention provides a deposition method and deposition apparatus capable of forming a fluorine-containing silicon inorganic insulating film of stable film properties and a method of manufacturing a semiconductor device. Deposition apparatus 10 comprises parallel plate type electrodes 16, 22 arranged within reaction chamber 12 , gas supply sources 20, 32, 34 for feeding process gas containing SiH 4 , SiF 4 and oxygen source substance into reaction chamber 12 , valves 36, 38, 40 , gas mixing chamber 28 and power source 44 that supplies RF power for generating the plasma of the process gas. In this deposition apparatus 10 , power source 44 is capable of supplying RF power of at least 1000 Watts to parallel plate type electrodes 16, 22 . In this apparatus 10 , fluorine-containing silicon oxide film is deposited on wafer 14 by generating the plasma of process gas containing SiH 4 , SiF 4 and N 2 O.

Claims as granted

16 claims

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Classifications

7 codes
IPC · International Patent Classification
Section H — Electricity
  • H01L021/31
USPC · US Patent Classification
438/778438/784438/788438/624438/776257/759

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File wrapper

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Pendency
3.3 y
1,211 days filing → grant
Office actions
1
after a restriction
Responses
1
no RCE
Examiner
David Nelms
art unit 2818 · TC 2800
Citations: 14 back · 0 forward

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Documents

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Chain of title

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