USPatentGranted
S1

Probe pin

Granted 7 May 2019 · 2 office actions

Assignee: Kabushiki Kaisha Nihon Micronics

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Inventors: Mika Nasu · Examiner: Cathron C Brooks · AU 2921 · TC 2900

Application
29/615,737
filed 30 Aug 2017
Publication
Not published
not published
Patent· this page
US D847757
granted 7 May 2019

Life of the patent

2 dated events
⤢ drag to zoomJul 2017Oct 2017Jan 2018Apr 2018Jul 2018Oct 2018Jan 2019Apr 2019Jul 2019Prosecution
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Description

1 parts
›FIG. 1 is a perspective view of a…

FIG. 1 is a perspective view of a probe pin, showing the claimed design;

FIG. 2 is a front view of the probe pin;

FIG. 3 is a rear view of the probe pin;

FIG. 4 is a left side view of the probe pin;

FIG. 5 is a right side view of the probe pin;

FIG. 6 is a top plan view of the probe pin;

FIG. 7 is a bottom plan view of the probe pin;

FIG. 8 is an enlarged left side view of the probe pin; and,

FIG. 9 is an enlarged view of the section of the probe pin as indicated in FIG. 2 .

The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D13/154

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File wrapper

Pendency
1.7 y
615 days filing → grant
Office actions
1
non-final + final
Responses
1
no RCE
Examiner
Cathron C Brooks
art unit 2921 · TC 2900
Citations: 24 back · 0 forward

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Chain of title

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Term & fees

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Validity challenges

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Citations

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