Inventor
Yoshiya Higuchi
Inventor
Tokai, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps50%
G01RMeasuring electric variables17%
H01FMagnets17%
H05HPlasma technique17%
PatentTitleYear
7,990,661'Active shield superconducting electromagnet apparatus and magnetic resonance imaging system'20117,872,240'Corrector for charged-particle beam aberration and charged-particle beam apparatus'20117,737,413'Corrector for charged-particle beam aberration and charged-particle beam apparatus'20105,095,208'Charged particle generating device and focusing lens therefor'19925,089,699'Secondary charged particle analyzing apparatus and secondary charged particle extracting section'19925,001,438'Charged particle accelerator and method of cooling charged particle beam'1991Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991–2011Patents assigned to HITACHI LTD (4)· patent assignee history
1991–1992Based in Hitachi, JP· patent location history
2010–2011Based in Tokai, JP· patent location history
2011Patents assigned to HITACHI HIGH TECH CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 4 | 1991–2011 |
| HITACHI HIGH TECH CORP | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokai, JP | 3 | 2010–2011 |
| Hitachi, JP | 3 | 1991–1992 |