Inventor
Chen-Shien Chen
Inventor
Zhubei City, TW
Overview
Patents· 286 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Wprimary
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1041%
H01LSemiconductor devices31%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
H10DInorganic electric semiconductor devices5%
Y10TTechnical subjects covered by former us classification4%
H05KPrinted circuits2%
Y02PClimate change mitigation technologies in the production or processing of goods1%
H01FMagnets1%
H10BElectronic memory devices1%
B24BMachines, devices, or processes for grinding or polishing0%
PatentTitleYear
10,879,228Packaging mechanisms for dies with different sizes of connectors202010,867,810Substrate pad structure202010,868,106Semiconductor structure and method202010,867,976Semiconductor packages having dummy connectors and methods of forming same202010,861,811Connector structure and method of forming same202010,854,5773D die stacking structure with fine pitches202010,847,493Bump-on-trace interconnect202010,833,033Bump structure having a side recess and semiconductor structure including the same202010,811,377Package structure with a barrier layer and method for forming the same202010,797,005Semiconductor package and method for manufacturing the same202010,784,223Elongated bump structures in package structure202010,756,162Structure and formation method of semiconductor device with magnetic element202010,748,810Method of manufacturing an integrated inductor with protections caps on conductive lines202010,748,785Substrate pad structure202010,741,477Semiconductor devices and methods of forming the same202010,734,347Dummy flip chip bumps for reducing stress202010,720,788Wireless charging devices having wireless charging coils and methods of manufacture thereof202010,720,487Structure and formation method of semiconductor device with magnetic element202010,700,025Fan-out interconnect structure and method for forming same202010,692,828Package structure with protrusion structure202010,692,848Stress reduction apparatus and method202010,651,142Micro-connection structure and manufacturing method thereof202010,643,861Methods for making multi-die package with bridge layer202010,629,580Packaging mechanisms for dies with different sizes of connectors202010,573,573Package and package-on-package structure having elliptical conductive columns202010,546,845Package on package structure202010,535,593Package structure having a plurality of conductive balls with narrow width for ball waist202010,522,526LTHC as charging barrier in InFO package formation201910,522,382Method of manufacturing a semiconductor device201910,515,938Package on-package (PoP) device with integrated passive device in a via201910,515,919Bump-on-trace design for enlarge bump-to-trace distance201910,515,917Bump on pad (BOP) bonding structure in semiconductor packaged device201910,510,734Semiconductor packages having dummy connectors and methods of forming same201910,510,727Semiconductor device with discrete blocks201910,510,710Bump-on-trace interconnect201910,510,661Semiconductor devices and methods of forming the same201910,510,644Package structures and methods for forming the same201910,504,856Scheme for connector site spacing and resulting structures201910,483,225Packaging assembly and method of making the same201910,483,226Semiconductor device and method of forming the same201910,468,366Bonded structures for package and substrate201910,388,622Bump structure having a side recess and semiconductor structure including the same201910,388,620Connector structure and method of forming same201910,361,181Packaging mechanisms for dies with different sizes of connectors201910,354,931Packaging mechanisms for dies with different sizes of connectors201910,319,655POP structures with dams encircling air gaps and methods for forming the same201910,319,691Solderless interconnection structure and method of forming same201910,290,697Magnetic core inductor semiconductor structure and method201910,290,600Dummy flip chip bumps for reducing stress201910,283,471Micro-connection structure and manufacturing method thereof201910,276,481Package structure having a plurality of conductive balls having narrow width for the ball waist201910,276,548Semiconductor packages having dummy connectors and methods of forming same201910,276,525Package structure and method of fabricating the same201910,276,528Semicondcutor device and manufacturing method thereof201910,269,759Trace design for bump-on-trace (BOT) assembly201910,269,676Thermally enhanced package-on-package (PoP)201910,269,703Semiconductor device and method of forming the same201910,263,064Semiconductor devices and methods of forming the same201910,163,844Semiconductor device having conductive bumps of varying heights201810,163,873Package-on-package (PoP) device with integrated passive device in a via201810,163,781Semiconductor devices and methods of forming the same201810,163,839Bump on pad (BOP) bonding structure in semiconductor packaged device201810,163,827Package structure with protrusion structure201810,163,756Isolation structure for stacked dies201810,157,829Method for forming a passive device on a package-on-package structure201810,157,874Contact area design for solder bonding201810,157,8843D die stacking structure with fine pitches201810,153,243Semiconductor devices, methods of manufacture thereof, and packaged semiconductor devices201810,141,281Substrate and package structure201810,134,706Warpage control of semiconductor die package201810,128,195Substrate design with balanced metal and solder resist density201810,115,686Semiconductor structure and fabricating method thereof201810,084,032Semiconductor structure and method201810,056,345Conical-shaped or tier-shaped pillar connections201810,050,000Bump-on-trace structures with high assembly yield201810,043,774Integrated circuit packaging substrate, semiconductor package, and manufacturing method201810,037,973Method for manufacturing semiconductor package structure201810,020,276Protrusion bump pads for bond-on-trace processing201810,008,459Structures having a tapering curved profile and methods of making same201810,008,479Semiconductor device with discrete blocks20189,991,190Packaging with interposer frame20189,991,218Connector structures of integrated circuits20189,991,224Bump-on-trace interconnect having varying widths and methods of forming same20189,966,346Bump structure and method of forming same20189,953,939Conductive contacts having varying widths and method of manufacturing same20189,935,073Semiconductor structure and manufacturing method of the same20189,935,081Hybrid interconnect for chip stacking20189,917,035'Bump-on-trace interconnection structure for flip-chip packages'20189,911,725'Packaging mechanisms for dies with different sizes of connectors'20189,905,524'Bump structures in semiconductor device and packaging assembly'20189,881,885'Metal routing architecture for integrated circuits'20189,871,013'Contact area design for solder bonding'20189,859,252'Cooling channels in 3DIC stacks'20189,837,346Packaging device having plural microstructures disposed proximate to die mounting region20179,837,289Methods for forming package-on-package structures having buffer dams20179,824,992'Bump structure having a side recess and semiconductor structure including the same'20179,812,405'Semiconductor package and manufacturing method of the same'20179,799,620'Warpage reduction and adhesion improvement of semiconductor die package'20179,786,540'Method of manufacturing a semiconductor device'20179,786,621'Elongated bump structures in package structure'20179,773,755'Substrate interconnections having different sizes'20179,773,749'Warpage control of semiconductor die package'20179,768,138'Improving the strength of micro-bump joints'20179,761,503'Packaging mechanisms for dies with different sizes of connectors'20179,748,188'Method of forming a bump on pad (BOP) bonding structure in a semiconductor packaged device'20179,748,216'Apparatus and method for a component package'20179,741,589'Substrate pad structure'20179,735,130'Chip packages and methods of manufacture thereof'20179,721,918'Contact area design for solder bonding'20179,711,477'Dummy flip chip bumps for reducing stress'20179,679,862'Semiconductor device having conductive bumps of varying heights'20179,679,836'Package structures and methods for forming the same'20179,673,174'Through silicon via bonding structure'20179,673,125'Interconnection structure'20179,673,161'Bonded structures for package and substrate'20179,666,530'Semiconductor device'20179,659,903'Method of manufacturing connector structures of integrated circuits'20179,659,918'POP structures with dams encircling air gaps and methods for forming the same'20179,646,923'Semiconductor devices, methods of manufacture thereof, and packaged semiconductor devices'20179,646,943'Connector structure and method of forming same'20179,646,894'Packaging mechanisms for dies with different sizes of connectors'20179,640,521'Multi-die package with bridge layer and method for making the same'20179,633,965'Semiconductor structure and manufacturing method of the same'20179,620,414'Protecting flip-chip package using pre-applied fillet'20179,613,917'Package-on-package (PoP) device with integrated passive device in a via'20179,607,959'Packaging device having plural microstructures disposed proximate to die mounting region'20179,607,936'Copper bump joint structures with improved crack resistance'20179,589,861'Semiconductor packaging having warpage control and methods of forming same'20179,583,367'Methods and apparatus for bump-on-trace chip packaging'20179,576,821'Package structures including a capacitor and methods of forming the same'20179,559,069'Semiconductor device, integrated circuit structure using the same, and manufacturing method thereof'20179,543,278'Semiconductor device with discrete blocks'20179,536,850'Package having substrate with embedded metal trace overlapped by landing pad'20179,520,379'Method of forming bump structure having a side recess and semiconductor structure including the same'20169,508,668'Conductive contacts having varying widths and method of manufacturing same'20169,508,637'Protrusion bump pads for bond-on-trace processing'20169,508,674'Warpage control of semiconductor die package'20169,496,233'Interconnection structure and method of forming same'20169,490,167'Pop structures and methods of forming the same'20169,484,317'Scheme for connector site spacing and resulting structures'20169,478,474'Methods and apparatus for forming package-on-packages'20169,472,525'Bump-on-trace structures with high assembly yield'20169,472,521'Scheme for connector site spacing and resulting structures'20169,449,941'Connecting function chips to a package to form package-on-package'20169,431,351'Semiconductor package and manufacturing method of the same'20169,425,136'Conical-shaped or tier-shaped pillar connections'20169,425,157'Substrate and package structure'20169,425,117'Substrate design with balanced metal and solder resist density'20169,418,969'Packaged semiconductor devices and packaging methods'20169,406,629'Semiconductor package structure and manufacturing method thereof'20169,397,059'Bonded structures for package and substrate'20169,379,032'Semiconductor packaging having warpage control and methods of forming same'20169,379,078'3D die stacking structure with fine pitches'20169,373,598'Connector structures of integrated circuits'20169,368,460'Fan-out interconnect structure and method for forming same'20169,355,933'Cooling channels in 3DIC stacks'20169,349,699'Front side copper post joint structure for temporary bond in TSV application'20169,343,442'Passive devices in package-on-package structures and methods for forming the same'20169,330,947'Methods for forming package-on-package structures having buffer dams'20169,318,458'Bump structure having a side recess and semiconductor structure including the same'20169,312,225'Bump structure for stacked dies'20169,312,230'Conductive pillar structure for semiconductor substrate and method of manufacture'20169,299,674'Bump-on-trace interconnect'20169,293,449'Methods and apparatus for package on package devices with reversed stud bump through via interconnections'20169,287,191'Semiconductor device package and method'20169,287,234'Dummy flip chip bumps for reducing stress'20169,269,688'Bump-on-trace design for enlarge bump-to-trace distance'20169,263,377'POP structures with dams encircling air gaps and methods for forming the same'20169,257,332'Through-assembly via modules and methods for forming the same'20169,257,385'Landing areas of bonding structures'20169,257,412'Stress reduction apparatus'20169,258,922'PoP structures including through-assembly via modules'20169,232,632'Methods and apparatuses for detecting registration offsets'20169,224,688'Metal routing architecture for integrated circuits'20159,219,046'Strength of micro-bump joints'20159,219,106'Integrated inductor'20159,209,149'Bump-on-trace structures with high assembly yield'20159,196,573'Bump on pad (BOP) bonding structure'20159,190,348'Scheme for connector site spacing and resulting structures'20159,165,796'Methods and apparatus for bump-on-trace chip packaging'20159,165,887'Semiconductor device with discrete blocks'20159,159,695'Elongated bump structures in package structure'20159,153,550'Substrate design with balanced metal and solder resist density'20159,142,500'Apparatus for lead free solder interconnections for integrated circuits'20159,142,533'Substrate interconnections having different sizes'20159,129,818'Semiconductor device having conductive pads and a method of manufacturing the same'20159,123,788'Bonded structures for package and substrate'20159,117,825'Substrate pad structure'20159,111,817'Bump structure and method of forming same'20159,105,533'Bump structure having a single side recess'20159,105,530'Conductive contacts having varying widths and method of manufacturing same'20159,093,332'Elongated bump structure for semiconductor devices'20159,093,440'Connector structures of integrated circuits'20159,087,832'Warpage reduction and adhesion improvement of semiconductor die package'20159,070,644'Packaging mechanisms for dies with different sizes of connectors'20159,064,881'Protecting flip-chip package using pre-applied fillet'20159,059,107'Packaging methods and packaged devices'20159,053,990'Bump interconnection techniques'20159,053,989'Elongated bump structure in semiconductor device'20159,040,350'Packaging and function tests for package-on-package and system-in-package structures'20159,035,461'Packaged semiconductor devices and packaging methods'20159,006,909'Solder mask shape for BOT laminate packages'20158,981,576'Structure and method for bump to landing trace ratio'20158,975,726'POP structures and methods of forming the same'20158,932,906'Through silicon via bonding structure'20158,928,114'Through-assembly via modules and methods for forming the same'20158,922,006'Elongated bumps in integrated circuit devices'20148,921,222'Pillar structure having a non-planar surface for semiconductor devices'20148,922,005'Methods and apparatus for package on package devices with reversed stud bump through via interconnections'20148,916,971'Multi-direction design for bump pad structures'20148,912,649'Dummy flip chip bumps for reducing stress'20148,901,736'Strength of micro-bump joints'20148,889,484'Apparatus and method for a component package'20148,883,628'Electrical connection structure'20148,871,609'Thin wafer handling structure and method'20148,866,285'Fan-out package comprising bulk metal'20148,859,424'Semiconductor wafer carrier and method of manufacturing'20148,853,853'Bump structures'20148,847,387'Robust joint structure for flip-chip bonding'20148,829,673'Bonded structures for package and substrate'20148,823,170'Apparatus and method for three dimensional integrated circuits'20148,816,507'Package-on-Package structures having buffer dams and method for forming the same'20148,803,319'Pillar structure having a non-planar surface for semiconductor devices'20148,772,950'Methods and apparatus for flip chip substrate with guard rings outside of a die attach region'20148,765,497'Packaging and function tests for package-on-package and system-in-package structures'20148,766,441'Methods and apparatus for solder on slot connections in package on package structures'20148,759,949'Wafer backside structures having copper pillars'20148,753,971'Dummy metal design for packaging structures'20148,736,050'Front side copper post joint structure for temporary bond in TSV application'20148,729,699'Connector structures of integrated circuits'20148,729,700'Multi-direction design for bump pad structures'20148,716,123'Method of forming an integrated circuit device'20148,716,131'Through silicon via layout'20148,664,041'Method for designing a package and substrate layout'20148,659,123'Metal pad structures in dies'20148,659,170'Semiconductor device having conductive pads and a method of manufacturing the same'20148,653,648'Zigzag pattern for TSV copper adhesion'20148,653,626'Package structures including a capacitor and methods of forming the same'20148,643,196'Structure and method for bump to landing trace ratio'20148,623,756'Reflow system and method for conductive connections'20148,624,376'Package-on-package structure without through assembly vias'20148,624,360'Cooling channels in 3DIC stacks'20148,598,030'Process for making conductive post with footing profile'20138,598,691'Semiconductor devices and methods of manufacturing and packaging thereof'20138,546,945'Pillar structure having a non-planar surface for semiconductor devices'20138,546,941'Multi-direction design for bump pad structures'20138,513,119'Method of forming bump structure having tapered sidewalls for stacked dies'20138,476,769'Through-silicon vias and methods for forming the same'20138,476,759'Electrical connection structure'20138,461,045'Bond pad connection to redistribution lines having tapered profiles'20138,426,256'Method of forming stacked-die packages'20138,334,170'Method for stacking devices'20128,318,596'Pillar structure having a non-planar surface for semiconductor devices'20128,299,616'T-shaped post for semiconductor devices'20128,288,872'Through silicon via layout'20128,278,152'Bonding process for CMOS image sensor'20128,241,963'Recessed pillar structure'20128,232,643'Lead free solder interconnections for integrated circuits'20128,227,924'Substrate stand-offs for semiconductor devices'20128,202,800'Method of forming through silicon via with dummy structure'20128,193,639'Dummy metal design for packaging structures'20128,178,970'Strong interconnection post geometry'20128,158,489'Formation of TSV backside interconnects by modifying carrier wafers'20128,158,456'Method of forming stacked dies'20128,101,499'Formation of TSV backside interconnects by modifying carrier wafers'20128,097,953'Three-dimensional integrated circuit stacking-joint interface structure'20128,049,323'Chip holder with wafer level redistribution layer'20118,049,327'Through-silicon via with scalloped sidewalls'20118,034,708'Structure and process for the formation of TSVs'20117,969,013'Through silicon via with dummy structure and method for forming the same'20117,956,442'Backside connection to TSVs having redistribution lines'20117,928,534'Bond pad connection to redistribution lines having tapered profiles'20117,919,406'Structure and method for forming pillar bump structure having sidewall protection'20117,871,860'Method of semiconductor packaging'20117,851,331'Bonding structures and methods of forming bonding structures'20107,842,548'Fixture for P-through silicon via assembly'20107,816,227'Tapered through-silicon via structure'20107,785,927'Multi-die wafer level packaging'20107,666,688'Method of manufacturing a coil inductor'20107,662,665'Method for fabricating a semiconductor package including stress relieving layer for flip chip packaging'20107,633,165'Introducing a metal layer between SiN and TiN to improve CBD contact resistance for P-TSV'20097,564,115'Tapered through-silicon via structure'20097,514,797'Multi-die wafer level packaging'20097,294,043'CMP apparatus and process sequence method'20077,118,451'CMP apparatus and process sequence method'20067,004,814'CMP process control method'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2016Patents assigned to TAIWAN SEMICONDUCTOR MFG (131)· patent assignee history
2006–2019Based in Hsinchu, TW· patent location history
2009–2020Based in Zhubei City, TW· patent location history
2010Based in Shin-Chu, TW· patent location history
2012–2017Patents assigned to CHEN CHEN-SHIEN (65)· patent assignee history
2012–2017Patents assigned to HSIAO CHING-WEN (24)· patent assignee history
2012–2017Patents assigned to KUO CHEN-CHENG (24)· patent assignee history
2012–2020Based in Hsinchu County, TW· patent location history
2015–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (151)· patent assignee history
2016Based in Zhuhai, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 151 | 2015–2020 |
| TAIWAN SEMICONDUCTOR MFG | 131 | 2006–2016 |
| CHEN CHEN-SHIENself | 65 | 2012–2017 |
| HSIAO CHING-WEN | 24 | 2012–2017 |
| KUO CHEN-CHENG | 24 | 2012–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Zhubei City, TW | 240 | 2009–2020 |
| Hsinchu County, TW | 23 | 2012–2020 |
| Hsinchu, TW | 20 | 2006–2019 |
| Zhuhai, CN | 1 | 2016 |
| Shin-Chu, TW | 1 | 2010 |