Inventor
Leon C. Vandervalk
Inventor
Brockville, CA
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions36%
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
B06BMethods or apparatus for generating or transmitting mechanical vibrations of infrasonic, sonic, or ultrasonic frequency, e.g. for performing mechanical work in general8%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves8%
G10KSound-producing devices8%
G01SRadio direction-finding6%
G01DMeasuring not specially adapted for a specific variable3%
G06FElectric digital data processing3%
G09GArrangements or circuits for control of indicating devices using static means to present variable information3%
PatentTitleYear
10,514,328Method and system for testing surfaces for contaminants20199,207,174'Apparatus and method for characterizing a replica tape'20159,188,672'Ultrasonic measuring gauge'20158,994,933'Apparatus and method for characterizing a replica tape'2015RE041342'Coating thickness gauge'20106,343,510'Ultrasonic testing using synthetic impulses'20026,282,962'High resolution ultrasonic thickness gauge'20016,250,160'High resolution ultrasonic thickness gauge'20016,122,968'Delay line for an ultrasonic probe and method of using same'20005,979,241'Delay line for an ultrasonic probe and method of using same'19995,930,744'Coating thickness gauge'19995,777,230'Delay line for an ultrasonic probe and method of using same'19985,751,608'Coating thickness gauge'19985,723,791'High resolution ultrasonic coating thickness gauge'1998RE035703'Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil'19975,686,831'Gauge with reversible display screen'19975,623,427'Nondestructive anodic capacity gauge'19975,343,146'Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil'19945,325,430'Encryption apparatus for computer device'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994Patents assigned to FELSKO CORP DE (1)· patent assignee history
1994Patents assigned to TOVEN TECHNOLOGIES INC (1)· patent assignee history
1994–2001Based in Russell, CA· patent location history
1994Based in Ogdensburg, NY, US· patent location history
1997–2019Patents assigned to DEFELSKO CORP (15)· patent assignee history
1997–2019Based in Brockville, CA· patent location history
1997–2000Based in Ontario, CA· patent location history
2015Patents assigned to VANDERVALK LEON (1)· patent assignee history
2019Patents assigned to DEFELKSO CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| DEFELSKO CORP | 15 | 1997–2019 |
| DEFELKSO CORP | 1 | 2019 |
| FELSKO CORP DE | 1 | 1994 |
| TOVEN TECHNOLOGIES INC | 1 | 1994 |
| VANDERVALK LEONself | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Brockville, CA | 9 | 1997–2019 |
| Russell, CA | 6 | 1994–2001 |
| Ontario, CA | 3 | 1997–2000 |
| Ogdensburg, New York, US | 1 | 1994 |