Coating thickness gauge
Granted 12 May 1998 · no office action yet
Assignee: DeFelsko Corporation
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: David J. Beamish, Leon C. Vandervalk, Frank J. Koch · Examiner: Emanuel T. Voeltz
Life of the patent
2 dated eventsAbstract
A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.
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