Inventor

Sadami Takeoka

Inventor

Osaka, JP

Overview

1995–2009

Patent span

Physics

Primary field (CPC G)

Patents· 24 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables50%

G06FElectric digital data processing19%

G11CStatic stores14%

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1010%

G11BInformation storage based on relative movement between record carrier and transducer2%

H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses2%

H10DInorganic electric semiconductor devices2%

PatentTitleYear

7,613,972'Semiconductor integrated circuit, and designing method and testing method thereof'2009 7,610,533'Semiconductor integrated circuit and method for testing the same'2009 7,590,908'Semiconductor integrated circuit and method for testing the same'2009 7,512,853'Semiconductor integrated circuit and method for testing the same'2009 7,475,378'Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-out'2009 7,348,595'Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device'2008 7,302,658'Methods for evaluating quality of test sequences for delay faults and related technology'2007 7,203,913'Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same'2007 7,197,725'Semiconductor integrated circuit and testing method for the same'2007 7,171,600'Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device'2007 7,159,143'Method for evaluating delay test quality'2007 7,032,196'Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device'2006 7,017,135'Method of designing semiconductor integrated circuit utilizing a scan test function'2006 6,799,292'Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit'2004 6,734,549'Semiconductor device having a device for testing the semiconductor'2004 6,708,301'Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor'2004 6,625,784'Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same'2003 6,615,389'Database for designing integrated circuit device, and method for designing integrated circuit device'2003 6,499,125'Method for inserting test circuit and method for converting test data'2002 6,427,218'Method of generating test pattern for semiconductor integrated circuit and method of testing the same'2002 6,282,506'Method of designing semiconductor integrated circuit'2001 6,271,677'Semiconductor integrated circuit and method for testing the semiconductor integrated circuit'2001 6,205,566'Semiconductor integrated circuit, method for designing the same, and storage medium where design program for semiconductor integrated circuit is stored'2001 5,430,736'Method and apparatus for generating test pattern for sequential logic circuit of integrated circuit'1995

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1995–2008Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (19)· patent assignee history

1995Based in Moriguchi, JP· patent location history

2001–2009Based in Osaka, JP· patent location history

2004Based in Kadoma, JP· patent location history

2009Patents assigned to PANASONIC CORP (4)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD	19	1995–2008
PANASONIC CORP	4	2009

Locations

Location	Patents	Span
Osaka, JP	22	2001–2009
Kadoma, JP	1	2004
Moriguchi, JP	1	1995