LexDanaLexDanabeta
Inventor

Tetsuya Tanabe

Inventor
Tokyo, JP

Overview

57→
Patents
1995–2019
Patent span
Physics
Primary field (CPC G)

Patents· 57 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties20%
G11CStatic stores18%
G02BOptical elements, systems or apparatus17%
G06FElectric digital data processing9%
Y10TTechnical subjects covered by former us classification7%
H05KPrinted circuits6%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms5%
H03KPulse technique4%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
PatentTitleYear
10,371,631Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection201910,310,245Optical microscope device, microscopic observation method and computer program for microscopic observation using single light-emitting particle detection technique20199,863,806'Optical analysis method and optical analysis device using the detection of light from a single light-emitting particle'20189,751,393'Saddle type vehicle'20179,739,698'Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection'20179,528,923'Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection'20169,494,779'Optical analysis device, optical analysis method and computer program for optical analysis using single particle detection'20169,488,578'Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis'20169,435,727'Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection'20169,423,349'Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection'20169,395,357'Method of detecting sparse particles in a solution using a light-emitting probe'20169,354,171'Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis'20169,329,117'Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection'20169,187,781'Polymorphism identification method'20159,103,718'Optical analysis device and optical analysis method using a wavelength characteristic of light of a single light-emitting particle'20159,068,944'Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection'20158,958,066'Optical analysis method using measurement of light of two or more wavelength bands'20158,822,839'Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit board'20148,803,106'Optical analysis device, optical analysis method and computer program for optical analysis for observing polarization characteristics of a single light-emitting particle'20148,785,886'Optical analysis method using the light intensity of a single light-emitting particle'20148,736,211'Motor control device'20148,710,413'Optical analysis device, optical analysis method and computer program for optical analysis'20148,681,332'Method of measuring a diffusion characteristic value of a particle'20148,680,485'Optical analysis method using the detection of a single light-emitting particle'20148,541,759'Optical analysis device, optical analysis method and computer program for optical analysis'20138,530,165'Nucleic acid detection method for determining if one or more analyte nucleotides are present in a nucleic acid'20138,471,220'Optical analysis device, optical analysis method and computer program for optical analysis'20138,236,498'Method of detecting nucleotide sequence with an intramolecular probe'20128,106,310'Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit board'20128,024,155'Sample data reliability evaluation method and sample data reliability evaluation apparatus'20117,999,194'Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit board'20117,846,696'Method for estimating target nucleic acid ratio'20107,795,542'Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit board'20107,688,649'Semiconductor memory device with debounced write control signal'20107,178,234'Method of manufacturing multi-layer printed circuit board'20076,975,548'Memory device having redundant memory cell'20056,930,258'Multilayer printed wiring board and method of producing multilayer printed wiring board'20056,868,021'Rapidly testable semiconductor memory device'20056,522,563'Semiconductor memory with built-in cache'20036,510,070'Semiconductor memory with built-in cache'20036,441,665'Semiconductor integrated circuit'20026,362,989'Semiconductor memory with built-in cache'20026,320,778'Semiconductor memory with built-in cache'20016,249,450'Semiconductor memory with built-in cache'20016,195,771'Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and read circuit for semiconductor memory circuit'20016,052,330'Semiconductor memory with arbitrary data masking'20006,011,709'Semiconductor memory with built-in cache'20005,781,466'Semiconductor memory with built-in cache'19985,739,719'Bias circuit with low sensitivity to threshold variations'19985,659,258'Level shifter circuit'19975,652,727'Semiconductor memory device'19975,648,734'Buffer circuit and bias circuit'19975,596,521'Semiconductor memory with built-in cache'19975,577,223'Dynamic random access memory (DRAM) with cache and tag'19965,566,115'Semiconductor memory device'19965,511,030'Semiconductor memory device and method of driving same'19965,477,496'Semiconductor memory device having circuits for precharging and equalizing'1995

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1995–2005Patents assigned to OKI ELECTRIC IND CO LTD (21)· patent assignee history
1995–2019Based in Tokyo, JP· patent location history
2005–2014Patents assigned to IBIDEN CO LTD (6)· patent assignee history
2005–2014Based in Ogaki, JP· patent location history
2005Based in Kanagawa, JP· patent location history
2010–2019Patents assigned to OLYMPUS CORP (26)· patent assignee history
2012–2015Patents assigned to TANABE TETSUYA (9)· patent assignee history
2013–2014Patents assigned to HORI KUNIO (3)· patent assignee history
2014Based in Setagaya, JP· patent location history
2017Based in Wako, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
OLYMPUS CORP262010–2019
OKI ELECTRIC IND CO LTD211995–2005
TANABE TETSUYAself92012–2015
IBIDEN CO LTD62005–2014
HORI KUNIO32013–2014
Locations
LocationPatentsSpan
Tokyo, JP451995–2019
Ogaki, JP62005–2014
Setagaya, JP22014
Kanagawa, JP22005
Wako, JP12017