USPatentGranted
B2

Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis

Granted 31 May 2016 · 2 office actions

Assignee: Olympus Corporation

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Attorney: Attorney · Log in to unlock

Inventors: Tetsuya Tanabe, Takuya Hanashi · Examiner: Amanda Merlino

Life of the patent

9 dated events
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Abstract

There is provided a single particle detection technique based on a scanning molecule counting method, enabling individual detection of a single particle using light measurement with a confocal or multiphoton microscope, and quantitative observation of conditions or characteristics of the particle. The inventive technique of detecting a single particle in a sample solution detects light containing substantially constant background light from a light detection region with moving the position of the light detection region of the microscope in a sample solution to generate time series light intensity data; and detects individually a light intensity reduction occurred when a single particle which does not emit light (or a particle whose emitting light intensity in a detected wavelength band is lower than the background light) enters in the light detection region in the time series light intensity data as a signal indicating the existence of each single particle.

Claims

33 · 3 independent · depth 3
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33 granted claims

Classifications

4 codes
IPC · International Patent Classification
Section G — Physics
  • G01N21/51
  • G01N15/14
  • G02B21/00
  • G01N21/64

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Pendency
2.4 y
859 days filing → grant
Office actions
1
non-final + final
Responses
1
1 RCE
Examiner
Amanda Merlino
art unit —
Citations: 128 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20140134608 A115 May 2014

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Citations

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