Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis
Granted 31 May 2016 · 2 office actions
Assignee: Olympus Corporation
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Tetsuya Tanabe, Takuya Hanashi · Examiner: Amanda Merlino
Life of the patent
9 dated eventsAbstract
There is provided a single particle detection technique based on a scanning molecule counting method, enabling individual detection of a single particle using light measurement with a confocal or multiphoton microscope, and quantitative observation of conditions or characteristics of the particle. The inventive technique of detecting a single particle in a sample solution detects light containing substantially constant background light from a light detection region with moving the position of the light detection region of the microscope in a sample solution to generate time series light intensity data; and detects individually a light intensity reduction occurred when a single particle which does not emit light (or a particle whose emitting light intensity in a detected wavelength band is lower than the background light) enters in the light detection region in the time series light intensity data as a signal indicating the existence of each single particle.
Claims
33 · 3 independent · depth 3Classifications
4 codes- G01N21/51
- G01N15/14
- G02B21/00
- G01N21/64
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20140134608 A1 | 15 May 2014 |
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