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Inventor

Mitsuji Ikeda

Inventor
Hitachinaka, JP

Overview

47→
Patents
1991–2020
Patent span
Physics
Primary field (CPC G)

Patents· 47 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Tprimary
G06TImage data processing or generation, in general22%
H01JElectric discharge tubes or discharge lamps18%
G06VImage or video recognition or understanding14%
G02BOptical elements, systems or apparatus8%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G06KGraphical data reading6%
G06FElectric digital data processing5%
G01BMeasuring length, thickness or similar linear dimensions4%
H01BCables4%
G01RMeasuring electric variables3%
PatentTitleYear
10,535,129Pattern matching apparatus and computer program20209,514,526'Device and method for detecting angle of rotation from normal position of image'20169,514,528'Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus'20169,183,450'Inspection apparatus'20159,141,879'Pattern matching method, image processing device, and computer program'20158,971,627'Template matching processing device and template matching processing program'20158,953,894'Pattern matching method and image processing device'20158,885,950'Pattern matching method and pattern matching apparatus'20148,872,106'Pattern measuring apparatus'20148,618,517'Pattern measuring apparatus'20138,498,489'Image inspection apparatus'20138,335,397'Charged particle beam apparatus'20128,305,435'Image processing system and scanning electron microscope'20128,285,056'Method and apparatus for computing degree of matching'20128,263,935'Charged particle beam apparatus'20128,200,006'Image processing apparatus for analysis of pattern matching failure'20128,139,868'Image processing method for determining matching position between template and search image'20128,041,104'Pattern matching apparatus and scanning electron microscope using the same'20118,019,164'Apparatus, method and program product for matching with a template'20117,925,076'Inspection apparatus using template matching method using similarity distribution'20117,652,249'Charged particle beam apparatus'20107,642,514'Charged particle beam apparatus'20107,545,977'Image processing apparatus for analysis of pattern matching failure'20097,329,868'Charged particle beam apparatus'20087,235,782'Semiconductor inspection system'20077,230,243'Method and apparatus for measuring three-dimensional shape of specimen by using SEM'20077,109,485'Charged particle beam apparatus'20067,082,224'Statistic calculating method using a template and corresponding sub-image to determine similarity based on sum of squares thresholding'20067,078,688'Shape measuring device and shape measuring method'20067,026,615'Semiconductor inspection system'20066,936,818'Charged particle beam apparatus'20056,850,219'Display device'20056,756,590'Shape measurement method and apparatus'20046,653,633'Charged particle beam apparatus'20036,538,249'Image-formation apparatus using charged particle beams under various focus conditions'20036,265,077'Ceramic articles and method for manufacturing the same'20016,249,608'Template matching image processor utilizing sub image pixel sums and sum of squares thresholding'20015,538,574'Process for producing optical fiber composite insulators'19965,410,696'Method of processing a program by parallel processing, and a processing unit thereof'19955,339,381'Optical fiber composite insulators'19945,329,532'Logic circuit with additional circuit for carrying out delay test'19945,138,692'Optical fiber built-in type composite insulator'19925,136,680'Optical fiber built-in type composite insulator and method for producing the same'19925,127,083'Optical fiber built-in type composite insulator and method of producing the same'19925,090,793'Optical fiber composite insulator'19925,069,525'Optical fiber built-in type composite insulator and method of producing the same'19915,029,969'Optical fiber composite insulator and method of producing the same'1991

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1991–2001Patents assigned to NGK INSULATORS LTD (9)· patent assignee history
1991–2001Based in Nagoya, JP· patent location history
1994–2010Patents assigned to HITACHI LTD (13)· patent assignee history
1994–1995Based in Katsuta, JP· patent location history
2001–2020Based in Hitachinaka, JP· patent location history
2004–2020Patents assigned to HITACHI HIGH TECH CORP (24)· patent assignee history
2004–2016Based in Tokyo, JP· patent location history
2012–2020Patents assigned to IKEDA MITSUJI (14)· patent assignee history
2012–2020Patents assigned to ABE YUICHI (8)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP242004–2020
IKEDA MITSUJIself142012–2020
HITACHI LTD131994–2010
NGK INSULATORS LTD91991–2001
ABE YUICHI82012–2020
Locations
LocationPatentsSpan
Hitachinaka, JP332001–2020
Nagoya, JP91991–2001
Tokyo, JP32004–2016
Katsuta, JP21994–1995