Window E-chip for an electron microscope
Granted 19 Feb 2019 · 2 office actions
Assignee: PROTOCHIPS, INC.
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Attorney: Attorney · Log in to unlock
Inventors: John Damiano, Jr., David P. Nackashi, Daniel S. Gardiner, Franklin Stampley Walden, II · Examiner: Susan Bennett Hattan · AU 2922 · TC 2900
Life of the patent
2 dated eventsDescription
1 parts›FIG. 1 is a perspective view of the…
FIG. 1 is a perspective view of the window E-chip for an electron microscope of the invention having a rectangular window.
FIG. 2 is a top plan view of the window E-chip for an electron microscope of FIG. 1 .
FIG. 3 is a bottom view of the window E-chip for an electron microscope of FIG. 1 .
FIG. 4 is side view of the window E-chip for an electron microscope of FIG. 1 .
FIG. 5 is a perspective view of the window E-chip for an electron microscope of the invention having a square window.
FIG. 6 is a top plan view of the window E-chip for an electron microscope of FIG. 5 .
FIG. 7 is a bottom view of the window E-chip for an electron microscope of FIG. 5 .
FIG. 8 is a side view of the window E-chip for an electron microscope of FIG. 5 .
FIG. 9 is a perspective view of the window E-chip for an electron microscope of FIG. 5 in a condition of use in one embodiment of an electron microscopy sample holder; and,
FIG. 10 is a perspective view of the window E-chip for an electron microscope of FIG. 1 in a condition of use in a second embodiment of an electron microscopy sample holder.
Broken lines, which form no part of the claimed design, are used for illustrative purposes to show an environment of the claimed design in a condition of use.
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