Inventor
David P. Nackashi
Inventor
Raleigh, NC, US
Overview
Patents· 34 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps43%
G01NInvestigating or analysing materials by determining their chemical or physical properties15%
G02BOptical elements, systems or apparatus7%
E04HBuildings or like structures for particular purposes5%
G01KMeasuring temperature4%
H01RElectrically-conductive connections4%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure3%
G01MTesting static or dynamic balance of machines or structures3%
G05BControl or regulating systems in general3%
G05DSystems for controlling or regulating non-electric variables3%
PatentTitleYear
10,986,279Automated application of drift correction to sample studied under electron microscope202110,777,380MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples2020RE048201Specimen holder used for mounting samples in electron microscopes202010,503,127Method for safe control of gas delivery to an electron microscope sample holder201910,460,906Method for monitoring environmental states of a microscope sample with an electron microscope sample holder201910,446,363MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples201910,256,563Method for forming an electrical connection to a sample support in an electron microscope holder2019D0841183Window E-chip for an electron microscope201910,192,714Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices201910,128,079MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples201810,043,633Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices20189,984,850Microscopy support structures20189,915,926'Method for safe control of gas delivery to an electron microscope sample holder'2018D0806892'Tip of a sample holder'20189,837,746Method for forming an electrical connection to a sample support in an electron microscope holder20179,818,578'Device for monitoring environmental states of a microscope sample with an electron microscope sample holder'20179,666,409'Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices'20179,437,393'Method for forming an electrical connection to an sample support in an electron microscope holder'20169,324,539'Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices'20169,312,097'Specimen holder used for mounting samples in electron microscopes'20169,275,826'Microscopy support structures'20169,275,825'Sample holder for electron microscopy for low-current, low-noise analysis'20169,064,672'Specimen mount for microscopy'20159,048,065'Methods of using temperature control devices in electron microscopy'20159,040,939'Membrane supports with reinforcement features'20158,920,723'Sample support structure and methods'20148,872,129'Microscopy support structures'20148,872,128'Sample holder providing interface to semiconductor device with high density connections'20148,859,991'Specimen holder used for mounting samples in electron microscopes'20148,853,646'Specimen holder used for mounting samples in electron microscopes'20148,829,469'Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices'20148,513,621'Specimen holder used for mounting'20138,466,432'Sample holder providing interface to semiconductor device with high density connections'20137,713,053'Reusable template for creation of thin films; method of making and using template; and thin films produced from template'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2021Patents assigned to PROTOCHIPS INC (34)· patent assignee history
2010–2021Based in Raleigh, NC, US· patent location history
2013–2016Patents assigned to NACKASHI DAVID P (8)· patent assignee history
2013–2015Patents assigned to MICK STEPHEN E (7)· patent assignee history
2013–2015Patents assigned to DAMIANO JR JOHN (6)· patent assignee history
2015–2016Patents assigned to DAMIANO JOHN (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| PROTOCHIPS INC | 34 | 2010–2021 |
| NACKASHI DAVID Pself | 8 | 2013–2016 |
| MICK STEPHEN E | 7 | 2013–2015 |
| DAMIANO JR JOHN | 6 | 2013–2015 |
| DAMIANO JOHN | 3 | 2015–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Raleigh, NC, US | 34 | 2010–2021 |