Specimen analyzer
Granted 13 Mar 2012 · 2 office actions
Current assignee: Arkray, Inc. · originally Sysmex Corporation
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Keisuke Tsutsumida, Fumie Shibata, Shinya Nakajima · Examiner: Anhdao Doan · AU 2914 · TC 2900
Life of the patent
7 dated eventsDescription
1 parts›FIG. 1 is a front view of a…
FIG. 1 is a front view of a specimen analyzer of the present invention;
FIG. 2 is a rear view thereof;
FIG. 3 is a right side view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a top view thereof;
FIG. 6 is a bottom view thereof;
FIG. 7 is a top and front perspective view thereof; and,
FIG. 8 is a top and front perspective view thereof shown in an environmental use.
The broken lines in FIG. 8 represent the environmental subject matter, and the broken lines in FIGS. 2 and 4 are included for the purpose of illustrating portions of the specimen analyzer that form no part of the claimed design. None of the broken lines form a part of the claimed design.
Claims
1 · 1 independent · depth 1Classifications
1 codesClaim changes
SoonSee which claims were amended, added or cancelled during examination, with every added and removed word marked.
The published claims of this patent are not paired with the granted ones in what we hold.
File wrapper
See the full prosecution history — every USPTO and applicant action on this file, in order.
Log in to unlockChain of title
See the full assignment history — every owner this patent has passed through, with recordation dates and reel/frame numbers.
Log in to unlockTerm & fees
See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.
Log in to unlockValidity challenges
See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.
Log in to unlockCitations
See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.
Log in to unlock