Inventor
Shinya Nakajima
Inventor
Kyoto, JP
Overview
Patents· 31 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties28%
G10LSpeech analysis techniques or speech synthesis7%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein6%
Y10TTechnical subjects covered by former us classification6%
A61LMethods or apparatus for sterilising materials or objects in general4%
C04BLime, magnesia4%
C21DModifying the physical structure of ferrous metals4%
G01BMeasuring length, thickness or similar linear dimensions4%
G01MTesting static or dynamic balance of machines or structures4%
G02BOptical elements, systems or apparatus4%
PatentTitleYear
11,080,512Information processing device, information processing method, measurement system and non-transitory storage medium202110,992,085Receptacle202110,437,036Analysis apparatus201910,337,985Measurement method and measurement system20199,812,348'Member peeling method, member processing method, and method for manufacturing semiconductor chip'20179,618,519'Method for evaluating urine sample, analyzer, and analysis system'20179,523,643'Protein concentration assay method including pH measurement'20169,417,235'Optical measurement apparatus'20169,255,938'Sample analyzer and method of analyzing a sample'20169,080,996'Sample analyzer and method for controlling a sample analyzer'20158,884,766'Analysis system, analysis method and analysis program'20148,824,895'Radio-on-fiber unit and radio-on-fiber system'20148,793,124'Speech processing method and apparatus for deciding emphasized portions of speech, and program therefor'20148,693,005'Method for evaluating characteristics of optical modulator having Mach-Zehnder interferometers'20148,672,217'Data output method in analysis of sample, analytical device, and analytical system'20148,641,988'Sample analyzer and sample analysis system'20148,574,511'Test instrument and optical measurement apparatus'20138,446,591'Method for evaluating characteristics of optical modulator having Mach-Zehnder interferometers'20138,386,257'Emotion detecting method, emotion detecting apparatus, emotion detecting program that implements the same method, and storage medium that stores the same program'20138,351,047'Method for evaluating characteristics of optical modulator having high-precision Mach-Zehnder interferometers'20138,277,752'Optical measurement apparatus'20128,182,761'Test instrument and optical measurement apparatus'2012D0655824'Specimen analyzer'20127,867,344'Hot pressing method for high strength member using steel sheet and hot pressed parts'20117,842,142'High strength part and method for producing the same'20107,256,892'Measuring instrument and fluorometric method'20076,683,900'Solid state laser apparatus'20046,334,106'Method for editing non-verbal information by adding mental state information to a speech message'20016,226,614'Method and apparatus for editing/creating synthetic speech message and recording medium with the method recorded thereon'20015,356,436'Materials for living hard tissue replacements'19945,344,456'Materials for living hard tissue replacements'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994Based in Narashino, JP· patent location history
2001–2021Based in Tokyo, JP· patent location history
2004–2013Based in Kanagawa, JP· patent location history
2007–2021Patents assigned to ARKRAY INC (15)· patent assignee history
2007–2019Based in Kyoto, JP· patent location history
2012–2016Patents assigned to NAKAJIMA SHINYA (12)· patent assignee history
2012–2016Patents assigned to KASAI TOKUO (4)· patent assignee history
2012–2016Patents assigned to NAKAGAWA TAKASHI (4)· patent assignee history
2013–2014Patents assigned to NAT INST INF & COMM TECH (4)· patent assignee history
2021Based in Kyoto-shi, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ARKRAY INC | 15 | 2007–2021 |
| NAKAJIMA SHINYAself | 12 | 2012–2016 |
| KASAI TOKUO | 4 | 2012–2016 |
| NAKAGAWA TAKASHI | 4 | 2012–2016 |
| NAT INST INF & COMM TECH | 4 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kyoto, JP | 15 | 2007–2019 |
| Tokyo, JP | 7 | 2001–2021 |
| Kanagawa, JP | 2 | 2004–2013 |
| Narashino, JP | 2 | 1994 |
| Kyoto-shi, JP | 1 | 2021 |