USPatentGranted
S1

Elastic membrane for semiconductor wafer polishing apparatus

Granted 23 Jan 2018 · no office action yet

Assignee: Ebara Corporation

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Inventors: Makoto Fukushima, Hozumi Yasuda, Satoru Yamaki, Osamu Nabeya +2 · Examiner: Elizabeth J Oswecki · AU 2912 · TC 2900

Application
29/574,604
filed 17 Aug 2016
Publication
Not published
not published
Patent· this page
US D808349
granted 23 Jan 2018

Life of the patent

5 dated events
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Description

1 parts
›FIG. 1 is a bottom plan view of…

FIG. 1 is a bottom plan view of a first elastic membrane for semiconductor wafer polishing apparatus showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is an enlarged perspective view of a portion taken along section 4 in FIG. 2 ;

FIG. 5 is a cross-sectional view taken along the line 5 - 5 in FIG. 2 ; and,

FIG. 6 is an enlarged portion view taken along line 6 - 6 in FIG. 5 .

The broken lines shown in the drawings represent portions of the elastic membrane for semiconductor wafer polishing apparatus that form no part of the claimed design. The dashed-dot-dashed lines represent boundary lines of the claimed design.

All surfaces not shown form no part of the claimed design.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1
1 granted claims

Classifications

1 codes
USPC · US Patent Classification
D13/182

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File wrapper

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Pendency
1.4 y
524 days filing → grant
Office actions
0
after a restriction
Examiner
Elizabeth J Oswecki
art unit 2912 · TC 2900
Citations: 33 back · 0 forward

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Citations

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