Housing for test and measurement instruments
Granted 11 Jan 2005 · no office action yet
Current assignee: Tektronix Inc. · originally Fortive
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Jerry L. Wrisley, Takashi Sugiura · Examiner: Antoine D. Davis · AU 2913 · TC 2900
Life of the patent
5 dated eventsDescription
1 parts›The ornamental design disclosed in this application is…
The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like. The housing has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, side surfaces having a curved top edges, and a top surface having curved surfaces adjacent to the curved top edges of the side surfaces that transition to a substantially flat surface extending from the front face to the rear surface having a recess formed therein for receiving a recessed handle.
FIG. 1 is a perspective view of a housing for test and measurement instruments;
FIG. 2 is a front elevation view of the housing for test and measurement instruments;
FIG. 3 is a left side elevation view of the housing for test and measurement instruments;
FIG. 4 is a right side elevation view of the housing for test and measurement instruments;
FIG. 5 is a top plan view of the housing for test and measurement instruments;
FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,
FIG. 7 is a rear elevation view of the housing for test and measurement instruments.
Claims
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