USPatent applicationPatented

Housing for test and measurement instruments

Granted 11 Jan 2005 · no office action yet

Current assignee: Tektronix Inc. · originally Fortive

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Inventors: Jerry L. Wrisley, Takashi Sugiura · Examiner: Antoine D. Davis · AU 2913 · TC 2900

Application· this page
29/204,635
filed 30 Apr 2004
Publication
Not published
not published
Patent
US D500695
granted 11 Jan 2005

Life of the application

5 dated events
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Description

1 parts
›The ornamental design disclosed in this application is…

The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like. The housing has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, side surfaces having a curved top edges, and a top surface having curved surfaces adjacent to the curved top edges of the side surfaces that transition to a substantially flat surface extending from the front face to the rear surface having a recess formed therein for receiving a recessed handle.

FIG. 1 is a perspective view of a housing for test and measurement instruments;

FIG. 2 is a front elevation view of the housing for test and measurement instruments;

FIG. 3 is a left side elevation view of the housing for test and measurement instruments;

FIG. 4 is a right side elevation view of the housing for test and measurement instruments;

FIG. 5 is a top plan view of the housing for test and measurement instruments;

FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,

FIG. 7 is a rear elevation view of the housing for test and measurement instruments.

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Claims as granted

1 claim

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Classifications

1 codes
USPC · US Patent Classification
D10/76

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Pendency
0.7 y
256 days filing → grant
Office actions
0
none on record
Examiner
Antoine D. Davis
art unit 2913 · TC 2900
Citations: 6 back · 0 forward

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Documents

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Chain of title

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