FIG. 2 is a front view of the IC test-head stand shown in FIG. 1. A rear view of the IC test-head stand is omitted from the drawing since the rear view is symmetrical with the front view.

FIG. 3 is a left side view of the IC test-head stand shown in FIG. 1.

FIG. 4 is a right side view of the IC test-head stand shown in FIG. 1.

FIG. 5 is a top plan view of the IC test-head stand shown in FIG. 1.

FIG. 6 is a bottom plan view of the IC test-head stand shown in FIG. 1.

FIG. 7 is a perspective view of an IC test-head stand according to a second embodiment of the present design.

FIG. 8 is a front view of the IC test-head stand shown in FIG. 7. A rear view of the IC test-head stand is omitted from the drawing since the rear view is symmetrical with the front view.

FIG. 9 is a left side view of the IC test-head stand shown in FIG. 7.

FIG. 10 is a right side view of the IC test-head stand shown in FIG. 7.

FIG. 11 is a top plan view of the IC test-head stand shown in FIG. 7.

FIG. 12 is a bottom plan view of the IC test-head stand shown in FIG. 7.

FIG. 13 is a perspective view of an IC test-head stand according to a third embodiment of the present design.

FIG. 14 is a front view of the IC test-head stand shown in FIG. 13. A rear view of the IC test-head stand is omitted from the drawing since the rear view is symmetrical with the front view.

FIG. 15 is a left side view of the IC test-head stand shown in FIG. 13.

FIG. 16 is a right side view of the IC test-head stand shown in FIG. 13.

FIG. 17 is a top plan view of the IC test-head stand shown in FIG. 13.

FIG. 18 is a bottom plan view of the IC test-head stand shown in FIG. 13; and,

FIG. 19 is a front view of the IC test-head stand shown in FIG. 1, for illustrating the use of the IC test-head stand.

The broken line showing is for illustrative purposes only and forms no part of the claimed design.

the grant prints no section headings; every part label below is ours, taken from that part's own first words

Claims

1 · 1 independent · depth 1

1 granted claims

›1.independentThe ornamental design for an IC test-head stand, as shown and described.

Classifications

2 codes

USPC · US Patent Classification

D10/80D34/12

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419 days filing → grant

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Antoine Duval Davis

art unit 293 · TC 2900

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