Display device and method for manufacturing the display device
Granted 8 Mar 2016 · 10 office actions
Current assignee: Semiconductor Energy Laboratory Co., Ltd. · originally Semiconductor Energy Laboratory
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Shunpei Yamazaki, Hisashi Ohtani, Satoshi Murakami · Examiner: Elmito Breval · AU 2875 · TC 2800
Life of the patent
22 dated eventsAbstract
It is an object of the present invention to provide a technology for manufacturing a highly reliable display device at a low cost with high yield. In the present invention, a spacer is formed over a pixel electrode, thereby protecting the pixel electrode layer from a mask in formation of an electroluminescent layer. In addition, since a layer that includes an organic material that has water permeability is sealed in a display device with a sealing material and the sealing material and the layer that includes the organic material are not in contact, deterioration of a light-emitting element due to a contaminant such as water can be prevented. The sealing material is formed in a portion of a driver circuit region in the display device, and thus, the narrower frame margin of the display device can also be accomplished.
Claims
33 · 4 independent · depth 2Classifications
4 codes- H01L51/52
- H01L51/56
- H01L51/00
- H01L27/32
Claim changes
SoonSee which claims were amended, added or cancelled during examination, with every added and removed word marked.
The published claims of this patent are not paired with the granted ones in what we hold.
File wrapper
See the full prosecution history — every USPTO and applicant action on this file, in order.
Log in to unlockTerm & fees
See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.
Log in to unlockPriority chain
1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20130134401 A1 | 30 May 2013 |
Validity challenges
See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.
Log in to unlockCitations
See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.
Log in to unlock