USPatentGranted
B2

Substrate dividing method

Granted 2 Feb 2016 · no office action yet

Assignee: Hamamatsu Photonics

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Inventors: Yoshimaro Fujii, Kenshi Fukumitsu, Fumitsugu Fukuyo, Naoki Uchiyama · Examiner: Elias M Ullah · AU 2893 · TC 2800

Life of the patent

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Abstract

A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1 , and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.

Claims

12 · 1 independent · depth 4
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12 granted claims

Classifications

4 codes
IPC · International Patent Classification
Section H — Electricity
  • H01L21/00
  • H01L23/00
  • H01L21/78
  • H01L21/304

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Pendency
0.6 y
210 days filing → grant
Office actions
0
none on record
Responses
2
no RCE
Examiner
Elias M Ullah
art unit 2893 · TC 2800
Citations: 501 back · 0 forward

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Term & fees

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20150311119 A129 Oct 2015

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