Substrate dividing method
Granted 2 Feb 2016 · no office action yet
Assignee: Hamamatsu Photonics
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Yoshimaro Fujii, Kenshi Fukumitsu, Fumitsugu Fukuyo, Naoki Uchiyama · Examiner: Elias M Ullah · AU 2893 · TC 2800
Life of the patent
5 dated eventsAbstract
A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1 , and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
Claims
12 · 1 independent · depth 4Classifications
4 codes- H01L21/00
- H01L23/00
- H01L21/78
- H01L21/304
Claim changes
SoonSee which claims were amended, added or cancelled during examination, with every added and removed word marked.
The published claims of this patent are not paired with the granted ones in what we hold.
File wrapper
See the full prosecution history — every USPTO and applicant action on this file, in order.
Log in to unlockTerm & fees
See the term timeline — pendency span, in-force span, the maintenance fees paid and both computed expiry dates.
Log in to unlockPriority chain
1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20150311119 A1 | 29 Oct 2015 |
Validity challenges
See the validity challenges on record — reexaminations, IPRs and PGRs, with their institution decisions and outcomes.
Log in to unlockCitations
See every patent this one cites and every patent that cites it back — publication, assignee, and how each one was found.
Log in to unlock