USPatentGranted
B2

Method of fabricating metal-insulator-semiconductor tunneling contacts using conformal deposition and thermal growth processes

Granted 2 Dec 2014 · 2 office actions

Assignee: Intel Corporation

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Inventors: Niloy Mukherjee, Robert S. Chau, Gilbert Dewey, Jack Kavalieros +1 · Examiner: Chuong A Luu · AU 2898 · TC 2800

Life of the patent

3 dated events
⤢ drag to zoomJan 2012Jul 2012Jan 2013Jul 2013Jan 2014Jul 2014Jan 2015Prosecution
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Abstract

A contact may be fabricated by a method including depositing a dielectric layer on a substrate having a transistor, etching a first opening in the dielectric layer that extends to a source region, forming an insulator on the source region, forming a contact metal on the insulator, the insulator separating the contact metal from the source region, and filling substantially all of the first opening, wherein the contact metal remains separated from the source region after the first opening is filled.

Claims

5 · 1 independent · depth 3
12345
5 granted claims

Classifications

16 codes
IPC · International Patent Classification
Section H — Electricity
  • H01L29/78
  • H01L21/768
  • H01L29/51
  • H01L21/285
  • H01L23/485
  • H01L21/8234
  • H01L29/45
  • H01L29/08
  • H01L29/417
  • H01L29/66
USPC · US Patent Classification
257/774438/233438/675438/648438/682438/637

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File wrapper

Pendency
2.9 y
1,050 days filing → grant
Office actions
1
non-final + final
Responses
2
1 RCE
Examiner
Chuong A Luu
art unit 2898 · TC 2800
Citations: 56 back · 1 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20120115330 A110 May 2012

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Citations

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