Method of fabricating metal-insulator-semiconductor tunneling contacts using conformal deposition and thermal growth processes
Granted 2 Dec 2014 · 2 office actions
Assignee: Intel Corporation
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Attorney: Attorney · Log in to unlock
Inventors: Niloy Mukherjee, Robert S. Chau, Gilbert Dewey, Jack Kavalieros +1 · Examiner: Chuong A Luu · AU 2898 · TC 2800
Life of the patent
3 dated eventsAbstract
A contact may be fabricated by a method including depositing a dielectric layer on a substrate having a transistor, etching a first opening in the dielectric layer that extends to a source region, forming an insulator on the source region, forming a contact metal on the insulator, the insulator separating the contact metal from the source region, and filling substantially all of the first opening, wherein the contact metal remains separated from the source region after the first opening is filled.
Claims
5 · 1 independent · depth 3Classifications
16 codes- H01L29/78
- H01L21/768
- H01L29/51
- H01L21/285
- H01L23/485
- H01L21/8234
- H01L29/45
- H01L29/08
- H01L29/417
- H01L29/66
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20120115330 A1 | 10 May 2012 |
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