Current sensor, inverter circuit, and semiconductor device having the same
Granted 29 Jul 2014 · 2 office actions
Assignee: Denso Corporation
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Attorney: Attorney · Log in to unlock
Inventors: Youichi Ashida, Akio Nakagawa, Satoshi Shiraki, Hiroyasu Kudo +4 · Examiner: Temilade S Rhodes-Vivour
Life of the patent
7 dated eventsAbstract
A semiconductor device having a lateral semiconductor element includes a semiconductor substrate, a first electrode on the substrate, a second electrode on the substrate, and an isolation structure located in the substrate to divide the substrate into a first island and a second island electrically insulated from the first island. The lateral semiconductor element includes a main cell located in the first island and a sense cell located in the second island. The main cell causes a first current to flow between the first electrode and the second electrode so that the first current flows in a lateral direction along the surface of the substrate. The first current is detected by detecting a second current flowing though the sense cell.
Claims
28 · 3 independent · depth 4Classifications
10 codes- G01R1/20
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20110298446 A1 | 8 Dec 2011 |
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