USPatentGranted
B2

Current sensor, inverter circuit, and semiconductor device having the same

Granted 29 Jul 2014 · 2 office actions

Assignee: Denso Corporation

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Inventors: Youichi Ashida, Akio Nakagawa, Satoshi Shiraki, Hiroyasu Kudo +4 · Examiner: Temilade S Rhodes-Vivour

Life of the patent

7 dated events
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Abstract

A semiconductor device having a lateral semiconductor element includes a semiconductor substrate, a first electrode on the substrate, a second electrode on the substrate, and an isolation structure located in the substrate to divide the substrate into a first island and a second island electrically insulated from the first island. The lateral semiconductor element includes a main cell located in the first island and a sense cell located in the second island. The main cell causes a first current to flow between the first electrode and the second electrode so that the first current flows in a lateral direction along the surface of the substrate. The first current is detected by detecting a second current flowing though the sense cell.

Claims

28 · 3 independent · depth 4
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28 granted claims

Classifications

10 codes
IPC · International Patent Classification
Section G — Physics
  • G01R1/20
USPC · US Patent Classification
324/126257/48324/207.22257/E29.166324/207.2324/207.21324/242257/E29.197324/207.13

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File wrapper

⤢ drag to zoomJul 2011Jan 2012Jul 2012Jan 2013Jul 2013Jan 2014Jul 2014USPTOApplicantNon-final rejectionNotice of allowance
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Pendency
3.2 y
1,154 days filing → grant
Office actions
1
non-final + final
Responses
1
no RCE
Examiner
Temilade S Rhodes-Vivour
art unit —
Citations: 22 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20110298446 A18 Dec 2011

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Citations

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