USPatentGranted
B2

Memory kink checking

Granted 29 Apr 2014 · no office action yet

Current assignee: Micron Semiconductor, Inc. · originally Micron Technology, Inc.

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Inventors: Mark A. Helm, Uday Chandrasekhar · Examiner: Douglas King · AU 2824 · TC 2800

Life of the patent

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Abstract

This disclosure concerns memory kink checking. One embodiment includes selectively applying one of a plurality of voltages to a first data line according to a programming status of a first memory cell, wherein the first memory cell is coupled to the first data line and to a selected access line. An effect on a second data line is determined, due at least in part to the voltage applied to the first data line and a capacitive coupling between at least the first data line and the second data line, wherein the second data line is coupled to a second memory cell, the second memory cell is adjacent to the first memory cell, and the second memory cell is coupled to the selected access line. A kink correction is applied to the second data line, responsive to the determined effect, during a subsequent programming pulse applied to the second memory cell.

Claims

13 · 2 independent · depth 3
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13 granted claims

Classifications

3 codes
IPC · International Patent Classification
Section G — Physics
  • G11C11/34
USPC · US Patent Classification
365/185.2365/185.18

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Pendency
0.8 y
294 days filing → grant
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0
after a restriction
Responses
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1 RCE
Examiner
Douglas King
art unit 2824 · TC 2800
Citations: 29 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20130294156 A17 Nov 2013

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