Photomask blank, process for production of photomask, and chromium-containing material film
Granted 29 Apr 2014 · 2 office actions
Assignee: Shin-Etsu Chemical Co., Ltd.
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Attorney: Attorney · Log in to unlock
Inventors: Hideo Nakagawa, Hiroki Yoshikawa, Yukio Inazuki, Tsuneo Yamamoto +1 · Examiner: Stephen Rosasco · AU 1721 · TC 1700
Life of the patent
9 dated eventsAbstract
In the chromium-containing material film of the present invention, an element is added thereto and is capable of bringing a mixture of the element and the chromium into a liquid phase at a temperature of 400° C. or lower. The use of such a chromium-containing material film as an optical film (e.g., a light-shielding film, an etching mask film, or an etching stopper film) of a photo mask blank can achieve an improvement in chlorine-dry etching while retaining the same optical characteristics and the like as those of the conventional chromium-containing material film, thereby increasing the patterning precision.
Claims
20 · 3 independent · depth 3Classifications
3 codes- G03F1/50
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20130230796 A1 | 5 Sep 2013 |
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