(Meth)acrylate derivative, polymer and photoresist composition having lactone structure, and method for forming pattern by using it
Granted 21 Feb 2012 · 6 office actions
Current assignee: NEC Corporation · originally AT&T Company
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Inventors: Shigeyuki Iwasa, Kaichiro Nakano, Katsumi Maeda, Etsuo Hasegawa · Examiner: Karuna P Reddy · AU 1764 · TC 1700
Life of the patent
19 dated eventsAbstract
A photoresist material for lithography using a light of 220 nm or less which comprises at least a polymer represented by the following formula (2) and a photo-acid generator for generating an acid by exposure: [structure] wherein R 1 , R 2 , R 3 and R 5 are each a hydrogen atom or a methyl group; R 4 is an acid-labile group or one of a specified subset of alicyclic hydrocarbon groups, alicyclic hydrocarbon groups, or hydrocarbon groups; R 6 is a hydrogen atom or one of a specified subset of hydrocarbon groups or alicyclic hydrocarbon groups; x, y and z are optional values which meet x+y+z=1, 0<x≦1, 0≦y<1 and 0≦z<1. Also disclosed is a resin having a (meth)acrylate unit of an alicyclic lactone structure represented by the formula (3): [structure] wherein R 8 is a hydrogen atom or a methyl group, and R 9 is one of a specified subset of hydrocarbon groups.
Claims
4 · 1 independent · depth 3Classifications
11 codes- C08F10/00
- C08F32/08
- C08F118/02
- C08F24/00
- C08F2/00
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20090023878 A1 | 22 Jan 2009 |
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