USPatentGranted
B2

Environmental system including vacuum scavenge for an immersion lithography apparatus

Granted 26 Apr 2011 · 6 office actions

Assignee: Nikon Corporation

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Inventors: Michael Sogard, Andrew J. Hazelton · Examiner: Hung Henry Nguyen · AU 2882 · TC 2800

Life of the patent

4 dated events
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Abstract

A lithographic projection apparatus includes a liquid confinement structure extending along at least a part of a boundary of a space between a projection system and a substrate table, the space having a cross-sectional area smaller than the area of the substrate. The liquid confinement structure includes a first inlet to supply liquid, through which the patterned beam is projected, to the space, a first outlet to remove liquid after the liquid has passed under the projection system, a second inlet formed in a face of the structure, the face arranged to oppose a surface of the substrate, and located radially outward, with respect to an optical axis of the projection system, of the space to supply gas, and a second outlet formed in the face and located radially outward, with respect to an optical axis of the projection system, of the second inlet to remove gas.

Claims

40 · 2 independent · depth 4
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40 granted claims

Classifications

4 codes
IPC · International Patent Classification
Section G — Physics
  • G03B27/52
  • G03B27/42
USPC · US Patent Classification
355/53355/30

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File wrapper

Pendency
4.2 y
1,544 days filing → grant
Office actions
3
non-final + final
Responses
3
5 RCE
Examiner
Hung Henry Nguyen
art unit 2882 · TC 2800
Citations: 351 back · 0 forward

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Priority chain

2 priority documents
Priority
10 Apr 2003
earliest claimed
›Priority documents — 2
TypeDocumentDate
provisionalUS 6046211210 Apr 2003
related publicationUS 20070132974 A114 Jun 2007

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Citations

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