USPatentGranted
B2

Semiconductor device and method of manufacturing the same

Granted 13 May 2008 · 6 office actions

Current assignee: Semiconductor Energy Laboratory Co., Ltd. · originally Semiconductor Energy Laboratory

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Inventors: Hongyong Zhang · Examiner: Thomas L. Dickey · AU 2826 · TC 2800

Life of the patent

3 dated events
⤢ drag to zoom20012002200320042005200620072008Prosecution
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Abstract

In order to obtain a thin-film transistor having high characteristics using a metal element for accelerating the crystallization of silicon, a nickel element is selectively added to the surface of an amorphous silicon film ( 103 ) in regions ( 101 ) and ( 102 ) and regions ( 108 ) to ( 110 ), and a heat treatment is carried out to grow crystals (horizontal growth) in directions parallel to the substrate as indicated by arrows ( 104 ) to ( 107 ). At this point, the regions ( 108 ) to ( 110 ) having a width of 5 μm or less serve as stopper regions so that horizontal growth starting from the regions ( 101 ) and ( 102 ) stops there. In this way, the horizontal growth regions can be formed with high controllability. Then a circuit such as a shift register can be constructed with a region having the same crystal growth form.

Claims

16 · 8 independent · depth 2
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16 granted claims

Classifications

4 codes
IPC · International Patent Classification
Section H — Electricity
  • H01L29/04
USPC · US Patent Classification
438/149117/3257/E27.111

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File wrapper

Pendency
7.2 y
2,619 days filing → grant
Office actions
3
after a restriction
Responses
3
2 RCE
Interviews
1
examiner interview summaries
Examiner
Thomas L. Dickey
art unit 2826 · TC 2800
Citations: 68 back · 0 forward

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Priority chain

1 priority documents
›Priority documents — 1
TypeDocumentDate
related publicationUS 20010022364 A120 Sep 2001

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