Semiconductor device and method of manufacturing the same
Granted 13 May 2008 · 6 office actions
Current assignee: Semiconductor Energy Laboratory Co., Ltd. · originally Semiconductor Energy Laboratory
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Inventors: Hongyong Zhang · Examiner: Thomas L. Dickey · AU 2826 · TC 2800
Life of the patent
3 dated eventsAbstract
In order to obtain a thin-film transistor having high characteristics using a metal element for accelerating the crystallization of silicon, a nickel element is selectively added to the surface of an amorphous silicon film ( 103 ) in regions ( 101 ) and ( 102 ) and regions ( 108 ) to ( 110 ), and a heat treatment is carried out to grow crystals (horizontal growth) in directions parallel to the substrate as indicated by arrows ( 104 ) to ( 107 ). At this point, the regions ( 108 ) to ( 110 ) having a width of 5 μm or less serve as stopper regions so that horizontal growth starting from the regions ( 101 ) and ( 102 ) stops there. In this way, the horizontal growth regions can be formed with high controllability. Then a circuit such as a shift register can be constructed with a region having the same crystal growth form.
Claims
16 · 8 independent · depth 2Classifications
4 codes- H01L29/04
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1 priority documents›Priority documents — 1
| Type | Document | Date |
|---|---|---|
| related publication | US 20010022364 A1 | 20 Sep 2001 |
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