A method for programming non-volatile storage, comprising:nprogramming at least a first non-volatile storage element to reach a first verify level using a series of voltage pulses;detecting when the at least a first non-volatile storage element has reached the first verify level; andenforcing, responsive to the detecting, a maximum allowable number of additional voltage pulses to be used in programming at least a second non-volatile storage element to reach a second verify level.
›2.↳ 1The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is enforced based on a sum of: (a) a number of the voltage p…d2
The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is enforced based on a sum of: (a) a number of the voltage pulses needed for the at least a first non-volatile storage element to reach the first verify level, and (b) the maximum allowable number of additional voltage pulses.
›3.↳ 1The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is variable according to a number of the voltage pulses need…d2
The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is variable according to a number of the voltage pulses needed for the at least a first non-volatile storage element to reach the verify level.
›4.↳ 1The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is fixed.d2
The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is fixed.
›5.↳ 1The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is variable.d2
The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is variable.
›6.↳ 1The method of claim 1, further comprising:ntracking a usage of the at least a first non-volatile storage element over time;wherein the maximum allowab…d2+1
The method of claim 1, further comprising:ntracking a usage of the at least a first non-volatile storage element over time;wherein the maximum allowable number of additional voltage pulses is variable according to the usage.
›7.↳ 6The method of claim 6, wherein:nthe tracking of the usage comprises maintaining a count of programming cycles.d3
The method of claim 6, wherein:nthe tracking of the usage comprises maintaining a count of programming cycles.
›8.↳ 1The method of claim 1, wherein the at least a first non-volatile storage element comprises a plurality of non-volatile storage elements that are progr…d2+1
The method of claim 1, wherein the at least a first non-volatile storage element comprises a plurality of non-volatile storage elements that are programmed to reach the first verify level using the series of voltage pulses, the method further comprising:ndetermining a number of the voltage pulses needed for each of the plurality of non-volatile storage elements to reach the first verify level; andenforcing the maximum allowable number of additional voltage pulses to be used in programming the at least a second non-volatile storage element to reach the second verify level based on the number of the voltage pulses needed for each of the plurality of non-volatile storage elements to reach the first verify level.
›9.↳ 8The method of claim 8, wherein:nthe maximum allowable number of additional voltage pulses for use in programming the at least a second non-volatile st…d3
The method of claim 8, wherein:nthe maximum allowable number of additional voltage pulses for use in programming the at least a second non-volatile storage element to reach the second verify level is enforced based on a statistical metric derived from the number of the voltage pulses needed for each of the plurality of non-volatile storage elements to reach the first verify level.
›10.↳ 1The method of claim 1, wherein:nthe at least a first non-volatile storage element and the at least a second non-volatile storage element are programme…d2
The method of claim 1, wherein:nthe at least a first non-volatile storage element and the at least a second non-volatile storage element are programmed in a common programming cycle.
›11.↳ 1The method of claim 1, wherein:nthe at least a second non-volatile storage element is programmed in a programming cycle which is after a programming c…d2
The method of claim 1, wherein:nthe at least a second non-volatile storage element is programmed in a programming cycle which is after a programming cycle in which the at least a first non-volatile storage element is programmed.
›12.↳ 1The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is based on a threshold voltage distribution of at least the…d2
The method of claim 1, wherein:nthe maximum allowable number of additional voltage pulses is based on a threshold voltage distribution of at least the first non-volatile storage element divided by a step size of the voltage pulses.
›13.↳ 1The method of claim 1, wherein:nthe at least a first non-volatile storage element and the at least a second non-volatile storage element are provided …d2
The method of claim 1, wherein:nthe at least a first non-volatile storage element and the at least a second non-volatile storage element are provided in at least one of a common block and a common segment.
›14.↳ 1The method of claim 1, wherein:nthe at least a first non-volatile storage element and the at least a second non-volatile storage element are programme…d2
The method of claim 1, wherein:nthe at least a first non-volatile storage element and the at least a second non-volatile storage element are programmed with data from a common page.
›15.↳ 1The method of claim 1, wherein:nat least one of the first and second verify levels is an intermediate voltage level which is before a final voltage le…d2
The method of claim 1, wherein:nat least one of the first and second verify levels is an intermediate voltage level which is before a final voltage level.
›16.↳ 1The method of claim 1, wherein:nat least one of the first and second verify levels is a final voltage level.d2
The method of claim 1, wherein:nat least one of the first and second verify levels is a final voltage level.
