USPatentGranted
B1

Semiconductor device having a protective circuit

Granted 26 Feb 2002 · 4 office actions

Current assignee: DTS · originally AT&T Company

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Inventors: Morihisa Hirata · Examiner: Steven Loke

Application
9275037
filed 24 Mar 1999
Publication
Not published
not published
Patent· this page
US 6,351,012
granted 26 Feb 2002

Life of the patent

11 dated events
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Abstract

A semiconductor device includes a protective circuit at an input/output port thereof, wherein the protective circuit includes a plurality of protective MOS transistors. A diffused region is disposed between the n-type source/drain regions and a guard ring formed in a p-well for encircling the source/drain regions of the protective transistors. The diffused region is of lightly doped p-type or of an n-type and increases the resistance of a parasitic bipolar transistor formed in association with the protective transistors. The increase of the resistance assists protective function of the protective device against an ESD failure of the internal circuit of the semiconductor device.

Claims

5 · 1 independent · depth 3
12345
5 granted claims

Classifications

6 codes
IPC · International Patent Classification
Section H — Electricity
  • H01L2/362
USPC · US Patent Classification
257/358257/484257/360257/409257/363

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File wrapper

⤢ drag to zoomJul 1999Jan 2000Jul 2000Jan 2001Jul 2001Jan 2002USPTOApplicantRestriction requirementNon-final rejectionResponse after non-finalResponse after finalRequest for continued examination
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Pendency
2.9 y
1,070 days filing → grant
Office actions
2
after a restriction
Responses
2
1 RCE
Examiner
Steven Loke
art unit —
Citations: 9 back · 2 forward

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Citations

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