Voltage limiting test system and assistant test device

1. Technical Field

The present disclosure relates to test systems, and particularly, to a voltage limiting test system having an assistant test device.

2. Description of Related Art

A voltage limiting test device is used to test a limiting voltage value of a memory of a motherboard. A voltage of the memory is changed by changing the resistance of a resistor in the voltage limiting test device. When the motherboard works, the voltage of the memory is adjusted, once the motherboard stops working, at that time, the voltage of the memory is the limiting voltage of the memory. However, during test, the voltage of the memory is changed by manually adjusting a button on the voltage limiting test device to change the resistance of the resistor, for the voltage of the memory to be adjusted once, the button needs to be triggered once, which is time-consuming and inefficient.

Many aspects of the embodiments can be better understood with reference to the following drawings. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present embodiments. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.

FIG. 1 is a block diagram of an exemplary embodiment of a voltage limiting test system, the voltage limiting test system includes assistant test devices.

FIG. 2 is a circuit diagram of the assistant test device of FIG. 1 .

The disclosure, including the accompanying drawings, is illustrated by way of example and not by way of limitation. It should be noted that references to “an” or “one” embodiment in this disclosure are not necessarily to the same embodiment, and such references mean at least one.

Referring to FIG. 1 , an exemplary embodiment of a voltage limiting test system 100 is used to test limiting voltage values of a memory 2 of a motherboard 1 . The voltage limiting test system 100 includes a voltage limiting test device 200 , a first assistant test device 320 , a second assistant test device 340 , a switch 400 , and a voltage recording tool 500 , such as a pen-shaped meter, connected to the voltage limiting test device 200 . The first and second assistant test devices 320 and 340 are both connected to the voltage limiting test device 200 . The switch 400 is connected to a power terminal 3 of the motherboard 1 and the first and second assistant test devices 320 and 340 , to selectively connect the first or second assistant test device 320 or 340 to the power terminal 3 of the motherboard 1 .

The voltage limiting test device 200 includes a first button 220 and a second button 240 . When the voltage limiting test device 200 tests the memory 2 , the first button 220 is triggered once, and a voltage value of the memory 2 increases a reference voltage value. When the second button 240 is triggered once, the voltage value of the memory 2 decreases the reference voltage value. The voltage recording tool 500 is used to record the voltage value of the memory 2 after triggering the first or second button 220 or 240 . The first assistant test device 320 is connected to the first button 220 . The second assistant test device 340 is connected to the second button 240 .

Referring to FIGS. 1 and 2 , the first assistant test device 320 includes a first relay 20 , a second relay 30 , and a first timer 10 connected between the first and second relays 20 and 30 . The second assistant test device 340 includes a third relay 50 , a fourth relay 60 , and a second timer 40 connected between the third and fourth relays 50 and 60 . The first and second timers 10 and 40 each include a ground pin GND, a triggering pin TR, an output pin OUT, a reset pin RES, a control voltage pin CV, a threshold pin TH, a discharging pin DIS, and a power pin VCC.

The second relay 30 of the first assistant test device 320 is connected to the first button 220 , the fourth relay 60 of the second assistant test device 340 is connected to the second button 240 . The first relay 20 and the third relay 50 are connected to the switch 400 . The first assistant test device 320 is taken as an example to describe how the assistant test devices 320 and 340 works. The ground pin GND of the first timer 10 is grounded. A first resistor R 1 , a second resistor R 2 , and a first capacitor C 1 are connected in series between the power pin VCC and ground. The trigger pin TR and the threshold pin TH are connected to a node between the first capacitor C 1 and the second resistor R 2 . The control voltage pin CV is grounded through a second capacitor C 2 . The discharging pin DIS is connected to a node between the first and second resistors R 1 and R 2 . The reset pin RES is connected to the power pin VCC. The power pin VCC is connected to a control terminal D 1 of the first relay 20 . A first terminal of an inductor L 1 of the first relay 20 is connected to a central processing unit (CPU) 4 of the motherboard 1 to receive a state signal output by the CPU 4 . The state signal denotes the CPU 4 can work normally, or cannot work normally. A second terminal of the inductor L 1 of the first relay 20 is grounded. A first contact A 1 of the first relay 20 is floating. A second contact B 1 of the first relay 20 is connected to the power terminal 3 of the motherboard 1 through the switch 400 . The output pin OUT of the first timer 10 is connected to a first terminal of an inductor L 2 of the second relay 30 . A second terminal of the inductor L 2 is grounded. A first contact A 2 of the second relay 30 is floating. A second contact B 2 of the second relay 30 is connected to a first terminal 2202 of the first button 220 . A control terminal D 2 of the second relay 30 is connected to a second terminal 2204 of the first button 220 . When there is no current passing through the first and second relays 20 and 30 , the control terminal D 1 keeps contacting the first contact A 1 of the first relay 20 . In addition, the control terminal D 2 keeps contacting the first contact A 2 of the second relay 30 .

In the first assistant test device 320 , the second contact B 2 of the second relay 30 is connected to the first terminal 2202 of the first button 220 of the voltage limiting test device 200 . The control terminal D 2 of the second relay 30 is connected to the second terminal 2204 of the first button 220 of the voltage limiting test device 200 . While in the second assistant test device 340 , a second contact of the fourth relay 60 of the second assistant test device 340 is connected to a first terminal of the second button 240 of the voltage limiting test device 200 . A control terminal of the fourth relay 60 of the second assistant test device 340 is connected to a second terminal of the second button 240 of the voltage limiting test device 200 .

The switch 400 is connected between the second contact B 1 of the first relay 20 of the first assistant test device 320 and the second contract of the third relay 50 of the second assistant test device 340 . The switch 400 is also connected to the power terminal 3 of the motherboard 1 to turn-on the switch 400 to selectively connect the first or second assistant test device 320 or 340 to the power terminal 3 of the motherboard 1 .

Test processes of upper and lower limit voltage values are the same, the test processes of the upper limit voltage value is taken as an example to describe.

When the switch 400 is connected to the first assistant test device 320 to connect the first assistant test device 320 to the power terminal 3 , the second assistant test device 340 is not connected to the power terminal 3 . The motherboard 1 works normally. The CPU 4 of the motherboard 1 outputs a high level signal to the first terminal of the inductor L 1 of the first relay 20 . The first relay 20 products a magnet field around the inductor L 1 . The control terminal D 1 of the first relay 20 is disconnected from the first contact A 1 , and is connected to the second contact B 1 of the first relay 20 . The power terminal 3 supplies 5 volt (V) voltage to the power pin VCC of the first timer 10 of the first assistant test device 320 to power the first timer 10 . The output pin OUT of the first timer 10 outputs a pulse signal to the first terminal of the inductor L 2 of the second relay 30 of the first assistant test device 320 , to trigger the second relay 30 once per reference time. The control terminal D 2 of the second relay 30 is connected to the second contact B 2 of the second relay 30 once per reference time. That is, the first button 220 of the voltage limiting test device 200 is triggered once per reference time, a resistance of a resistor of the voltage limiting test device 200 is changed once. The voltage value of the memory 2 of the motherboard 1 increases the reference voltage, when the voltage value of the memory 2 reaches a limit value, the motherboard 1 stops working. The CPU 4 of the motherboard 1 outputs a low level signal to the first terminal of the inductor L 1 of the first relay 20 of the first assistant test device 320 . The second contact B 1 of the first relay 20 is disconnected from the control terminal D 1 of the first relay 20 . The first timer 10 of the first assistant test device 320 stops working. The second relay 30 of the first assistant test device 320 also stops working. The voltage recording tool 500 records the limit voltage. The limit voltage is the upper limit voltage of the memory 2 . The voltage limiting test device 200 changing the resistance of the resistor by the corresponding first and second buttons 220 and 240 to further change the voltage value of the memory 2 , falls within well-known technologies, and is therefore not described here.

When the lower limit voltage value needs to be tested, the switch 400 is connected to the second assistant test device 340 to connect the second assistant test device 340 to the power terminal 3 . The test process of the lower limit voltage value is the same the test process of the upper limit voltage value.

It is to be understood, however, that even though numerous characteristics and advantages of the present disclosure have been set forth in the foregoing description, together with details of the structure and function of the disclosure, the disclosure is illustrative only, and changes may be made in details, especially in matters of shape, size, and arrangement of parts within the principles of the disclosure to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.