X-ray production apparatus for inspection tour
Granted 15 Jun 2010 · 3 office actions
Assignee: Shimadzu Corporation
Law firm: Law firm · Log in to unlock
Attorney: Attorney · Log in to unlock
Inventors: Hiroshi Muraoka, Tadahiko Nakahara, Toshiaki Nakamura, Hiroshi Miyata · Examiner: T. Chase Nelson · AU 2914 · TC 2900
Life of the application
12 dated eventsDescription
1 parts›FIG. 1 is a perspective view of an…
FIG. 1 is a perspective view of an X-ray production apparatus for inspection tour showing the new design;
FIG. 2 is a front view of FIG. 1 ;
FIG. 3 is a rear view of FIG. 1 ;
FIG. 4 is a left side view of FIG. 1 ;
FIG. 5 is a right side view of FIG. 1 ;
FIG. 6 is a top view of FIG. 1 ;
FIG. 7 is a bottom view of FIG. 1 ;
FIG. 8 is another perspective reference view of FIG. 1 showing the new design in use;
FIG. 9 is a perspective view of an X-ray production apparatus for inspection tour showing another embodiment of the new design;
FIG. 10 is a front view of FIG. 9 ;
FIG. 11 is a rear view of FIG. 9 ;
FIG. 12 is a left side view of FIG. 9 ;
FIG. 13 is a right side view of FIG. 9 ;
FIG. 14 is a top view of FIG. 9 ;
FIG. 15 is a bottom view of FIG. 9 ;
FIG. 16 is another perspective reference view of FIG. 9 showing the new design in use; and,
FIG. 17 is a partially enlarged view of FIG. 16 .
The portions of the X-ray production apparatus for inspection tour in broken lines in FIGS. 6 , 7 , 14 and 15 form no part of the claimed design.
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