Electronic component

1. Field of the Invention

The present invention relates to an electronic component.

2. Description of Related Art

Known electronic components include an element body and an external electrode disposed on the element body (for example, refer to Japanese Unexamined Patent Publication No. 2018-157029). The element body includes a principal surface arranged to constitute a mounting surface and an end surface adjacent to the principal surface. The external electrode includes a conductive resin layer disposed to continuously cover a part of the principal surface and a part of the end surface, and a plating layer covering the conductive resin layer.

The conductive resin layer generally contains a resin and electrically-conductive particles. The resin tends to absorb moisture. In a case in which the electronic component is solder-mounted on an electronic device, the moisture absorbed by the resin may be gasified so that volume expansion may occur. In this case, stress may act on the conductive resin layer, and the conductive resin layer may be cracked and be peeled off. The electrically-conductive particles include, for example, metal. The electronic device includes, for example, a circuit board or an electronic component.

An object of an aspect of the present invention is to provide an electronic component that controls peel-off of a conductive resin layer reliably.

An electronic component according to an aspect of the present invention includes an element body and an external electrode disposed on the element body. The element body includes a principal surface arranged to constitute a mounting surface and an end surface adjacent to the principal surface. The external electrode includes a conductive resin layer disposed to continuously cover a part of the principal surface and a part of the end surface, and a plating layer covering the conductive resin layer. The conductive resin layer includes a first region positioned on the end surface and a second region positioned on the principal surface. A maximum thickness of the second region is larger than a maximum thickness of the first region.

As a result of research and study by the present inventors, the present inventors have discovered the following matters.

The plating layer covering the conductive resin layer tends to be in cohesive contact with the conductive resin layer, but tends not to be in cohesive contact with the element body. Therefore, a gap is formed between an end edge of the plating layer and the element body. In a case where the moisture absorbed by the resin is gasified, the gas generated from the moisture reaches the gap between the end edge of the plating layer and the element body, and the gas is emitted outside the external electrode through the gap. Since the gas generated from the moisture is emitted outside the external electrode, stress tends not to act on the conductive resin layer. Hereinafter, the gap between the end edge of the plating layer and the element body is referred to as a “gap” simply.

The second region of the conductive resin layer is close to the gap, and thus the gas generated from the moisture absorbed by the resin of the second region tends to reach the gap. Since the first region is away from the gap, the gas generated from the moisture absorbed by the resin of the first region tends not to reach the gap. Therefore, in order to emit, outside the external electrode, the gas generated from the moisture absorbed by the resin of the first region, it is desired to achieve a configuration in which the gas generated from the moisture absorbed by the resin of the first region reaches the gap reliably. In a case in which the gas generated from the moisture absorbed by the resin of the first region reaches the gap reliably, the gas generated from the moisture absorbed by the resin of the second region also reaches the gap reliably.

The inventors focused on a path through which the gas generated from the moisture absorbed by the resin of the first region reaches the gap. Consequently, the inventors found out that the gas generated from the moisture absorbed by the resin of the first region reaches the gap reliably in a configuration where the maximum thickness of the second region is larger than the maximum thickness of the first region. The gas generated from the moisture absorbed by the resin of the first region tends to move in the second region in the configuration where the maximum thickness of the second region is larger than the maximum thickness of the first region.

Therefore, in the above-described aspect, the gas generated from the moisture absorbed by the resin of the conductive resin layer (the first region) reaches the gap reliably. The gas that has reached the gap is emitted outside the external electrode, so that the stress tends not to act on the conductive resin layer. Consequently, the above-described aspect controls the peel-off of the conductive resin layer reliably.

In the above-described aspect, the conductive resin layer may include a third region positioned on a ridge portion between the end surface and the principal surface. A minimum thickness of the third region may be smaller than the maximum thickness of the first region.

As a result of research and study by the present inventors, the present inventors also have discovered the following matters.

The gap is an outlet of the gas generated from the moisture absorbed by the resin of the conductive resin layer, and is also an inlet of moisture to the external electrode. The path through which the gas generated from the moisture absorbed by the resin of the first region reaches the gap may serve as a path through which the moisture reaches the first region. The moisture that has reached the first region is absorbed in the first region. In this case, the gas generation amount may increase. Therefore, in order to reduce the absorption of the moisture in the first region, it is desired to achieve a configuration in which the moisture tends not to reach the first region.

The inventors found out that the moisture tends not to reach the first region in a configuration where the minimum thickness of the third region is smaller than the maximum thickness of the first region. The moisture tends not to pass through the third region in the configuration where the minimum thickness of the third region is smaller than the maximum thickness of the first region. Therefore, this configuration reduces an increase in moisture absorbed in the conductive resin layer (the first region) and an increase in gas generated from the moisture. Consequently, this configuration controls the peel-off of the conductive resin layer more reliably.

In the aspect described above, the element body may include a side surface that is adjacent to the principal surface and the end surface. The conductive resin layer may be disposed to also cover a part of the side surface continuously, and may include a fourth region positioned on the side surface. A maximum thickness of the fourth region may be smaller than the maximum thickness of the first region.

In a configuration where the maximum thickness of the fourth region is smaller than the maximum thickness of the first region, the gas generated from the moisture absorbed by the resin of the first region tends not to pass through the fourth region. Therefore, the gas generated from the moisture absorbed by the resin of the first region passes through the second region to reach the gap more reliably. Consequently, this configuration controls a position from which the gas is emitted.

Since the fourth region is closer to the gap than to the first region, the fourth region may serve as a path through which the moisture reaches the first region. In contrast, in the configuration where the maximum thickness of the fourth region is smaller than the maximum thickness of the first region, the moisture tends not to pass through the fourth region even in a case in which the moisture enters the fourth region. Therefore, even in a case in which the conductive resin layer includes the fourth region, this configuration reduces an increase in moisture absorbed in the conductive resin layer (the first region) and an increase in gas generated from the moisture. Consequently, this configuration controls the peel-off of the conductive resin layer more reliably.

In the above-described aspect, in a cross-section orthogonal to the principal surface and the end surface, a surface of the second region may curve in a convex shape in a direction away from the principal surface.

In this configuration, since the thickness of the second region tends not to be small locally, a movement path of the gas in the second region tends not to be narrow on the movement path. Therefore, this configuration tends not to suppress the movement of the gas in the second region. The gas generated from the moisture absorbed by the resin of the conductive resin layer reaches the gap more reliably. Consequently, this configuration controls the peel-off of the conductive resin layer more reliably.

In the above-described aspect, when viewed from a direction orthogonal to the principal surface, an end edge of the second region may curve.

In this configuration, the length of the end edge of the second region is larger than that of a configuration in which the end edge of the second region has a linear shape. Therefore, in this configuration, a region from which the gas is emitted is large, and the gas further tends to be emitted from the external electrode. Consequently, the stress further tends not to act on the conductive resin layer.

The present invention will become more fully understood from the detailed description given hereinafter and the accompanying drawings which are given by way of illustration only, and thus are not to be considered as limiting the present invention.

Further scope of applicability of the present invention will become apparent from the detailed description given hereinafter. However, it should be understood that the detailed description and specific examples, while indicating embodiments of the invention, are given by way of illustration only, since various changes and modifications within the spirit and scope of the invention will become apparent to those skilled in the art from this detailed description.

FIG. 1 is a perspective view of a multilayer capacitor according to an embodiment;

FIG. 2 is a side view of the multilayer capacitor according to the embodiment;

FIG. 3 is a view illustrating a cross-sectional configuration of the multilayer capacitor according to the embodiment;

FIG. 4 is a view illustrating a cross-sectional configuration of the multilayer capacitor according to the embodiment;

FIG. 5 is a view illustrating a cross-sectional configuration of the multilayer capacitor according to the embodiment;

FIG. 6 is a plan view illustrating an element body, a first electrode layer, and a second electrode layer;

FIG. 7 is a side view illustrating the element body, the first electrode layer, and the second electrode layer;

FIG. 8 is an end view illustrating the element body, the first electrode layer, and the second electrode layer;

FIG. 9 is a view illustrating a cross-sectional configuration of an external electrode;

FIG. 10 is a view illustrating a cross-sectional configuration of an external electrode.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the following description, the same elements or elements having the same functions are denoted with the same reference numerals and overlapped explanation is omitted.

A configuration of a multilayer capacitor C 1 according to an embodiment will be described with reference to FIGS. 1 to 10 . FIG. 1 is a perspective view of a multilayer capacitor according to the embodiment. FIG. 2 is a side view of the multilayer capacitor according to the embodiment. FIGS. 3 to 5 are views illustrating a cross-sectional configuration of the multilayer capacitor according to the embodiment. FIG. 6 is a plan view illustrating an element body, a first electrode layer, and a second electrode layer. FIG. 7 is a side view illustrating the element body, the first electrode layer, and the second electrode layer. FIG. 8 is an end view illustrating the element body, the first electrode layer, and the second electrode layer. FIGS. 9 and 10 are views illustrating a cross-sectional configuration of an external electrode. In the present embodiment, an electronic component is, for example, the multilayer capacitor C 1 .

As illustrated in FIG. 1 , the multilayer capacitor C 1 includes an element body 3 of a rectangular parallelepiped shape and a plurality of external electrodes 5 . In the present embodiment, the multilayer capacitor C 1 includes a pair of external electrodes 5 . The pair of external electrodes 5 is disposed on the element body 3 . The pair of external electrodes 5 is separated from each other. The rectangular parallelepiped shape includes a rectangular parallelepiped shape in which corners and ridges are chamfered, and a rectangular parallelepiped shape in which the corners and ridges are rounded.

The element body 3 includes a pair of principal surfaces 3 a and 3 b opposing each other, a pair of side surfaces 3 c opposing each other, and a pair of end surfaces 3 e opposing each other. The pair of principal surfaces 3 a and 3 b , the pair of side surfaces 3 c , and the pair of end surfaces 3 e have a rectangular shape. The direction in which the pair of principal surfaces 3 a and 3 b opposes each other is a first direction D 1 . The direction in which the pair of side surfaces 3 c opposes each other is a second direction D 2 . The direction in which the pair of end surfaces 3 e opposes each other is a third direction D 3 . The multilayer capacitor C 1 is solder-mounted on an electronic device. The electronic device includes, for example, a circuit board or an electronic component. The principal surface 3 a of the multilayer capacitor C 1 opposes the electronic device. The principal surface 3 a is arranged to constitute a mounting surface. The principal surface 3 a is the mounting surface.

The first direction D 1 is a direction orthogonal to the respective principal surfaces 3 a and 3 b and is orthogonal to the second direction D 2 . The third direction D 3 is a direction parallel to the respective principal surfaces 3 a and 3 b and the respective side surfaces 3 c , and is orthogonal to the first direction D 1 and the second direction D 2 . The second direction D 2 is a direction orthogonal to the respective side surfaces 3 c . The third direction D 3 is a direction orthogonal to the respective end surfaces 3 e . In the present embodiment, a length of the element body 3 in the third direction D 3 is larger than a length of the element body 3 in the first direction D 1 , and larger than a length of the element body 3 in the second direction D 2 . The third direction D 3 is a longitudinal direction of the element body 3 . The length of the element body 3 in the first direction D 1 and the length of the element body 3 in the second direction D 2 may be equivalent to each other. The length of the element body 3 in the first direction D 1 and the length of the element body 3 in the second direction D 2 may be different from each other.

The length of the element body 3 in the first direction D 1 is a height of the element body 3 . The length of the element body 3 in the second direction D 2 is a width of the element body 3 . The length of the element body 3 in the third direction D 3 is a length of the element body 3 . In the present embodiment, the element body 3 has a height of 0.5 to 2.5 mm, a width of 0.5 to 5.0 mm, and a length of 1.0 to 5.7 mm. The element body 3 has, for example, a height of 2.5 mm, a width of 2.5 mm, and a length of 3.2 mm.

The pair of side surfaces 3 c extends in the first direction D 1 to couple the pair of principal surfaces 3 a and 3 b . The pair of side surfaces 3 c also extends in the third direction D 3 . The pair of end surfaces 3 e extends in the first direction D 1 to couple the pair of principal surfaces 3 a and 3 b . The pair of end surfaces 3 e extends in the second direction D 2 .

The element body 3 includes a pair of ridge portions 3 g , a pair of ridge portions 3 h , four ridge portions 3 i , a pair of ridge portions 3 j , and a pair of ridge portions 3 k . The ridge portion 3 g is positioned between the end surface 3 e and the principal surface 3 a . The ridge portion 3 h is positioned between the end surface 3 e and the principal surface 3 b . The ridge portion 3 i is positioned between the end surface 3 e and the side surface 3 c . The ridge portion 3 j is positioned between the principal surface 3 a and the side surface 3 c . The ridge portion 3 k is positioned between the principal surface 3 b and the side surface 3 c . In the present embodiment, each of the ridge portions 3 g , 3 h , 3 i , 3 j , and 3 k is rounded to curve. The element body 3 is subject to what is called a round chamfering process.

The end surface 3 e and the principal surface 3 a are indirectly adjacent to each other with the ridge portion 3 g between the end surface 3 e and the principal surface 3 a . The end surface 3 e and the principal surface 3 b are indirectly adjacent to each other with the ridge portion 3 h between the end surface 3 e and the principal surface 3 b . The end surface 3 e and the side surface 3 c are indirectly adjacent to each other with the ridge portion 3 i between the end surface 3 e and the side surface 3 c . The principal surface 3 a and the side surface 3 c are indirectly adjacent to each other with the ridge portion 3 j between the principal surface 3 a and the side surface 3 c . The principal surface 3 b and the side surface 3 c are indirectly adjacent to each other with the ridge portion 3 k between the principal surface 3 b and the side surface 3 c.

The element body 3 is configured by laminating a plurality of dielectric layers in the second direction D 2 . The element body 3 includes the plurality of laminated dielectric layers. In the element body 3 , a lamination direction of the plurality of dielectric layers coincides with the second direction D 2 . Each dielectric layer includes, for example, a sintered body of a ceramic green sheet containing a dielectric material. The dielectric material includes, for example, a dielectric ceramic of BaTiO 3 base, Ba(Ti,Zr)O 3 base, or (Ba,Ca)TiO 3 base. In an actual element body 3 , each of the dielectric layers is integrated to such an extent that a boundary between the dielectric layers cannot be visually recognized. In the element body 3 , the lamination direction of the plurality of dielectric layers may coincide with the first direction D 1 .

As illustrated in FIGS. 3 to 5 , the multilayer capacitor C 1 includes a plurality of internal electrodes 7 and a plurality of internal electrodes 9 . Each of the internal electrodes 7 and 9 is an internal conductor disposed in the element body 3 . Each of the internal electrodes 7 and 9 is made of a conductive material that is commonly used as an internal conductor of a multilayer electronic component. The conductive material includes, for example, a base metal. The conductive material includes, for example, Ni or Cu. Each of the internal electrodes 7 and 9 is configured as a sintered body of conductive paste containing the conductive material described above. In the present embodiment, the internal electrodes 7 and 9 are made of Ni.

The internal electrodes 7 and the internal electrodes 9 are disposed in different positions (layers) in the second direction D 2 . The internal electrodes 7 and the internal electrodes 9 are alternately disposed in the element body 3 to oppose each other in the second direction D 2 with an interval therebetween. Polarities of the internal electrodes 7 and the internal electrodes 9 are different from each other. In a case in which the lamination direction of the plurality of dielectric layers is the first direction D 1 , the internal electrodes 7 and the internal electrodes 9 are disposed in different positions (layers) in the first direction D 1 . One end of each of the internal electrodes 7 and 9 is exposed to a corresponding end surface 3 e of the pair of the end surfaces 3 e . Each of the internal electrodes 7 and 9 includes the one end exposed to the corresponding end surface 3 e.

The plurality of internal electrodes 7 and the plurality of internal electrodes 9 are alternately disposed in the second direction D 2 . The internal electrodes 7 and 9 are positioned in a plane approximately parallel to the side surfaces 3 c . The internal electrodes 7 and the internal electrodes 9 oppose each other in the second direction D 2 . The direction (second direction D 2 ) in which the internal electrodes 7 and the internal electrodes 9 oppose each other is orthogonal to the direction (first direction D 1 and third direction D 3 ) parallel to the side surfaces 3 c . In a case in which the lamination direction of the plurality of dielectric layers is the first direction D 1 , the plurality of internal electrodes 7 and the plurality of internal electrodes 9 are alternately disposed in the first direction D 1 . In this case, the internal electrodes 7 and 9 are positioned in a plane approximately parallel to the principal surfaces 3 a and 3 b . The internal electrodes 7 and the internal electrodes 9 oppose each other in the first direction D 1 .

As illustrated in FIG. 1 , the external electrodes 5 are disposed at both end portions of the element body 3 in the third direction D 3 . Each of the external electrodes 5 is disposed on the corresponding end surface 3 e side of the element body 3 . The external electrode 5 is disposed on at least the principal surface 3 a and end surface 3 e adjacent to each other. As illustrated in FIGS. 2 to 5 , the external electrode 5 includes a plurality of electrode portions 5 a , 5 b , 5 c , and 5 e . The electrode portion 5 a is disposed on the principal surface 3 a and the ridge portion 3 g . The electrode portion 5 b is disposed on the ridge portion 3 h . The electrode portion 5 c is disposed on each side surface 3 c and each ridge portion 3 i . The electrode portion 5 e is disposed on the corresponding end surface 3 e . The external electrode 5 also includes electrode portions disposed on the ridge portions 3 j . Each of the external electrodes 5 is disposed on at least the end surface 3 e.

The external electrode 5 is formed on the four surfaces, that is, the principal surface 3 a , the end surface 3 e , and the pair of side surfaces 3 c , as well as on the ridge portions 3 g , 3 h , 3 i , and 3 j . The electrode portions 5 a , 5 b , 5 c , and 5 e adjacent each other are coupled and are electrically connected to each other. Each electrode portion 5 e covers all the one ends of the corresponding internal electrodes 7 or 9 . The electrode portion 5 e is directly connected to the corresponding internal electrodes 7 or 9 . The external electrode 5 is electrically connected to the corresponding internal electrodes 7 or 9 . As illustrated in FIGS. 3 to 5 , the external electrode 5 includes a first electrode layer E 1 , a second electrode layer E 2 , a third electrode layer E 3 , and a fourth electrode layer E 4 . The fourth electrode layer E 4 is arranged to constitute the outermost layer of the external electrode 5 . Each of the electrode portions 5 a , 5 c , and 5 e includes the first electrode layer E 1 , the second electrode layer E 2 , the third electrode layer E 3 , and the fourth electrode layer E 4 . The electrode portion 5 b includes the first electrode layer E 1 , the third electrode layer E 3 , and the fourth electrode layer E 4 .

The first electrode layer E 1 included in the electrode portion 5 a is disposed on the ridge portion 3 g , and is not disposed on the principal surface 3 a . The first electrode layer E 1 included in the electrode portion 5 a is formed to cover the entire ridge portion 3 g . The first electrode layer E 1 is not formed on the principal surface 3 a . The first electrode layer E 1 included in the electrode portion 5 a is in contact with the entire ridge portion 3 g . The principal surface 3 a is not covered with the first electrode layer E 1 , and is exposed from the first electrode layer E 1 . The first electrode layer E 1 included in the electrode portion 5 a may be disposed on the principal surface 3 a . In this case, the first electrode layer E 1 included in the electrode portion 5 a is formed to cover one part of the principal surface 3 a and the entire ridge portion 3 g . That is, the first electrode layer E 1 included in the electrode portion 5 a is also in contact with the one part of the principal surface 3 a . The one part of the principal surface 3 a is, for example, the partial region near the end surface 3 e , in the principal surface 3 a.

The second electrode layer E 2 included in the electrode portion 5 a is disposed on the first electrode layer E 1 and on the principal surface 3 a . In the electrode portion 5 a , the second electrode layer E 2 covers the entire first electrode layer E 1 . In the electrode portion 5 a , the second electrode layer E 2 is in contact with the entire first electrode layer E 1 . The second electrode layer E 2 included in the electrode portion 5 a is in contact with one part of the principal surface 3 a . The one part of the principal surface 3 a is, for example, the partial region near the end surface 3 e , in the principal surface 3 a . That is, the one part of the principal surface 3 a is close to the end surface 3 e . The second electrode layer E 2 included in the electrode portion 5 a includes a region E 2 a positioned on the principal surface 3 a . The electrode portion 5 a is four-layered on the ridge portion 3 g , and is three-layered on the principal surface 3 a . The second electrode layer E 2 included in the electrode portion 5 a is formed to cover the one part of the principal surface 3 a and the entire ridge portion 3 g . As described above, the one part of the principal surface 3 a is, for example, the partial region near the end surface 3 e , in the principal surface 3 a.

The second electrode layer E 2 included in the electrode portion 5 a indirectly covers the entire ridge portion 3 g and the one part of the principal surface 3 a in such a manner that the first electrode layer E 1 is positioned between the second electrode layer E 2 and the element body 3 . The second electrode layer E 2 included in the electrode portion 5 a directly covers the one part of the principal surface 3 a . The second electrode layer E 2 included in the electrode portion 5 a directly covers an entire portion of the first electrode layer E 1 formed on the ridge portion 3 g . In a case in which the first electrode layer E 1 included in the electrode portion 5 a is disposed on the principal surface 3 a , the electrode portion 5 a is four-layered on the principal surface 3 a and the ridge portion 3 g . In a case in which the first electrode layer E 1 included in the electrode portion 5 a is disposed on the principal surface 3 a , the region E 2 a of the second electrode layer E 2 includes a portion being in contact with the principal surface 3 a and a portion being in contact with the first electrode layer E 1 .

The first electrode layer E 1 included in the electrode portion 5 b is disposed on the ridge portion 3 h , and is not disposed on the principal surface 3 b . The first electrode layer E 1 included in the electrode portion 5 b is formed to cover the entire ridge portion 3 h . The first electrode layer E 1 is not formed on the principal surface 3 b . The first electrode layer E 1 included in the electrode portion 5 b is in contact with the entire ridge portion 3 h . The principal surface 3 b is not covered with the first electrode layer E 1 , and is exposed from the first electrode layer E 1 . The first electrode layer E 1 included in the electrode portion 5 b may be disposed on the principal surface 3 b . In this case, the first electrode layer E 1 included in the electrode portion 5 b is formed to cover one part of the principal surface 3 b and the entire ridge portion 3 h . That is, the first electrode layer E 1 included in the electrode portion 5 b is also in contact with the one part of the principal surface 3 b . The one part of the principal surface 3 b is, for example, the partial region near the end surface 3 e , in the principal surface 3 b . The electrode portion 5 b does not include the second electrode layer E 2 . The principal surface 3 b is not covered with the second electrode layer E 2 , and is exposed from the second electrode layer E 2 . The second electrode layer E 2 is not formed on the principal surface 3 b . The electrode portion 5 b is three-layered.

The first electrode layer E 1 included in the electrode portion 5 c is disposed on the ridge portion 3 i , and is not disposed on the side surface 3 c . The first electrode layer E 1 included in the electrode portion 5 c is formed to cover the entire ridge portion 3 i . The first electrode layer E 1 is not formed on the side surface 3 c . The first electrode layer E 1 included in the electrode portion 5 c is in contact with the entire ridge portion 3 i . The side surface 3 c is not covered with the first electrode layer E 1 , and is exposed from the first electrode layer E 1 . The first electrode layer E 1 included in the electrode portion 5 c may be disposed on the side surface 3 c . In this case, the first electrode layer E 1 included in the electrode portion 5 c is formed to cover one part of the side surface 3 c and the entire ridge portion 3 i . That is, the first electrode layer E 1 included in the electrode portion 5 c is also in contact with the one part of the side surface 3 c . The one part of the side surface 3 c is, for example, the partial region near the end surface 3 e , in the side surface 3 c.

The second electrode layer E 2 included in the electrode portion 5 c is disposed on the first electrode layer E 1 and on the side surface 3 c. In the electrode portion 5 c , the second electrode layer E 2 covers one part of the first electrode layer E 1 . In the electrode portion 5 c , the second electrode layer E 2 is in contact with one part of the side surface 3 c and the one part of the first electrode layer E 1 . The second electrode layer E 2 included in the electrode portion 5 c includes a region E 2 c positioned on the side surface 3 c . The second electrode layer E 2 included in the electrode portion 5 c is formed to cover one part of the ridge portion 3 i and the one part of the side surface 3 c . The one part of the ridge portion 3 i is, for example, a partial region near the principal surface 3 a , in the ridge portion 3 i . That is, the one part of the ridge portion 3 i is close to the principal surface 3 a . The one part of the side surface 3 c is, for example, a corner region near the principal surface 3 a and end surface 3 e , in the side surface 3 c . That is, the one part of the side surface 3 c is close to the principal surface 3 a and end surface 3 e . The second electrode layer E 2 included in the electrode portion 5 c indirectly covers the one part of the ridge portion 3 i in such a manner that the first electrode layer E 1 is positioned between the second electrode layer E 2 and the element body 3 . The second electrode layer E 2 included in the electrode portion 5 c indirectly covers the one part of the ridge portion 3 i . The second electrode layer E 2 included in the electrode portion 5 c directly covers the one part of the side surface 3 c . The second electrode layer E 2 included in the electrode portion 5 c directly covers a part of the portion of the first electrode layer E 1 formed on the ridge portion 3 i . In a case in which the first electrode layer E 1 included in the electrode portion 5 c is disposed on the side surface 3 c , the region E 2 c of the second electrode layer E 2 includes a portion being in contact with the side surface 3 c and a portion being in contact with the first electrode layer E 1 .

The electrode portion 5 c includes a plurality of regions 5 c 1 and 5 c 2 . In the present embodiment, the electrode portion 5 c includes only two regions 5 c 1 and 5 c 2 . The region 5 c 2 is positioned closer to the principal surface 3 a than the region 5 c 1 . The region 5 c 1 includes the first electrode layer E 1 , the third electrode layer E 3 , and the fourth electrode layer E 4 . The region 5 c 1 does not include the second electrode layer E 2 . The region 5 c 1 is three-layered. The region 5 c 2 includes the first electrode layer E 1 , the second electrode layer E 2 , the third electrode layer E 3 , and the fourth electrode layer E 4 . The regions 5 c 2 is four-layered on the ridge portion 3 i , and is three-layered on the side surface 3 c . The region 5 c 1 is the region where the first electrode layer E 1 is exposed from the second electrode layer E 2 . The region 5 c 2 is the region where the first electrode layer E 1 is covered with the second electrode layer E 2 . The region 5 c 2 includes the region E 2 c.

The first electrode layer E 1 included in the electrode portion 5 e is disposed on the end surface 3 e . The end surface 3 e is entirely covered with the first electrode layer E 1 . The first electrode layer E 1 included in the electrode portion 5 e is in contact with the entire end surface 3 e . The second electrode layer E 2 included in the electrode portion 5 e is disposed on the first electrode layer E 1 . In the electrode portion 5 e , one part of the first electrode layer E 1 is covered with the second electrode layer E 2 . In the electrode portion 5 e , the second electrode layer E 2 is in contact with the one part of the first electrode layer E 1 . The second electrode layer E 2 included in the electrode portion 5 e includes a region E 2 e positioned on the end surface 3 e . The second electrode layer E 2 included in the electrode portion 5 e is formed to cover one part of the end surface 3 e . The one part of the end surface 3 e is, for example, a partial region near the principal surface 3 a , in the end surface 3 e . That is, the one part of the end surface 3 e is close to the principal surface 3 a . The second electrode layer E 2 included in the electrode portion 5 e indirectly covers the one part of the side surface 3 e in such a manner that the first electrode layer E 1 is positioned between the second electrode layer E 2 and the element body 3 . The second electrode layer E 2 included in the electrode portion 5 e directly covers a part of the portion of the first electrode layer E 1 formed on the end surface 3 e . In the electrode portion 5 e , the first electrode layer E 1 is formed on the end surface 3 e to be coupled to the one ends of the corresponding internal electrodes 7 or 9 .

The electrode portion 5 e includes a plurality of regions 5 e 1 and 5 e 2 . In the present embodiment, the electrode portion 5 e includes only two regions 5 e 1 and 5 e 2 . The region 5 e 2 is positioned closer to the principal surface 3 a than the region 5 e 1 . The region 5 e 1 includes the first electrode layer E 1 , the third electrode layer E 3 , and the fourth electrode layer E 4 . The region 5 e 1 does not include the second electrode layer E 2 . The region 5 e 1 is three-layered. The region 5 e 2 includes the first electrode layer E 1 , the second electrode layer E 2 , the third electrode layer E 3 , and the fourth electrode layer E 4 . The third electrode layer E 3 and fourth electrode later E 4 included in the electrode portion 5 e are formed to cover the entire end surface 3 e when viewed from the third direction D 3 . In the present embodiment, the third electrode layer E 3 and fourth electrode later E 4 indirectly cover the entire end surface 3 e . The regions 5 e 2 is four-layered. The region 5 e 1 is the region where the first electrode layer E 1 is exposed from the second electrode layer E 2 . The region 5 e 2 is the region where the first electrode layer E 1 is covered with the second electrode layer E 2 . The region 5 e 2 includes the region E 2 e.

The first electrode layer E 1 is formed by sintering conductive paste applied onto a surface of the element body 3 . The first electrode layer E 1 is formed to cover the end surface 3 e and the ridge portions 3 g , 3 h , and 3 i . The first electrode layer E 1 is formed by sintering a metal component (metal powder) contained in the conductive paste. The first electrode layer E 1 includes a sintered metal layer. The first electrode layer E 1 includes a sintered metal layer formed on the element body 3 . The first electrode layer E 1 is not intentionally formed on the pair of principal surfaces 3 a and 3 b and the pair of side surfaces 3 c . The first electrode layer E 1 may be unintentionally formed on the principal surfaces 3 a and 3 b and the side surfaces 3 c due to a production error, for example. In the present embodiment, the first electrode layer E 1 is a sintered metal layer made of Cu. The first electrode layer E 1 may be a sintered metal layer made of Ni. The first electrode layer E 1 contains a base metal. The conductive paste contains, for example, powder made of Cu or Ni, a glass component, an organic binder, and an organic solvent. The first electrode layer E 1 included in the electrode portion 5 a , the first electrode layer E 1 included in the electrode portion 5 b , the first electrode layer E 1 included in the electrode portion 5 c , and the first electrode layer E 1 included in the electrode portion 5 e are integrally formed.

The second electrode layer E 2 is formed by curing conductive resin paste applied onto the first electrode layer E 1 , the principal surface 3 a , and the pair of side surfaces 3 c . The second electrode layer E 2 is formed over the first electrode layer E 1 and the element body 3 . The first electrode layer E 1 is an underlying metal layer for forming the second electrode layer E 2 . The second electrode layer E 2 is a conductive resin layer covering the first electrode layer E 1 . The second electrode layer E 2 includes a conductive resin layer. The conductive resin paste contains, for example, a resin, a conductive material, and an organic solvent. The resin is, for example, a thermosetting resin. The conductive material includes, for example, metal powder. The metal powder includes, for example, Ag powder or Cu powder. The thermosetting resin includes, for example, a phenolic resin, an acrylic resin, a silicone resin, an epoxy resin, or a polyimide resin.

In the present embodiment, the second electrode layer E 2 covers a partial region of the first electrode layer E 1 . The partial region of the first electrode layer E 1 includes, for example, the regions corresponding to the electrode portion 5 a , the region 5 c 2 of the electrode portion 5 c , and the region 5 e 2 of the electrode portion 5 e , in the first electrode layer E 1 . The second electrode layer E 2 directly covers a partial region of the ridge portion 3 j . The partial region of the ridge portion 3 j is, for example, the partial region near the end surface 3 e , in the ridge portion 3 j . That is, the partial region of the ridge portion 3 j is close to the end surface 3 e . The second electrode layer E 2 is in contact with the partial region of the ridge portion 3 j . The second electrode layer E 2 included in the electrode portion 5 a , the second electrode layer E 2 included in the electrode portion 5 b , the second electrode layer E 2 included in the electrode portion 5 c , and the second electrode layer E 2 included in the electrode portion 5 e are integrally formed.

The third electrode layer E 3 is formed on the second electrode layer E 2 by plating method. In the present embodiment, the third electrode layer E 3 is formed on the second electrode layer E 2 by Ni plating. The third electrode layer E 3 is a Ni plating layer. The third electrode layer E 3 may be an Sn plating layer, a Cu plating layer, or an Au plating layer. The third electrode layer E 3 contains Ni, Sn, Cu, or Au. The Ni plating layer has better solder leach resistance than the metal contained in the second electrode layer E 2 .

The fourth electrode layer E 4 is formed on the third electrode layer E 3 by plating method. The fourth electrode layer E 4 includes a solder plating layer. In the present embodiment, the fourth electrode layer E 4 is formed on the third electrode layer E 3 by Sn plating. The fourth electrode layer E 4 is an Sn plating layer. The fourth electrode layer E 4 may be an Sn—Ag alloy plating layer, an Sn—Bi alloy plating layer, or an Sn—Cu alloy plating layer. The fourth electrode layer E 4 contains Sn, Sn—Ag alloy, Sn—Bi alloy, or Sn—Cu alloy.

The third electrode layer E 3 and the fourth electrode layer E 4 constitute a plating layer PL formed on the second electrode layer E 2 . In the present embodiment, the plating layer PL formed on the second electrode layer E 2 is two-layered. The third electrode layer E 3 is an intermediate plating layer positioned between the fourth electrode layer E 4 arranged to constitute the outermost layer and the second electrode layer E 2 . The third electrode layer E 3 included in the electrode portion 5 a , the third electrode layer E 3 included in the electrode portion 5 b , the third electrode layer E 3 included in the electrode portion 5 c , and the third electrode layer E 3 included in the electrode portion 5 e are integrally formed. The fourth electrode layer E 4 included in the electrode portion 5 a , the fourth electrode layer E 4 included in the electrode portion 5 b , the fourth electrode layer E 4 included in the electrode portion 5 c , and the fourth electrode layer E 4 included in the electrode portion 5 e are integrally formed.

The first electrode layer E 1 (first electrode layer E 1 included in the electrode portion 5 e ) is formed on the end surface 3 e to be connected to the corresponding internal electrodes 7 or 9 . The first electrode layer E 1 covers the entire end surface 3 e , the entire ridge portion 3 g , the entire ridge portion 3 h , and the entire ridge portion 3 i . The second electrode layer E 2 (second electrode layers E 2 included in the electrode portions 5 a , 5 c , and 5 e ) continuously covers one part of the principal surface 3 a , one part of the end surface 3 e , and one part of each of the pair of side surfaces 3 c . The second electrode layer E 2 (second electrode layers E 2 included in the electrode portions 5 a , 5 c , and 5 e ) covers the entire ridge portion 3 g , one part of the ridge portion 3 i , and one part of the ridge portion 3 j . The second electrode layer E 2 includes a plurality of portions each corresponding to the one part of the principal surface 3 a , the one part of the end surface 3 e , the one part of each of the pair of side surfaces 3 c , the entire ridge portion 3 g , the one part of the ridge portion 3 i , and the one part of the ridge portion 3 j . The first electrode layer E 1 (first electrode layer E 1 included in the electrode portion 5 e ) is directly connected to the corresponding internal electrodes 7 or 9 .

The first electrode layer E 1 (first electrode layers E 1 included in the electrode portions 5 a , 5 b , 5 c , and 5 e ) includes a region covered with the second electrode layer E 2 (second electrode layers E 2 included in the electrode portions 5 a , 5 c , and 5 e ), and a region not covered with the second electrode layer E 2 (second electrode layers E 2 included in the electrode portions 5 a , 5 c , and 5 e ). The region not covered with the second electrode layer E 2 is a region exposed from the second electrode layer E 2 . The third electrode layer E 3 and the fourth electrode layer E 4 cover the region not covered with the second electrode layer E 2 in the first electrode layer E 1 , and the second electrode layer E 2 .

As illustrated in FIG. 6 , when viewed from the first direction D 1 , the first electrode layer E 1 (first electrode layer E 1 included in the electrode portion 5 a ) is entirely covered with the second electrode layer E 2 . When viewed from the first direction D 1 , the first electrode layer E 1 (first electrode layer E 1 included in the electrode portion 5 a ) is not exposed from the second electrode layer E 2 .

As illustrated in FIG. 7 , when viewed from the second direction D 2 , a first end region near the principal surface 3 a of the first electrode layer E 1 is covered with the second electrode layer E 2 . The first end region of the first electrode layer E 1 includes the first electrode layer E 1 included in the region 5 c 2 . The first end region of the first electrode layer E 1 is close to the principal surface 3 a . When viewed from the second direction D 2 , an end edge Ee 2 of the second electrode layer E 2 crosses an end edge Ee 1 of the first electrode layer E 1 . When viewed from the second direction D 2 , a second end region near the principal surface 3 b of the first electrode layer E 1 is exposed from the second electrode layer E 2 . The second end region of the first electrode layer E 1 includes the first electrode layer E 1 included in the region 5 c 1 . The second end region of the first electrode layer E 1 is close to the principal surface 3 b.

As illustrated in FIG. 8 , when viewed from the third direction D 3 , a third end region near the principal surface 3 a of the first electrode layer E 1 is covered with the second electrode layer E 2 . The third end region of the first electrode layer E 1 includes the first electrode layer E 1 included in the region 5 e 2 . The third end region of the first electrode layer E 1 is close to the principal surface 3 a . When viewed from the third direction D 3 , the end edge Ee 2 of the second electrode layer E 2 is positioned on the first electrode layer E 1 . When viewed from the third direction D 3 , a fourth end region near the principal surface 3 b of the first electrode layer E 1 is exposed from the second electrode layer E 2 . The fourth end region of the first electrode layer E 1 includes the first electrode layer E 1 included in the region 5 e 1 . The fourth end region of the first electrode layer E 1 is close to the principal surface 3 b.

In the multilayer capacitor C 1 , the second electrode layer E 2 continuously covers only the one part of the principal surface 3 a , only the one part of the end surface 3 e , and only the one part of each of the pair of side surfaces 3 c . The second electrode layer E 2 covers the entire ridge portion 3 g , only the one part of the ridge portion 3 i , and only the one part of the ridge portion 3 j . The portion of the first electrode layer E 1 covering the ridge portion 3 i is partially exposed from the second electrode layer E 2 . For example, the first electrode layer E 1 included in the region 5 c 1 is exposed from the second electrode layer E 2 .

As illustrated in FIG. 9 , the second electrode layer E 2 is disposed to continuously cover a part of the principal surface 3 a and a part of the end surface 3 e . The second electrode layer E 2 includes the region E 2 e positioned on the end surface 3 e , the region E 2 a positioned on the principal surface 3 a , and a region E 2 g positioned on the ridge portion 3 g . The region E 2 e is the second electrode layer E 2 included in the region 5 e 2 of the electrode portion 5 e . The region E 2 a and the region E 2 g are the second electrode layer E 2 included in the electrode portion 5 a . A maximum thickness T 2a of the region E 2 a is larger than a maximum thickness T 2e of the region E 2 e . A minimum thickness T 2g of the region E 2 g is smaller than the maximum thickness T 2e . In a case where the region E 2 e constitutes the first region, for example, the region E 2 a constitutes the second region and the region E 2 g constitutes the third region.

The maximum thickness T 2a , the maximum thickness T 2e , and the minimum thickness T 2g can be determined, for example, in the following manner.

A cross-sectional photograph of the multilayer capacitor C 1 including the second electrode layer E 2 of the electrode portions 5 a and 5 e is obtained. The cross-sectional photograph is obtained, for example, by capturing a cross-section of the multilayer capacitor C 1 taken along a plane that is parallel to the pair of side surfaces 3 c and is equidistant from the pair of side surfaces 3 c . Each of the thicknesses T 2a , T 2e , and T 2g of the second electrode layer E 2 on the obtained cross-sectional photograph is calculated. The maximum thickness T 2e is a maximum value of the thickness of the region E 2 e in the third direction D 3 . The maximum thickness T 2a is a maximum value of the thickness of the region E 2 a in the first direction D 1 . The minimum thickness T 2g is a minimum value of the thickness of the region E 2 g . The thickness of the region E 2 g is, for example, a thickness of the ridge portion 3 g in the normal direction.

In the present embodiment, the maximum thickness T 2a falls within a range of 10 to 200 μm, the maximum thickness T 2e falls within a range of 5 to 150 μm, and the minimum thickness T 2g falls within a range of 5 to 100 μm. For example, the maximum thickness T 2a is 86 μm, the maximum thickness T 2e is 80 μm, and the minimum thickness T 2g is 32 μm.

As illustrated in FIG. 9 , in a cross-section orthogonal to the principal surface 3 a and the end surface 3 e , a surface of the region E 2 a curves in a convex shape in a direction away from the principal surface 3 a . The thickness of the region E 2 a is gradually reduced from a position of the maximum thickness of the region E 2 a toward an end edge of the region E 2 a . In the present embodiment, the surface of the region E 2 a curves due to the change in thickness of the region E 2 a.

As illustrated in FIG. 6 , when viewed from the first direction D 1 , the end edge Ee 2 of the region E 2 a (the second electrode layer E 2 ) curves. In the present embodiment, when viewed from the first direction D 1 , a length of the region E 2 a in the third direction D 3 is larger at the center of the region E 2 a in the second direction D 2 than in an end of the region E 2 a in the second direction D 2 . The length of the region E 2 a in the third direction D 3 is largest at the center of the region E 2 a in the second direction D 2 , and is gradually reduced toward the end of the region E 2 a in the second direction D 2 .

As illustrated in FIG. 10 , the second electrode layer E 2 is disposed to also cover a part of the side surface 3 c continuously. The second electrode layer E 2 is disposed to continuously cover the part of the principal surface 3 a , the part of the end surface 3 e , and the part of the side surface 3 c . The second electrode layer E 2 is disposed to continuously cover only the part of each of the principal surface 3 a , the end surface 3 e , and the side surface 3 c , as described above. The second electrode layer E 2 covers the entire ridge portion 3 g , a part of the ridge portion 3 j , and a part of the ridge portion 3 i . The second electrode layer E 2 includes a region E 2 c positioned on the side surface 3 c and a region E 2 i positioned on the ridge portion 3 i . The region E 2 c and the region E 2 i correspond to the second electrode layer E 2 included in the region 5 c 2 . A maximum thickness T 2c , of the region E 2 c is smaller than the maximum thickness T 2e . A minimum thickness T 2i of the region E 2 i is smaller than the maximum thickness T 2e . The maximum thickness T 2c and the minimum thickness T 2i may be approximately equal to each other. For example, the region E 2 c constitutes a fourth region.

The maximum thickness T 2c and the minimum thickness T 2i can be determined, for example, in the following manner.

A cross-sectional photograph of the multilayer capacitor C 1 including the second electrode layer E 2 of the electrode portion 5 c is obtained. The cross-sectional photograph is obtained, for example, by capturing a cross-section of the multilayer capacitor C 1 taken along a plane that is parallel to the pair of principal surfaces 3 a and passes through the electrode portion 5 c . The plane passes through a boundary between the side surface 3 c and the ridge portion 3 j , for example. Each of the thicknesses T 2c and T 2i of the second electrode layer E 2 on the obtained cross-sectional photograph is calculated. The maximum thickness T 2c is a maximum value of the thickness of the region E 2 c in the second direction D 2 . The minimum thickness T 2i is a minimum value of the thickness of the region E 2 i . The thickness of the region E 2 i is, for example, a thickness of the ridge portion 3 i in the normal direction.

In the present embodiment, the maximum thickness T 2c falls within a range of 10 to 70 μm, and the minimum thickness T 2i falls within a range of 5 to 40 μm. For example, the maximum thickness T 2c is 40 μm, and the minimum thickness T 2i is 20 μm.

The plating layer PL includes the third electrode layer E 3 and the fourth electrode layer E 4 as described above. The plating layer PL includes a portion PL 1 positioned on the region E 2 a , a portion PL 2 positioned on the region E 2 e , and a portion PL 3 positioned on the region E 2 c . The portion PL 1 includes an end edge PL 1 e . The portion PL 3 includes an end edge PL 3 e . The plating layer PL (the third electrode layer E 3 and the fourth electrode layer E 4 ) is away from the element body 3 . As illustrated in FIG. 9 , a gap 17 is formed between the end edge PL 1 e and the element body 3 (the principal surface 3 a ). As illustrated in FIG. 10 , a gap 19 is formed between the end edge PL 3 e and the element body 3 (the side surface 3 c ). The widths of the gaps 17 and 19 are, for example, larger than 0 (zero) and equal to or smaller than 3 μm. The widths of the gaps 17 and 19 may be the same as each other. The widths of the gaps 17 and 19 may be different from each other. In the present embodiment, the portion PL 2 includes no end edge because the entirety of the end surface 3 e is covered with the external electrode 5 . The first electrode layer E 1 and the second electrode layer E 2 are positioned between the portion PL 2 and the element body 3 . Therefore, no gap is formed between the portion PL 2 and the element body 3 .

The portion PL 1 of the plating layer PL tends to be cohesive contact with the region E 2 a of the second electrode layer E 2 , but tends not to be cohesive contact with the principal surface 3 a . Therefore, the gap 17 is formed between the end edge PL 1 e of the portion PL 1 and the principal surface 3 a . Even in a case where the moisture absorbed by the resin is gasified, the gas generated from the moisture reaches the gap 17 , and the gas is emitted outside the external electrode 5 through the gap 17 . Since the gas generated from the moisture is emitted outside the external electrode 5 , stress tends not to act on the second electrode layer E 2 .

Since the region E 2 a is close to the gap 17 , the gas generated from the moisture absorbed by the resin of the region E 2 a tends to reach the gap 17 . However, the gas generated from the moisture absorbed by the resin of the region E 2 e tends not to reach the gap 17 since the region E 2 e is away from the gap 17 .

In a configuration where the maximum thickness T 2a of the region E 2 a is larger than the maximum thickness T 2e of the region E 2 e , the gas generated from the moisture absorbed by the resin of the region E 2 e reaches the gap 17 reliably. In the configuration where the maximum thickness T 2a is larger than the maximum thickness T 2e , the gas generated from the moisture absorbed by the resin of the region E 2 e tends to move in the region E 2 a.

Since the maximum thickness T 2a is larger than the maximum thickness T 2e in the multilayer capacitor C 1 , the gas generated from the moisture absorbed by the resin of the region E 2 e reaches the gap 17 reliably. In a case in which the gas generated from the moisture absorbed by the resin of the region E 2 e reaches the gap 17 reliably, the gas generated from the moisture absorbed by the resin of the region E 2 a also reaches the gap 17 reliably. The gas that has reached the gap 17 is emitted outside the external electrode 5 , so that the stress tends not to act on the second electrode layer E 2 . Consequently, the multilayer capacitor C 1 controls peel-off of the second electrode layer E 2 reliably.

In the multilayer capacitor C 1 , the minimum thickness T 2g of the region E 2 g is smaller than the maximum thickness T 2e .

The gap 17 is an outlet of the gas generated from the moisture absorbed by the resin of the region E 2 e , and is also an inlet for the moisture to the external electrode 5 . The path through which the gas generated from the moisture absorbed by the resin of the region E 2 e reaches the gap 17 may serve as a path through which the moisture reaches the region E 2 e . The moisture that has reached the region E 2 e is absorbed in the region E 2 e . In this case, the gas generation amount may increase.

In a configuration where the minimum thickness T 2g of the region E 2 g is smaller than the maximum thickness T 2e , the moisture tends not to reach the region E 2 e . In the configuration where the minimum thickness T 2g is smaller than the maximum thickness T 2e , the moisture tends not to pass through the region E 2 g . Therefore, the multilayer capacitor C 1 reduces an increase in moisture absorbed in the region E 2 e and an increase in gas generated from the moisture. Consequently, the multilayer capacitor C 1 controls the peel-off of the second electrode layer E 2 more reliably.

In the multilayer capacitor C 1 , the maximum thickness T 2c of the region E 2 c is smaller than the maximum thickness T 2e .

In a configuration where the maximum thickness T 2c of the region E 2 c is smaller than the maximum thickness T 2e , the gas generated from the moisture absorbed by the resin of the region E 2 e tends not to pass through the region E 2 c . Therefore, the gas generated from the moisture absorbed by the resin of the region E 2 e reaches the gap 17 through the region E 2 a more reliably. Consequently, the multilayer capacitor C 1 controls a position from which the gas is emitted.

Since the region E 2 c is closer to the gap 19 than to the region E 2 e , the region E 2 c may serve as a path through which the moisture reaches the region E 2 e . In the configuration where the maximum thickness T 2c is smaller than the maximum thickness T 2e , even in a case in which the moisture enters the region E 2 c , the moisture tends not to pass through the region E 2 c . Therefore, the multilayer capacitor C 1 reduces the increase in moisture absorbed in the region E 2 e and the increase in gas generated from the moisture even in a case in which the second electrode layer E 2 includes the region E 2 c . Consequently, the multilayer capacitor C 1 controls the peel-off of the second electrode layer E 2 more reliably.

In the multilayer capacitor C 1 , in the cross-section orthogonal to the principal surface 3 a and the end surface 3 e , the surface of the region E 2 a curves in the convex shape in the direction away from the principal surface 3 a.

In the configuration where the surface of the region E 2 a curves in the convex shape in the direction away from the principal surface 3 a , since the thickness of the region E 2 a tends not to be small locally, a movement path of the gas in the region E 2 a tends not to be narrow on the movement path. Therefore, the multilayer capacitor C 1 tends not to suppress the movement of the gas in the region E 2 a . The gas generated from the moisture absorbed by the resin of the second electrode layer E 2 reaches the gap 17 more reliably. Consequently, the multilayer capacitor C 1 controls the peel-off of the second electrode layer E 2 more reliably.

In the multilayer capacitor C 1 , when viewed from the first direction D 1 , the end edge Ee 2 of the region E 2 a curves.

In the configuration where the end edge Ee 2 of the region E 2 a curves, the length of the end edge Ee 2 of the region E 2 a is larger than that of a configuration where the end edge Ee 2 of the region E 2 a has a linear shape. Therefore, in the multilayer capacitor C 1 , a region from which the gas is emitted is large, and the gas further tends to be emitted from the external electrode 5 . Consequently, the stress further tends not to act on the second electrode layer E 2 .

In the present specification, in a case in which an element is described as being disposed on another element, the element may be directly disposed on the other element or be indirectly disposed on the other element. In a case in which an element is indirectly disposed on another element, an intervening element is present between the element and the other element. In a case in which an element is directly disposed on another element, no intervening element is present between the element and the other element.

In the present specification, in a case in which an element is described as being positioned on another element, the element may be directly positioned on the other element or be indirectly positioned on the other element. In a case in which an element is indirectly positioned on another element, an intervening element is present between the element and the other element. In a case in which an element is directly positioned on another element, no intervening element is present between the element and the other element.

In the present specification, in a case in which an element is described as covering another element, the element may directly cover the other element or indirectly cover the other element. In a case in which an element indirectly covers another element, an intervening element is present between the element and the other element. In a case in which an element directly covers another element, no intervening element is present between the element and the other element.

Although the embodiment of the present invention have been described above, the present invention is not necessarily limited to the embodiment, and the embodiment can be variously changed without departing from the scope of the invention.

The minimum thickness T 2g may be equal to or larger than the maximum thickness T 2e . In a case where the minimum thickness T 2g is smaller than the maximum thickness T 2e , the multilayer capacitor C 1 controls the peel-off of the second electrode layer E 2 more reliably as described above.

The maximum thickness T 2c may be equal to or larger than the maximum thickness T 2e . In a case where the maximum thickness T 2c is smaller than the maximum thickness T 2e , the multilayer capacitor C 1 controls the position from which the gas is emitted, and controls the peel-off of the second electrode layer E 2 more reliably as described above.

In a cross-section orthogonal to the principal surface 3 a and the end surface 3 e , the surface of the region E 2 a may not curve in a convex shape in a direction away from the principal surface 3 a . In a case where, in the cross-section orthogonal to the principal surface 3 a and the end surface 3 e , the surface of the region E 2 a curves in a convex shape in a direction away from the principal surface 3 a , the multilayer capacitor C 1 controls the peel-off of the second electrode layer E 2 more reliably as described above.

When viewed from the first direction D 1 , the end edge Ee 2 of the region E 2 a may not curve. In a case where, when viewed from the first direction D 1 , the end edge Ee 2 of the region E 2 a curves, the stress further tends not to act on the second electrode layer E 2 as described above.

The first electrode layer E 1 may be formed on the principal surface 3 a to extend from the end surface 3 e beyond the entire ridge portion 3 g or a part of the ridge portion 3 g . The first electrode layer E 1 may be formed on the principal surface 3 b to extend from the end surface 3 e beyond the entire ridge portion 3 h or a part of the ridge portion 3 h . The first electrode layer E 1 may be formed on the side surface 3 c to extend from the end surface 3 e beyond the entire ridge portion 3 i or a part of the ridge portion 3 i.

The electronic component of the present embodiment is the multilayer capacitor. Applicable electronic component is not limited to the multilayer capacitor. Examples of the applicable electronic components include, but not limited to, multilayer electronic components such as a multilayer inductor, a multilayer varistor, a multilayer piezoelectric actuator, a multilayer thermistor, or a multilayer composite component, and electronic components other than the multilayer electronic components.