USPatent applicationPatented

Overdrive Voltage Generator

Granted 8 Jan 2019 · no office action yet

Assignee: Winbond Electronics Corp.

Law firm: Law firm · Log in to unlock

Attorney: Attorney · Log in to unlock

Inventors: Chih-Feng Lin · Examiner: Dinh T Le · AU 2842 · TC 2800

Application· this page
16/040,557
filed 20 Jul 2018
Publication
Not published
not published
Patent
US 10,177,746
granted 8 Jan 2019

Life of the application

7 dated events
⤢ drag to zoom20182020202220242026202820302032203420362038ProsecutionOwnershipTerm & fees
ProsecutionOwnershipTerm & feeshover for detail · click to open

Abstract

An overdrive voltage generator includes a first switching circuit, a boosting circuit, a second switching circuit, and a comparison circuit. The first switching circuit is coupled between a first power supply and an output terminal and configured to be controlled by a switching signal to provide an overdrive voltage to the output terminal. The boosting circuit is coupled between a second power supply and a node and configured to boost a voltage of the second power supply to provide a pump voltage to the node. The second switching circuit is coupled between the node and the output terminal and configured to be controlled by the switching signal to provide the overdrive voltage to the output terminal. The comparison circuit is coupled to the first and second switching circuits as well as the output terminal and configured to compare the overdrive voltage with a first reference voltage to generate the switching signal.

Description

8 parts
›TECHNICAL FIELD

The disclosure relates to a voltage generator; more particularly, the disclosure relates to an overdrive voltage generator.

›DESCRIPTION OF RELATED ART

In general, to improve the sensing speed of a sensing amplifier (SA) of a dynamic random access memory (DRAM), an overdrive technology is often applied to a bit line highest-level voltage of the SA. Specifically, please refer to FIG. 1 , which is a schematic view of power supply of a SA of a known DRAM. As shown in FIG. 1 , a voltage regulator 630 may generate a bit line highest-level voltage VBLH according to a power of a second power supply VDD 2 and provide the bit line highest-level voltage VBLH to a SA circuit 660 through a switch 650 , so that the SA circuit 660 may sense signals of bit line pairs BL and/BL. Besides, during the initial operation time period of the SA circuit 660 , a voltage regulator 610 and a voltage pump circuit 620 jointly provide an overdrive voltage VOD through the switch 640 to the SA circuit 660 , so as to increase the sensing speed of the SA circuit 660 . Here, the voltage regulator 610 generates the overdrive voltage VOD according to a power of a first power supply VDD 1 , and the voltage pump circuit 620 generates the overdrive voltage VOD according to the power of the second power supply VDD 2 .

Owing to the differences in the driving capabilities and the response speed of the voltage regulator 610 and the voltage pump circuit 620 , the current output by the first power supply VDD 1 and the current output by the second power supply VDD 2 cannot be accurately controlled. Thereby, in case of different voltage drops of the overdrive voltage VOD, the power supply ratios between the first power supply VDD 1 and the second power supply VDD 2 are different. In addition, since the response speed of the voltage pump circuit 620 is slower than that of the voltage regulator 610 , once the overdrive voltage VOD decreases because of the excessive transient load of the overdrive voltage VOD, the voltage pump circuit 620 may not be able to respond instantaneously. As a result, the voltage level of the overdrive voltage VOD cannot be quickly recovered.

To prevent the voltage level of the overdrive voltage VOD from late recovery due to the excessive transient load of the overdrive voltage VOD, an overdrive voltage generator may be provided exclusively for each bank of the DRAM. Said design, however, may limit the floor plan of each bank and the location of a decoupling capacitor.

›SUMMARY

The disclosure provides an overdrive voltage generator that is able to control the power supply ratio between the first power supply and the second power supply and is characterized by quick response speed and a pre-pumping function.

In an embodiment, an overdrive voltage generator including a first switching circuit, a boosting circuit, a second switching circuit, and a comparison circuit is provided. The first switching circuit is coupled between a first power supply and an output terminal, and is configured to be controlled by a switching signal to provide an overdrive voltage to the output terminal. The boosting circuit is coupled between a second power supply and a node, and is configured to boost a voltage of the second power supply to provide a pump voltage to the node. The second switching circuit is coupled between the node and the output terminal, and is configured to be controlled by the switching signal to provide the overdrive voltage to the output terminal. The comparison circuit is coupled to the first switching circuit, the second switching circuit, and the output terminal, and is configured to compare the overdrive voltage with a first reference voltage to generate the switching signal.

According to an embodiment, the boosting circuit is further coupled to the comparison circuit to receive the switching signal and is controlled by the switching signal to boost the voltage of the second power supply and provide the pump voltage to the node.

In view of the above, the overdrive voltage generator provided in one or more embodiments may be deemed as a digital voltage regulator characterized by fast response speed and thus may be applied to provide the overdrive voltage required by operations of all SA circuits of the DRAM. Besides, the overdrive voltage generator may pump the voltage of the node in advance when the overdrive voltage is lower than the first reference voltage, so as to stabilize the pump voltage and prevent the pump voltage from being excessively drawn power and dropped too low.

In order to make the aforementioned and other features and advantages provided in the disclosure more comprehensible, several embodiments accompanied with figures are described in detail below.

›BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are included to provide a further understanding of the disclosure, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the disclosure and, together with the description, serve to explain the principles described herein.

FIG. 1 is a schematic view of power supply of a SA of a known DRAM.

FIG. 2 is a schematic block and application view of an overdrive voltage generator according to an embodiment of the disclosure.

FIG. 3 is a schematic block and application view of an overdrive voltage generator according to another embodiment of the disclosure.

FIG. 4 is a schematic block view of a pre-pumping control circuit according to an embodiment of the disclosure.

FIG. 5 is a schematic block view of a voltage pump circuit according to an embodiment of the disclosure.

FIG. 6 is a timing diagram of signals of the overdrive voltage generator according to an embodiment of the disclosure.

›DESCRIPTION OF THE EMBODIMENTS · 1 of 4

In order to make the disclosure more comprehensible, embodiments are described below as the examples to show the scope of protection. In addition, whenever possible, identical or similar reference numbers stand for identical or similar elements in the figures and the embodiments.

Please refer to FIG. 2 , which is a schematic block and application view of an overdrive voltage generator according to an embodiment of the disclosure. The overdrive voltage generator 100 may be configured to provide an overdrive voltage VOD required for operating a SA circuit 900 in at least one bank of a DRAM, which should however not be construed as a limitation in the disclosure. As a matter of fact, the overdrive voltage generator 100 provided herein may be applied to other circuits with the overdrive demands.

As shown in FIG. 2 , a voltage regulator 800 may generate a bit line highest-level voltage VBLH according to a power of a second power supply VDD 2 ; after the initial operation time period of the SA circuit 900 , the voltage regulator 800 provides the bit line highest-level voltage VBLH to the SA circuit 900 through a switch SW 92 , so that the SA circuit 900 may sense signals of bit line pairs BL and/BL. Here, the voltage of the second power supply VDD 2 is greater than the bit line highest-level voltage VBLH. Particularly, the voltage regulator 800 may include but is not limited to a switch SW 81 , a comparator 820 , and a capacitor C 3 . A first terminal of the switch SW 81 is coupled to the second power supply VDD 2 . A second terminal of the switch SW 81 outputs the bit line highest-level voltage VBLH. An non-inversion input terminal of the comparator 820 receives a reference voltage VREF_VBLH, an inversion input terminal of the comparator 820 is coupled to the second terminal of the switch SW 81 to receive the bit line highest-level voltage VBLH, and an output terminal of the comparator 820 is coupled to a control terminal of the switch SW 81 , so as to turn on or turn off the switch SW 81 . The capacitor C 3 is coupled between the second terminal of the switch SW 81 and a ground terminal GND.

On the other hand, the overdrive voltage generator 100 may generate the overdrive voltage VOD according to the power of the first power supply VDD 1 and the power of the second power supply VDD 2 to transmit the overdrive voltage VOD through the switch SW 91 to the SA circuit 900 during the initial operation time period, whereby the sensing speed of the SA circuit 900 may be increased. Here, the voltage of the first power supply VDD 1 is greater than the overdrive voltage VOD, and the overdrive voltage VOD is greater than the voltage of the second power supply VDD 2 .

Particularly, the overdrive voltage generator 100 may include a first switching circuit 110 , a second switching circuit 120 , a boosting circuit 130 , and a comparison circuit 140 , which should however not be construed as a limitation in the disclosure. The first switching circuit 110 is coupled between the first power supply VDD 1 and an output terminal OT, and is configured to be controlled by a switching signal SC to provide the overdrive voltage VOD to the output terminal OT.

The boosting circuit 130 is coupled between the second power supply VDD 2 and a node OD, and is configured to boost the voltage of the second power supply VDD 2 to provide a pump voltage VODP to the node OD. Here, the pump voltage VODP is lower than the voltage of the first power supply VDD 1 but is greater than the overdrive voltage VOD.

The second switching circuit 120 is coupled between the node OD and the output terminal OT, and is configured to be controlled by the switching signal SC to provide the overdrive voltage VOD to the output terminal OT.

The comparison circuit 140 is coupled to the first switching circuit 110 , the second switching circuit 120 , and the output terminal OT, and is configured to compare the overdrive voltage VOD with a first reference voltage VREF 1 to generate the switching signal SC. It can be understood that the first switching circuit 110 and the second switching circuit 120 are controlled by the same switching signal SC generated by the same comparison circuit 140 , so as to jointly provide the overdrive voltage VOD.

According to an embodiment, the overdrive voltage generator 100 may further include capacitors C 1 and C 2 . The capacitor C 1 is coupled between the output terminal OT and the ground terminal GND and may store electrical energy and stabilize the overdrive voltage VOD. The capacitor C 2 is coupled between the node OD and the ground terminal GND and may store electric energy and stabilize the pump voltage VODP. The operation of the overdrive voltage generator 100 is explained hereinafter.

The boosting circuit 130 may compare the pump voltage VODP with the second reference voltage VREF 2 . When the pump voltage VODP is lower than the second reference voltage VREF 2 , the boosting circuit 130 may perform a boosting operation to raise the pump voltage VODP. On the contrary, when the pump voltage VODP is higher than or equal to the second reference voltage VREF 2 , the boosting circuit 130 stops the boosting operation, so as to maintain the pump voltage VODP to be at the second reference voltage VREF 2 . In an embodiment, the boosting circuit 130 may be implemented in form of a known voltage pump circuit, for instance, which should however not be construed as a limitation in the disclosure.

In another aspect, when the overdrive voltage VOD is lower than the first reference voltage VREF 1 , the comparison circuit 140 may generate the switching signal SC (e.g., at the first voltage level) to turn on the first switching circuit 110 and the second switching circuit 120 , thereby increasing the overdrive voltage VOD. By contrast, if the overdrive voltage VOD is higher than or equal to the first reference voltage VREF 1 , the comparison circuit 140 may generate the switching signal SC (e.g., at the second voltage level) to turn off the first switching circuit 110 and the second switching circuit 120 , thereby maintaining the overdrive voltage VOD to be at the first reference voltage VREF 1 .

›DESCRIPTION OF THE EMBODIMENTS · 2 of 4

According to an embodiment, the comparison circuit 140 may include a single comparator CMP 1 having a non-inversion input terminal receiving the first reference voltage VREF 1 , an inversion input terminal coupled to the output terminal OT to receive the overdrive voltage VOD, and an output terminal outputting the switching signal SC.

According to an embodiment, the first switching circuit 110 may include at least one first transistor SW 1 . A first terminal of the at least one first transistor SW 1 is coupled to the first power supply VDD 1 , a second terminal of the at least one first transistor SW 1 is coupled to the output terminal OT, and a control terminal of the at least one first transistor SW 1 receives the switching signal SC. Here, the at least one first transistor SW 1 may be but is not limited to a p-type metal oxide semiconductor field effect transistor (MOSFET), for instance. Similarly, the second switching circuit 120 may include at least one second transistor SW 2 . A first terminal of the at least one second transistor SW 2 is coupled to the node OD, a second terminal of the at least one second transistor SW 2 is coupled to the output terminal OT, and a control terminal of the at least one second transistor SW 2 receives the switching signal SC. Here, the at least one second transistor SW 2 may be but is not limited to a p-type MOSFET, for instance.

Note that the at least one first transistor SW 1 and the at least one second transistor SW 2 are controlled by the switching signal SC of the single comparator CMP and are then turned on or off, so as to maintain the overdrive voltage VOD to be at the first reference voltage VREF 1 . Hence, the overdrive voltage generator 100 provided in the embodiment as shown in FIG. 2 may be substantially considered as a digital voltage regulator. The digital voltage regulator is characterized by fast response speed, and once the transient load of the overdrive voltage VOD is excessive, which leads to the reduction of the voltage level of the overdrive voltage VOD, the digital voltage regulator can rapidly recover the voltage level of the overdrive voltage VOD. Hence, the overdrive voltage generator 100 may be configured to simultaneously provide the overdrive voltages VOD required for operating the SA circuits 900 in all banks of a DRAM.

In addition, since the output current of the first power supply VDD 1 and the output current of the second power supply VDD 2 are associated with the number of the first and second transistors SW 1 and SW 2 , respectively, the number of the turned-on first and second transistors SW 1 and SW 2 may be controlled according to practical applications or design requirements, such that the power supply ratio between the first power supply VDD 1 and the second power supply VDD 2 can be adjusted.

Please refer to FIG. 3 , which is a schematic block and application view of an overdrive voltage generator according to an embodiment of the disclosure. The overdrive voltage generator 200 may be configured to provide an overdrive voltage VOD required for operating a SA circuit 900 in at least one bank of a DRAM, which should however not be construed as a limitation in the disclosure. As a matter of fact, the overdrive voltage generator 200 provided herein may be applied to other circuits with the overdrive demands. The way to implement and operate the voltage regulator 800 , the switches SW 91 and SW 92 , and the SA circuit 900 shown in FIG. 3 are similar to the way to implement and operate the voltage regulator 800 , the switches SW 91 and SW 92 and the SA circuit 900 shown in FIG. 2 , respectively. Therefore, the descriptions provided above may be taken as a reference, and no further explanation will be provided hereinafter.

The overdrive voltage generator 200 may include a first switching circuit 210 , a second switching circuit 220 , a boosting circuit 230 , a comparison circuit 240 , and a level shifter 250 , which should however not be construed as a limitation in the disclosure. The comparison circuit 240 is similar to the comparison circuit 140 depicted in FIG. 2 ; therefore, one may refer to the above descriptions of the operation and implementation manner, and no other explanation will be provided hereinafter. The level shifter 250 is coupled to the comparison circuit 240 to receive the switching signal SC and shift a voltage swing range of the switching signal SC to generate a level shifting signal SC 1 . The first switching circuit 210 and the second switching circuit 220 are respectively similar to the first switching circuit 110 and the second switching circuit 120 depicted in FIG. 2 , while the difference lies in that the first switching circuit 210 and the second switching circuit 220 are controlled by the level shifting signal SC 1 , so as to jointly provide the overdrive voltage VOD to the output terminal OT. The boosting circuit 230 is coupled between the second power supply VDD 2 and the node OD, and is controlled by the switching signal SC to boost the voltage of the second power supply VDD 2 , so as to provide the pump voltage VODP to the node OD. This will be elaborated hereinafter.

According to an embodiment, the first switching circuit 210 may include at least one first transistor SW 21 . A first terminal of the at least one first transistor SW 21 is coupled to the first power supply VDD 1 , a second terminal of the at least one first transistor SW 21 is coupled to the output terminal OT, and a control terminal of the at least one first transistor SW 21 receives the level shifting signal SC 1 . Here, the at least one first transistor SW 21 may be but is not limited to an n-type MOSFET, for instance. Similarly, the second switching circuit 220 may include at least one second transistor SW 22 . A first terminal of the at least one second transistor SW 22 is coupled to the node OD, a second terminal of the at least one second transistor SW 22 is coupled to the output terminal OT, and a control terminal of the at least one second transistor SW 22 receives the level shifting signal SC 1 . Here, the at least one second transistor SW 22 may be but is not limited to an n-type MOSFET, for instance. Note that the level shifter 250 shifts the voltage swing range of the switching signal SC to generate the level shifting signal SCI, so as to ensure that the first and second transistors SW 21 and SW 22 (the n-type MOSFETs) may be completely turned on or off.

›DESCRIPTION OF THE EMBODIMENTS · 3 of 4

Similar to the overdrive voltage generator 100 provided in the embodiment depicted in FIG. 2 , the overdrive voltage generator 200 provided in the embodiment depicted in FIG. 3 may also be substantially considered as a digital voltage regulator and is thus characterized by fast response speed. Once the transient load of the overdrive voltage VOD is excessive, which leads to the reduction of the voltage level of the overdrive voltage VOD, the overdrive voltage regulator 200 can rapidly recover the voltage level of the overdrive voltage VOD. Hence, the overdrive voltage generator 200 may be configured to simultaneously provide the overdrive voltages VOD required for operating the SA circuits 900 in all banks of a DRAM.

In addition, since the output current of the first power supply VDD 1 and the output current of the second power supply VDD 2 are associated with the number of the first and second transistors SW 21 and SW 22 , respectively, the number of the turned-on first and second transistors SW 21 and SW 22 may be controlled according to practical applications or design requirements, such that the power supply ratio between the first power supply VDD 1 and the second power supply VDD 2 can be adjusted according to actual application or design requirements.

The way to operate and implement the boosting circuit 230 is explained hereinafter. As previously described, the switching signal SC generated by the comparison circuit 240 may control the operation of the boosting circuit 230 . Specifically, when the overdrive voltage VOD is lower than the first reference voltage VREF 1 , the comparison circuit 240 may generate the switching signal SC (e.g., at the first voltage level), and the level shifting signal SC 1 may be generated by the level shifter 250 to turn on the first switching circuit 210 and the second switching circuit 220 , thereby increasing the overdrive voltage VOD. At this time, the switching signal SC generated by the comparison circuit 240 also triggers the boosting circuit 230 ; thereby, when the second switching circuit 220 is being turned on, the boosting circuit 230 may pump the voltage of the node OD in advance to stabilize the pump voltage VODP. As such, the pump voltage VODP can be prevented from falling to an overly low level due to the fact that the second switching circuit 220 draws power from the pump voltage VODP.

By contrast, if the overdrive voltage VOD is higher than or equal to the first reference voltage VREF 1 , the comparison circuit 240 generates the switching signal SC (e.g., at the second voltage level) and the level shifting signal SC 1 is generated by the level shifter 250 to turn off the first switching circuit 210 and the second switching circuit 220 , thereby maintaining the overdrive voltage VOD to be at the first reference voltage VREF 1 . At this time, the switching signal SC stops triggering the boosting circuit 230 .

Besides, similar to the boosting circuit 130 of depicted in FIG. 2 , the boosting circuit 230 depicted in FIG. 3 may also compare the pump voltage VODP with the second reference voltage VREF 2 to determine whether to raise the pump voltage VODP. The description of the detailed operation of the boosting circuit 230 may be learned from the description of the boosting circuit 130 shown in FIG. 2 and therefore will not be provided hereinafter.

In an embodiment, the boosting circuit 230 may include a pre-pumping control circuit 231 and a voltage pump circuit 232 . The pre-pumping control circuit 231 is coupled to the comparison circuit 240 to receive the switching signal SC and generate a pulse signal SP in response to the switching signal SC. The voltage pump circuit 232 is coupled to the pre-pumping control circuit 231 to receive the pulse signal SP and boost the voltage of the second power supply VDD 2 in response to the pulse signal SP, so as to generate the pump voltage VODP and provide the pump voltage VODP to the node OD. Particularly, the voltage pump circuit 232 may boost the voltage of the second power supply VDD 2 in response to the pulse signal SP to pre-pump the voltage of the node OD, thereby stabilizing the pump voltage VODP. In addition, the voltage pump circuit 232 may compare the pump voltage VODP with the second reference voltage VREF 2 . When the pump voltage VODP is lower than the second reference voltage VREF 2 , the boosting circuit 232 boosts the voltage of the second power supply VDD 2 to raise the pump voltage VODP.

In an embodiment, the pre-pumping control circuit 231 may include a one-shot circuit that may generate the pulse signal SP according to an edge (e.g., a rising edge or a falling edge) of the switching signal SC.

In another embodiment, as shown in FIG. 4 , the pre-pumping control circuit 231 may include but is not limited to NOT gates INV 1 -INV 4 and a NOR gate NR. An input terminal of the NOT gate INV 1 receives the switching signal SC, and an output terminal of the NOT gate INV 1 is coupled to a first input terminal of the NOR gate NR. The NOT gates INV 2 -INV 4 are sequentially and serially connected between the output terminal of the NOT gate INV 1 and a second input terminal of the NOR gate NR. An output terminal of the NOR gate NR may output the pulse signal SP.

In an embodiment, as shown in FIG. 5 , the voltage pump circuit 232 may include a comparator CMP 2 , an OR gate ORG, a pump clock signal generator 2322 , and a pump voltage generator 2324 . A non-inversion input terminal of the comparator CMP 2 receives the second reference voltage VREF 2 , an inversion input terminal of the comparator CMP 2 is coupled to the node OD (shown in FIG. 3 ) to receive the pump voltage VODP, and an output terminal of the comparator CMP 2 outputs a detection signal SDET. A first input terminal of the OR gate ORG is coupled to the output terminal of the comparator CMP 2 to receive the detection signal SDET, a second input terminal of the OR gate ORG is coupled to the pre-pumping control circuit 231 (shown in FIG. 3 ) to receive the pulse signal SP, and an output terminal of the OR gate ORG outputs a running signal SRUN. The pump clock signal generator 2322 is coupled to the output terminal of the OR gate ORG to receive the running signal SRUN and accordingly generate a pump clock signal P_CK. The pump voltage generator 2324 is coupled to the pump clock signal generator 2322 to receive the pump clock signal P_CK and accordingly generate the pump voltage VODP. According to an embodiment, the pump clock signal generator 2322 and the pump voltage generator 2324 may be implemented by a known pump clock signal generating circuit and a pump voltage generating circuit, respectively.

›DESCRIPTION OF THE EMBODIMENTS · 4 of 4

Please refer to FIG. 3 to FIG. 6 together. FIG. 6 is a timing diagram of signals of the overdrive voltage generator shown in FIG. 3 , the pre-pumping control circuit shown in FIG. 4 , and the voltage pump circuit shown in FIG. 5 according to an embodiment of the disclosure. At a time point T 11 , the comparison circuit 240 determines that the overdrive voltage VOD is lower than the first reference voltage VREF 1 and thus outputs the switching signal SC at the logic-high level, for instance, and the comparison circuit 240 turns on the first switching circuit 210 and the second switching circuit 220 through the level shifter 250 , thereby increasing the overdrive voltage VOD. At this time, the pre-pumping control circuit 231 generates the pulse signal SP in response to the rising edge of the switching signal SC, and the running signal SRUN is outputted by the OR gate ORG of the voltage pump circuit 232 to allow the pump clock signal generator 2322 and the pump voltage generator 2324 to start running. Thereby, when the second switching circuit 220 is being turned on, the pump voltage generator 2324 may pump the voltage of the node OD in advance for a period of time (i.e., the width of the pulse signal SP) to avoid the pump voltage VODP from being dropped to an overly low level due to the fact that the second switching circuit 220 draws power from the pump voltage VODP.

Since the second switching circuit 220 continuously draws power from the pump voltage VODP, the pump voltage VDOP starts to decrease, and the overdrive voltage VOD starts to increase. At a time point T 12 , the comparator CMP 2 (shown in FIG. 5 ) of the voltage pump circuit 232 determines that the pump voltage VODP is lower than the second reference voltage VREF 2 and thus outputs the detection signal SDET at the logic-high level, for instance, and the logic-high running signal SRUN is outputted by the OR gate ORG of the voltage pump circuit 232 , so as to keep the pump clock signal generator 2322 and the pump voltage generator 2324 running to continuously pump the voltage of the node OD.

At a time point T 13 , the comparison circuit 240 determines that the overdrive voltage VOD is increased to be equal to the first reference voltage VREF 1 and thus outputs the switching signal SC at the logic-low level, for instance, and the first switching circuit 210 and the second switching circuit 220 are turned off by the level shifter 250 . At this time, the second switching circuit 220 is turned off and thus stops drawing power from the pump voltage VODP, so that the pump voltage VODP starts to rise. At a time point T 14 , the comparator CMP 2 of the voltage pump circuit 232 determines that the pump voltage VODP rises to be equal to the second reference voltage VREF 2 and thus outputs the detection signal SDET at the logic-low level, for instance, and the logic-low running signal SRUN is outputted by the OR gate ORG of the voltage pump circuit 232 , so that the pump clock signal generator 2322 and the pump voltage generator 2324 stops pumping the voltage of the node OD.

In addition, the operations of the overdrive voltage generator 200 at the time points T 21 -T 24 in FIG. 6 are similar to the operations at the time points T 11 -T 14 , respectively, so the above description may serve as a reference and will not be repeated herein.

To sum up, the overdrive voltage generator provided in one or more embodiments may be deemed as a digital voltage regulator characterized by fast response speed and thus may be applied to provide the overdrive voltage required by operations of all SA circuits of the DRAM. Besides, the overdrive voltage generator may pre-pump the voltage of the node when the overdrive voltage is lower than the first reference voltage, so as to stabilize the pump voltage and prevent the pump voltage from being excessively drawn power and dropped too low.

It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the disclosure without departing from the scope or spirit of the disclosure. In view of the foregoing, it is intended that the disclosure cover modifications and variations provided they fall within the scope of the following claims and their equivalents.

Claims as granted

19 claims

Log in to read the claims of this application.

Log in to unlock

Classifications

8 codes
IPC · International Patent Classification
Section G — Physics
  • G11C11/4074
  • G11C11/4076
  • G11C11/4091
Section H — Electricity
  • H03K19/20
  • H03K17/687
  • H03K3/012
  • H03K19/0175
  • H03K5/24

Claim changes

Soon
Coming soonHow the claims changed between publication and grant

See which claims were amended, added or cancelled during examination, with every added and removed word marked.

AmendedAddedCancelledUnchanged

The published claims of this application are not paired with the granted ones in what we hold.

File wrapper

⤢ drag to zoomJunJulAugSepOctNovDec2019FebMarUSPTOApplicantNotice of allowance
USPTOApplicanthover for detail · click to open
Pendency
0.5 y
172 days filing → grant
Office actions
0
none on record
Examiner
Dinh T Le
art unit 2842 · TC 2800
Citations: 13 back · 1 forward

See the full prosecution history — every USPTO and applicant action on this file, in order.

Log in to unlock

Documents

Log in to open the documents of this file: the application as filed, every office action and response, the notice of allowance.

Log in to unlock

Chain of title

⤢ drag to zoom20182020202220242026202820302032203420362038Owner 1
Titlehover for detail · click to open

See the full assignment history — every owner this patent has passed through, with recordation dates and reel/frame numbers.

Log in to unlock