N2O analysis device and analysis method

The invention relates to an N 2 O analysis device and analysis method.

Dinitrogen monoxide (hereinafter referred to as N 2 O) is known to be one of greenhouse gases. However, since it is not subject to a flue gas regulation, the concentration of N 2 O in flue gas discharged from sludge incinerators and circulating fluidized bed boilers has not been measured, or control based on the measured concentration of N 2 O has not been performed. Since N 2 O has about 310 times as much greenhouse effect as carbon dioxide, the reduction of N 2 O greatly contributes to the reduction of the total amount of greenhouse gases. Accordingly, it is strongly desired to reduce N 2 O discharged from sludge incinerators and circulating fluidized bed boilers as much as possible.

Conventionally, the measurement and analysis of N 2 O have been performed with analysis equipment such as a non-dispersive infrared spectrometer, a gas chromatography mass spectrometer (GC-MS), or a gas chromatography electron capture detector (GC-ECD) after gas is sampled and pretreated to remove dust and coexisting gases (H 2 O/CO 2 /CO/SO 2 /CH 4 and so on).

In addition, nowadays, a gas analysis device capable of continuously analyzing NO, NO 2 , N 2 O and NH 3 simultaneously using multiple quantum cascade lasers (hereinafter referred to as QCLs) after gas is sampled and pretreated to remove only dust/H 2 O, is being developed and researched (for example, refer to Patent Document 1 below).

Patent Document

Patent Document 1: WO2012/120957

Non-Patent Document

Non-Patent Document 1: O. Tadanaga et al., “Efficient 3-μm difference frequency generation using direct-bonded quasi-phase-matched LiNbO3 ridge waveguides”, 2006, APPLIED PHYSICS LETTERS, Vol. 88, No. 6, 061101-1-061101-3

Problems to be Solved by the Invention

However, even the gas analysis device described in Patent Document 1requires dust removal and dehumidification, and the analysis is performed under a reduced pressure to reduce interference of other coexisting gases. Thus, this gas analysis device has problems of requiring much cost and time. For this reason, it has been strongly desired to directly measure the concentration of N 2 O in flue gas without pretreatment.

Moreover, for a QCL utilizing long-wavelength mid-infrared (8 μm), only a material having a high deliquescent property such as CaF 2 or MgF 2 can be used for window material, which makes it impossible to directly measure combustion flue gas containing a large amount of H 2 O.

In view of the above, the present invention is made to solve the problems described above, and an object thereof is to provide an N 2 O analysis device and analysis method capable of directly measuring the concentration of N 2 O in flue gas without pretreatment.

Means for Solving the Problems

To solve the above problems, an N 2 O analysis device according to a first aspect of the invention comprises light emission means for emitting laser light to flue gas containing N 2 O, H 2 O, and CO 2 ; light reception means for receiving the laser light emitted to the flue gas; wavelength control means for performing control such that a wavelength of the laser light emitted by the light emission means is in a 3.84 to 4.00 μm band; and N 2 O concentration calculation means for calculating a concentration of N 2 O by means of infrared spectroscopy, using the laser light received by the light reception means and the laser light controlled by the wavelength control means.

To solve the above problems, an N 2 O analysis device according to a second aspect of the invention is the N 2 O analysis device according to the first aspect of the invention, wherein the wavelength control means performs control such that the wavelength of the laser light is 3.9034 to 3.9060 μm, 3.9090 to 3.9116 μm, or 3.9122 to 3.9148 μm.

To solve the above problems, an N 2 O analysis device according to a third aspect of the invention is the N 2 O analysis device according to the first or second aspect of the invention, wherein the wavelength control means performs control such that the wavelength of the laser light is 3.9047 μm, 3.9103 μm, or 3.9135 μm.

To solve the above problems, an N 2 O analysis device according to a fourth aspect of the invention is the N 2 O analysis device according to any one of the first to third aspects of the invention, wherein the light emission means includes a nonlinear optical crystal, generates, by means of difference frequency generation using inputs of laser light with a wavelength of λ 1 and laser light with a wavelength of λ 2 , laser light with a wavelength of λ 3 satisfying 1/λ 3 =1/λ 1 −1/λ 2 , and outputs the laser light with the wavelength of λ 3 .

To solve the above problems, an N 2 O analysis device according to a fifth aspect of the invention is the N 2 O analysis device according to any one of the first to fourth aspects of the invention, further comprising temperature measurement means for measuring a temperature of the flue gas, wherein the N 2 O concentration calculation means calculates the concentration of N 2 O by means of the infrared spectroscopy, using also the temperature of the flue gas measured by the temperature measurement means.

To solve the above problems, an N 2 O analysis device according to a sixth aspect of the invention is the N 2 O analysis device according to any one of the first to fifth aspects of the invention, further comprising sampling means for sampling the flue gas, wherein the light emission means emits the laser light to the flue gas sampled by the sampling means.

To solve the above problems, an N 2 O analysis device according to a seventh aspect of the invention is the N 2 O analysis device according to the sixth aspect of the invention, further comprising heating means for heating the flue gas sampled by the sampling means.

To solve the above problems, an N 2 O analysis method according to an eighth aspect of the invention comprises emitting, by light emission means, laser light with a wavelength of 3.84 to 4.00 μm to flue gas containing N 2 O, H 2 O, and CO 2 ;

receiving the laser light emitted to the flue gas; and calculating a concentration of N 2 O by means of infrared spectroscopy, using the received laser light and the laser light which is controlled to be 3.84 to 4.00 μm.

To solve the above problems, an N 2 O analysis method according to a ninth aspect of the invention is the N 2 O analysis method according to the eighth aspect of the invention, wherein the wavelength of the laser light emitted by the light emission means is controlled to be 3.9034 to 3.9060 μm, 3.9090 to 3.9116 μm, or 3.9122 to 3.9148 μm.

To solve the above problems, an N 2 O analysis method according to a tenth aspect of the invention is the N 2 O analysis method according to the eighth or ninth aspect of the invention, wherein the wavelength of the laser light emitted by the light emission means is controlled to be 3.9047 μm, 3.9103 μm, 3.9135 μm.

To solve the above problems, an N 2 O analysis method according to an eleventh aspect of the invention is the N 2 O analysis method according to any one of the eighth to tenth aspects of the invention, wherein equipment including a nonlinear optical crystal is used for the light emission means, the equipment generating, by means of difference frequency generation using inputs of laser light with a wavelength of λ 1 and laser light with a wavelength of λ 2 , laser light with a wavelength of A 3 satisfying 1/λ 3 =1/λ 1 −1/λ 2 , and outputting the laser light with the wavelength of λ 3 .

To solve the above problems, an N 2 O analysis method according to a twelfth aspect of the invention is the N 2 O analysis method according to any one of the eighth to eleventh aspects of the invention, further comprising: measuring a temperature of the flue gas; and calculating the concentration of N 2 O by means of the infrared spectroscopy, using also the measured temperature of the flue gas.

To solve the above problems, an N 2 O analysis method according to a thirteenth aspect of the invention is the N 2 O analysis method according to any one of the eighth to twelfth aspects of the invention, wherein the flue gas to which the laser light is emitted is sampled.

To solve the above problems, an N 2 O analysis method according to a fourteen aspect of the invention is the N 2 O analysis method according to the thirteenth aspect of the invention, wherein the sampled flue gas is heated.

Effect of the Invention

The present invention makes it possible to measure the concentration of N 2 O in the flue gas accurately and promptly without pretreatment.

FIG. 1 is a schematic configuration diagram of a sludge incinerator including an N 2 O concentration analysis device according to a first embodiment of the present invention.

FIG. 2 is a schematic configuration diagram of an example of laser light source and a wavelength control device included in the N 2 O concentration analysis device.

FIG. 3 is a graph illustrating the absorbance of N 2 O in a wavelength band of 4.5 μm at room temperature.

FIG. 4A is a graph illustrating the absorbance of H 2 O in the wavelength band of 4.5 μm at 800° C.

FIG. 4B is a graph illustrating the absorbance of CO 2 in the wavelength band of 4.5 μm at 800° C.

FIG. 4C is a graph illustrating the absorbance of N 2 O in the wavelength band of 4.5 μm at 800° C.

FIG. 5 is a graph illustrating the absorbance of N 2 O in a wavelength band of 3.9 μm at room temperature.

FIG. 6A is a graph illustrating the absorbance of H 2 O in the wavelength band of 3.9 μm at 800° C.

FIG. 6B is a graph illustrating the absorbance of CO 2 in the wavelength band of 3.9 μm at 800° C.

FIG. 6C is a graph illustrating the absorbance of N 2 O in the wavelength band of 3.9 μm at 800° C.

FIG. 7 is a graph illustrating the absorbance of H 2 O, CO 2 , N 2 O around the wavelength 3.9 μm at 800° C.

FIG. 8 is a graph illustrating the relationship between the measurement time and the measurement result of the N 2 O concentration analysis device.

FIG. 9 is a schematic configuration diagram of an N 2 O concentration analysis device according to a second embodiment of the present invention.

Descriptions will be provided for embodiments of an N 2 O concentration analysis device and analysis method according to the present invention based on the drawings. However, the present invention is not limited only to the following embodiments described based on the drawings.

[First Embodiment]

Descriptions will be provided using FIGS. 1, 2, 3, 4A to 4C, 5, 6A to 6C, and 7 for an application of an N 2 O concentration analysis device according to a first embodiment of the present invention to N 2 O measurement in a sludge incinerator.

As illustrated in FIG. 1 , a sludge incinerator 100 A according to this embodiment is a fluidized bed incinerator in which sludge (fuel) 1 is supplied into a sludge incinerator main body 101 by a sludge feeder (feeder) 111 , and inside the sludge incinerator main body 101 , a fluidized bed 102 is formed by sand grains (fluidized material) as a heating medium together with the sludge 1 and combusts. Combustion air 2 with its temperature adjusted is introduced from a bottom 101 a of the sludge incinerator main body 101 by means of a combustion air supply pipe 112 a and a combustion air supply flow rate adjustment valve 112 b , and auxiliary fuel 3 is introduced into the fluidized bed 102 in the sludge incinerator main body 101 by means of an auxiliary fuel supply pipe 113 a and an auxiliary fuel supply flow rate adjustment valve 113 b , and then combusts. The sand grains in the heated fluidized bed 102 are moved and combusted together with the supplied sludge 1 by the combustion air 2 and generated combustion gas. Further, while the combustion gas of sludge moves up in a freeboard 103 above the fluidized bed 102 , combustion of the combustion gas is completed with secondary air 4 supplied by means of a secondary air supply pipe 114 a and a secondary air supply flow rate adjustment valve 114 b . Then, flue gas 5 after the combustion passes through a flue 105 at an upper portion of the sludge incinerator main body 101 and is discharged to a flue gas treatment device.

The sludge incinerator 100 A includes an N 2 O concentration analysis device 10 A for analyzing the concentration of N 2 O in the flue gas 5 passing through the flue 105 .

As illustrated in FIG. 1 , the N 2 O concentration analysis device 10 A includes a light source 11 , windows 12 a and 12 b , a light receiver 13 , a control device 14 , a temperature measurement instrument 15 a , and a signal generator 15 b . The control device 14 includes a light source control unit 14 a and a signal analyzing unit 14 b which calculates the concentration of N 2 O based on a light reception signal from the light receiver 13 , a temperature signal from the signal generator 15 b , and a reference signal from the light source control unit 14 a.

Here, descriptions will be provided for an example of the light source 11 and the light source control unit 14 a , using FIG. 2 .

As illustrated in FIG. 2 , the light source 11 includes the two near-infrared semiconductor lasers (hereinafter referred to as NIR-LDs) 11 a and 11 b having different oscillation wavelengths, a mirror (reflection mirror) 11 c , a multiplexer 11 d , and a nonlinear optical crystal 11 e . In the light source 11 thus configured, laser light having a wavelength λ 1 generated from the first (one) NIR-LD 11 a is inputted into the nonlinear optical crystal 11 e via the mirror 11 c and the multiplexer 11 d , and at the same time, laser light having a wavelength λ 2 (λ 2 >λ 1 ) generated from the second (the other) NIR-LD 11 b is inputted into the nonlinear optical crystal 11 e via the multiplexer 11 d . As a result, the light source 11 emits laser light having a short-wavelength mid-infrared wavelength λ 3 (1/λ 3 =1/λ 1 −1/λ 2 ), which is the difference-frequency light. This difference frequency generation is based on the second order nonlinear optical effect and occurs in a second order nonlinear optical crystal. As second order nonlinear optical crystals, lithium niobate (LN), lithium tantalate (LT), and potassium titanyl phosphate (KTP) which have large nonlinear constants are well known.

In addition, to utilize the nonlinear constant efficiently, the phases of the wavelengths λ 1 , λ 2 , and λ 3 of the incident and outgoing laser lights need to be matched, and the angle matching method or the quasi phase matching method are used for it. For example, as shown in Non-Patent Document 1, LN is used as a nonlinear optical crystal, a periodic polarization reversal structure is adopted to achieve the quasi phase matching, and a waveguiding structure is further adopted to generate a mid-infrared light in a 3 μm band with high efficiency. Although in Non-Patent Document 1, light of a 3 μm band is generated, for example, it is possible to generate a short-wavelength mid-infrared light with a desired wavelength λ 3 in a 2 to 5 μm range, by appropriately selecting the wavelength λ 1 and the wavelength λ 2 , which are in the near-infrared range.

In this case, the stability/robustness of the device is guaranteed by using NIR-LD light sources, which have been used for many applications for communication or the like, for the original light sources. In addition, in a QCL that oscillates and generates a long-wavelength mid-infrared light, since the wavelength line width of the generated laser light is wide, the measurement tends to be affected by coexisting gases. On the other hand, since in this embodiment, the NIR-LDs, the wavelength line widths of which are extremely narrow, are used as origins, the wavelength line width of the generated short-wavelength mid-infrared laser light is as narrow as the NIR-LDs, and this embodiment has a characteristic of being hardly affected by coexisting gases.

Note that although the incident lights from the two NIR-LDs 11 a and 11 b enter the nonlinear optical crystal 11 e through the spatial optical system in FIG. 2 , optical fibers can be used for the incidence.

The light source 11 is controlled by the light source control unit 14 a , which performs temperature control for the two NIR-LDs 11 a and 11 b and the nonlinear optical crystal 11 e , and electric current control for the two NIR-LDs 11 a and 11 b . Appropriate setting of the temperature allows for precise control of the oscillation wavelengths at the NIR-LDs 11 a and 11 b , and precise control of combinations of wavelengths that can be efficiently generated by the difference frequency generation, at the nonlinear optical crystal 11 e.

Further, in this embodiment, utilizing short-wavelength mid-infrared (around 4 μm) for the measurement wavelength allows sapphire window plates having high strength/corrosion resistance to be utilized for the windows 12 a and 12 b . On the other hand, since, in a QCL utilizing long-wavelength mid-infrared (8 μm), only CaF 2 , MgF 2 , or the like having a high deliquescent property can be used for window material, it is impossible to directly measure combustion flue gas containing a large amount of H 2 O.

Meanwhile, strong basic absorption of N 2 O exists at a wavelength of 4.50 μm (absorption intensity 1×10 −18 cm/molecule), and typically, N 2 O is observed as a target in a wavelength region where such strong absorption exists. However, in the application described above, for example, where gases such as 50% of water and 12% of carbon dioxide coexist, for example, even though a strong absorption of N 2 O exists, it is impossible to measure the absorption line accurately because the absorption of N 2 O is small compared to the coexisting gases and the coexisting gases obstruct (interfere) the measurement.

After diligent studies in this respect, it was found that absorption of N 2 O can be observed at around 3.9 μm while avoiding influence of the coexisting gases, even though the absorption intensity is 2.5×10 −20 cm/molecule, which is a small absorbance compared to the basic absorption. The situation will be described using FIGS. 3, 4A to 4C, 5, 6A to 6C, and 7 .

FIG. 3 illustrates the absorbance of N 2 O around 4.5 μm. FIG. 3 illustrates the case where the concentration of NO 2 is 100 ppm, the pressure is 1 atmospheric pressure, the path length is 6m, and the temperature is room temperature. FIG. 3 shows that, depending on the wavelength in this region, there is strong absorption the absorbance of which exceeds 1. FIGS. 4A to 4C show the absorbance around a 4.5 μm band for the case where the temperature is 800° C., which is an example of a temperature assumed to be inside the incinerator, and where 50% of water and 12% of CO 2 coexist. According to FIGS. 4A to 4C , it was confirmed that in the high temperature condition at 800° C., the absorbance of N 2 O reduces while the absorption of CO 2 , which is a coexisting gas, is very strong, which makes it difficult to observe N 2 O. Note that according to FIG. 4B , the absorbance of CO 2 is larger than 1 at wavelengths of 4.52 μm or less.

Meanwhile, FIG. 5 shows the absorbance of N 2 O around 3.9 μm for the case where the concentration of N 2 O is 100 ppm, the pressure is 1 atmospheric pressure, the path length is 6 m, the temperature is room temperature. It is shown that the absorbance of N 2 O is only about one fortieth of the absorbance around 4.5 μm. In the same way as in FIGS. 4A to 4C , FIGS. 6A to 6C show the absorbance around a 3.9 μm band for the case where the temperature is 800° C., which is an example of a temperature assumed to be inside the incinerator, and where 50% of water and 12% of CO 2 coexist. From FIGS. 6A to 6C , it was confirmed that unlike the vicinity of 4.5 μm, this region is less susceptible to the absorption of CO 2 . FIG. 7 illustrates the case where FIGS. 6A to 6C are superimposed and the scale of the vertical axis is changed. According to FIG. 7 , it was confirmed that although the absorption of water exists around 3.9 μm, the positions of its absorption lines are sparse and the influence of the absorption lines of water is small, and it is possible to observe N 2 O.

From this result, the light source 11 is a mid-infrared semiconductor laser capable of emitting laser light with, for example, a vibrational-rotational absorption wavelength of N 2 O in a wavelength band of 3.84 to 4.00 μm, preferably a wavelength region A1 (wavelengths of 3.9034 to 3.9060 μm), a wavelength region A2 (wavelengths of 3.9090 to 3.9116 μm), or a wavelength region A3 (wavelengths of 3.9122 to 3.9148 μm), or more preferably a wavelength of 3.9047 μm, a wavelength of 3.9103 μm, or a wavelength of 3.9135 μm.

The windows 12 a and 12 b are arranged to face each other at the flue 105 and can be passed through by the laser light. It is preferable that the windows 12 a and 12 b are made of, for example, sapphire. This is because that sapphire does not have a deliquescent property and eliminates the need of maintenance such as replacing the windows.

The light receiver 13 receives the laser light emitted by the light source 11 and having passed through the window 12 a , the flue 105 , and the window 12 b . A light intensity signal (light reception signal) obtained by the light receiver 13 is outputted to the signal analyzing unit 14 b to be described in detail later of the control device 14 .

The temperature measurement instrument 15 a is disposed so as to measure the temperature at generally the same position as the laser measurement position in the flue 105 , and capable of measuring the temperature of the flue gas 5 flowing inside the flue 105 . The temperature measurement instrument 15 a measures the temperature of the flue gas 5 , and the temperature signal generated by the signal generator 15 b is outputted to the signal analyzing unit 14 b.

The light source control unit 14 a transmits a control signal to the light source 11 to control the wavelength of the laser light emitted by the light source 11 , and transmits the reference signal to the signal analyzing unit 14 b . The reference signal is a signal having the wavelength information of the laser light emitted by the light source 11 based on the control signal.

The signal analyzing unit 14 b calculates the concentration of N 2 O and outputs a signal corresponding to this concentration of N 2 O. The signal analyzing unit 14 b calculates the concentration of N 2 O by means of infrared spectroscopy based on the reference signal transmitted from the light source control unit 14 a , the light reception signal obtained at the light receiver 13 , and the temperature signal transmitted from the temperature measurement instrument 15 a via the signal generator 15 b.

The measurement time of the N 2 O concentration analysis device 10 A described above and the measurement result of the concentration of N 2 O will be described using FIG. 8 . In FIG. 8 , the test specimen indicates a case of the N 2 O concentration analysis device according to this embodiment, and the comparative specimen indicates a case of a conventional N 2 O concentration analysis device that measures the concentration of N 2 O after flue gas is sampled and pretreated to remove dust and coexisting gases. In FIG. 8 , the thin line indicates the measurement result of the test specimen, and the thick line indicates the measurement result of the comparative specimen. The measured gas contained 50% of water, 12% of CO 2 , several % of O 2 , and the temperature of the gas was 800 to 850° C.

As illustrated in FIG. 8 , for the maximum peaks of the concentrations of N 2 O around 30 minutes, it was found that the test specimen was able to be measured 1 minute and 38 seconds before the case of the comparative specimen. It was also found that the concentration of N 2 O of the test specimen was higher than that for the case of the comparative specimen. For the minimum values of the concentrations of N 2 O around 40 minutes, it was found that the test specimen was able to be measured 1 minute and 25 seconds before the case of the comparative specimen. It was also found that the concentration of N 2 O of the test specimen is lower than that for the case of the comparative specimen. In other words, it was confirmed that the N 2 O concentration analysis device 10 A according to this embodiment makes it possible to analyze the concentration of N 2 O promptly and accurately compared to a conventional N 2 O concentration analysis device regardless of the maximum value and the minimum values of the concentration of N 2 O.

Thus, the N 2 O concentration analysis device 10 A according to this embodiment, having the equipment described above, can directly measure the concentration of N 2 O in the flue gas 5 without pretreatment of removing dust and coexisting gases other than N 2 O in the flue gas 5 , which makes it possible to measure the concentration of N 2 O in the flue gas 5 promptly and accurately.

In addition, changing the attachment positions of the windows 12 a and 12 b allows for the measurement at an upstream portion such as the inside of the freeboard 103 where the concentration of particles is high, or a position directly above the fluidized bed where flames cross and the concentration of N 2 O is high. Moreover, in the measurement at a downstream portion, the concentration of N 2 O measured by the N 2 O concentration analysis device 10 A according to this embodiment shows an average value on the laser light path. For this reason, although conventional sampling measurement requires traverse measurement or the like to find a representative value when the concentration is not constant inside the flue, the N 2 O concentration analysis method in accordance with the N 2 O concentration analysis device 10 A according to this embodiment makes it possible to always measure the average concentration of N 2 O in the flue 105 .

[Second Embodiment]

Descriptions will be provided for an application of the measurement of N 2 O in a sludge incinerator in accordance with a N 2 O concentration analysis device according to a second embodiment of the present invention using FIG. 9 .

In this embodiment, a sampling device is added to the N 2 O concentration analysis device according to the first embodiment described above, and except for it, this embodiment is generally the same as the first embodiment.

As illustrated in FIG. 9 , a sludge incinerator 100 B according to this embodiment includes the same equipment as in the sludge incinerator 100 A according to the above first embodiment, and also includes an N 2 O concentration analysis device 10 B.

The N 2 O concentration analysis device 10 B includes the same equipment as in the N 2 O concentration analysis device 10 A according to the above first embodiment, and further includes a sampling device 16 . The sampling device 16 includes a sampling pipe 16 a , a delivery pipe 16 b , a sampling cell 16 c , a discharge pipe 16 d , and a blower 16 e.

The sampling pipe 16 a is disposed with its distal end side protruded into the flue 105 , and samples the flue gas 5 flowing through the flue 105 .

The proximal end side of the delivery pipe 16 b is connected to the proximal end side of the sampling pipe 16 a , and the distal end side of the delivery pipe 16 b is connected to the proximal end side (the end side connected to the light receiver 13 ) of the sampling cell 16 c.

The distal end of the sampling cell 16 c is coupled to the light source 11 through a window 12 c , and the proximal end of the sampling cell 16 c is coupled to the light receiver 13 through a window 12 d . Note that it is preferable that the windows 12 c and 12 d be made of, for example, sapphire in the same way as in the windows 12 a and 12 b.

The proximal end of the discharge pipe 16 d is connected to the distal end side (the end side connected to the light source 11 ) of the sampling cell 16 c , and the distal end of the discharge pipe 16 d is connected to the flue 105 downstream of the sampling pipe 16 a in the flowing direction of the flue gas. The blower 16 e is disposed in the middle of the discharge pipe 16 d . With the operation of this blower 16 e , a part of the flue gas 5 flowing through the flue 105 will be introduced through the sampling pipe 16 a and the delivery pipe 16 b into the sampling cell 16 c , and the flue gas 5 having flowed through the sampling cell 16 c will be returned through the discharge pipe 16 d to the flue 105 .

The sampling device 16 further includes a heater 16 f that heats the sampling cell 16 c to keep the temperature of the flue gas 5 inside the sampling cell 16 c at a desired temperature. This allows the inside of the sampling cell 16 c to be kept at a predetermined constant temperature, and makes it possible to measure the concentration of N 2 O in the flue gas 5 without measuring the temperature.

Here, the main operation of the above N 2 O concentration analysis device 10 B will be described. Note that the main operation of the sludge incinerator 100 B is the same as that of the above sludge incinerator 100 A, and descriptions thereof are omitted.

First, the heater 16 f is activated to heat the sampling cell 16 c . This keeps the inside of the sampling cell 16 c at a constant temperature, making it possible to keep a temperature correction constant when directly measuring the concentration of N 2 O in the flue gas 5 flowing through the flue 105 , and thereby eliminating the need for a temperature measurement instrument and its signal generator.

Then, the blower 16 e is activated. This will cause a part of the flue gas 5 flowing through the flue 105 to flow into the sampling cell 16 c through the sampling pipe 16 a and the delivery pipe 16 b.

Next, the light source 11 emits laser light with a wavelength of a predetermined range (for example, 3.84 to 4.00 μm) based on a control signal from the light source control unit 14 a of the control device 14 . The laser light is received by the light receiver 13 through the window 12 c , the flue gas 5 inside the sampling cell 16 c , and the window 12 d . The light receiver 13 transmits the light reception signal corresponding to the received laser light to the signal analyzing unit 14 b of the control device 14 . The signal analyzing unit 14 b also receives the reference signal from the light source control unit 14 a.

The signal analyzing unit 14 b calculates the concentration of N 2 O in the flue gas by means of infrared spectroscopy based on the light reception signal and the reference signal.

Thus, even in the case where the flue gas 5 is sampled, the N 2 O concentration analysis device 10 B according to this embodiment including the above equipment makes it possible to directly measure the concentration of N 2 O in the flue gas without removing dust and coexisting gasses other than N 2 O in the flue gas 5 , which makes it possible to measure the concentration of N 2 O in the flue gas 5 promptly and accurately.

Moreover, the N 2 O concentration analysis device 10 B allows for the installment without a large-scale modification work such as attaching measurement windows to a furnace.

[Other Embodiments]

In the above, descriptions have been provided for the case where the concentration of N 2 O in the flue gas containing 100 ppm of N 2 O, 50% of H 2 O, and 12% of CO 2 is measured. However, the concentration of N 2 O in the flue gas is not limited to 100 ppm. When the concentration of N 2 O is higher than 100 ppm, the absorbance of laser is high, and accordingly, it is possible to obtain the same operation effect as described above.

In addition, although in the above, descriptions have been provided for the case where the concentration of N 2 O in the flue gas containing 100 ppm of N 2 O, 50% of H 2 O, and 12% of CO 2 is measured, the concentration of H 2 O in the flue gas is not limited to 50%. When the concentration of H 2 O is lower than 50%, the absorbance of laser is lower than in the case where the concentration of H 2 O is 50%, and the influence on the measurement of the concentration of N 2 O is small. Accordingly, it is possible to obtain the same operation effect as described above.

Moreover, although in the above, descriptions have been provided for the case where the concentration of N 2 O in the flue gas containing 100 ppm of N 2 O, 50% of H 2 O, and 12% of CO 2 is measured, the concentration of CO 2 in the flue gas is not limited to 12%. When the concentration of CO 2 is lower than 12%, the absorbance of laser is lower than in the case where the concentration of CO 2 is 12%, and the influence on the measurement of the concentration of N 2 O is small. Accordingly, it is possible to obtain the same operation effect as described above.

Since the N 2 O analysis device and analysis method according to the present invention can measure the concentration of N 2 O in the flue gas accurately and promptly without pretreatment, it can be utilized extremely usefully in industrial applications.

1 sludge (fuel)

2 combustion air

3 auxiliary fuel

4 secondary air

5 flue gas

10 A, 10 B N 2 O concentration analysis device

11 light source (light emission means)

12 a , 12 b window

13 light receiver (light reception means)

14 control device

14 a light source control unit (wavelength control means)

14 b signal analyzing unit (N 2 O concentration calculation means)

15 a temperature measurement instrument (temperature measurement means)

100 A, 100 B sludge incinerator

101 incinerator main body

102 fluidized bed

103 freeboard

105 flue