Inspection apparatus using polarized lights

The present invention relates to inspection apparatuses for inspecting targets using a plurality of lights, which have different polarization states from each other.

Priority is claimed on Japanese Patent Application No. 2014-113950, filed on Jun. 2, 2014, the contents of which are incorporated herein by reference.

Inspection apparatuses using polarized lights are for irradiating an inspection target with a light, which has a specific polarization state (a linear polarization state or a circular polarization state), receiving a plurality of reflected lights (or, a plurality of transmitted rights), which are obtained from the inspection target and have different polarization states from each other, and inspecting the target. Such inspection apparatuses are used for inspecting surface defects of products or internal defects of products (dust, scratch, non-uniformity, and the like).

Research and development of various devices using organic materials has been actively performed in light of the diversity of function and configuration of the organic materials. The inspection apparatuses are often used for inspecting the quality of thin films (organic thin films) using such organic materials. For example, the inspection apparatuses are often used for inspecting polarizing films, which are used for organic thin-film photovoltaic cells, organic Electro Luminescence (EL) displays, liquid crystal displays, and the like, Radio Frequency IDentification (RFID) tags using organic semiconductors, and the like.

Japanese Unexamined Patent Application, First Publication No. H09-178666 (hereinafter, referred to as “PTL1”) and Japanese Unexamined Patent Application, First Publication No. 2007-322316 (hereinafter, referred to as “PTL2”) disclose examples of inspection apparatuses using polarized lights in the related art. In particular, the PTL1 discloses an inspection apparatus using polarized lights that splits a reflected light from a surface of a steel plate, which is an inspection target, into three different types of polarized lights using a beam splitter, measures the polarized lights using a linear array camera, calculates the ellipse-parameters of the reflected light, and judges the type and grade of the surface defects of the inspection target. The PTL2 discloses an inspection apparatus using polarized lights that selects a plurality of liner polarized lights, which is the most suitable for the inspection, and irradiates an inspection target with the liner polarized lights, so as to overcome the situation where the change of the reflection plane caused by the movement of the inspection target makes the detection of defects difficult.

It is often the case that the above-stated thin film such as an organic thin film is manufactured by a continuous manufacturing process referred to as a “roll-to-toll process”. The above-stated continuous manufacturing process referred to as the “roll-to-toll process” continuously applies an organic material and the like while drawing a rolled film to form an organic thin film, then, rolls the film again, on which the organic thin film is formed. The inspection of the organic thin film manufactured by such a process is generally performed while the organic thin film to be inspected is being moved.

It seems that the inspection apparatus disclosed in the PTL 1 or the PTL 2 allows the inspection of the target while the inspection target is being moved. The inspection apparatus disclosed in the PTL 1 is suitable for inspection of surface defects of an inspection target, which has high surface reflectance, such as a steel plate, but the inspection apparatus is not suitable for inspection of the quality of, for example, an organic thin film (inspection whether an orientation of a molecular material is appropriate). This holds true for the PTL 2.

One aspect of the present invention provides inspection apparatuses using polarized lights, which allow accurate inspection of the quality of films included in inspection targets even while the inspection targets are being moved.

An inspection apparatus using polarized lights according to one aspect of the present invention may include an irradiator configured to irradiate an inspection target with a first plurality of lights. The first plurality of lights may have different polarization states and different wavelengths from each other. The inspection apparatus may further include a light receiver configured to perform a wavelength demultiplexing of a second plurality of lights obtained from the inspection target to generate a third plurality of lights, to separately receive the third plurality of lights, and to output at least one light-receiving signal associated with the third plurality of lights and a processor configured to calculate at least one of an ellipse azimuth, a degree of polarization, and a polarization component intensity using the light-receiving signal and to determine whether the inspection target is defective or non-defective.

In the inspection apparatus, the irradiator may include a plurality of light sources and a multiplexer. Each of the light sources may be configured to emit a light having a different polarization state and different wavelength from those of another light sources. The multiplexer may be configured to multiplex the lights emitted from the light sources and to irradiate one-dimensional or two-dimensional inspection region defined on the inspection target with the multiplexed light.

In the inspection apparatus, the light receiver may include a demultiplexer configured to perform the wavelength demultiplexing of the second plurality of lights to generate the third plurality of lights and at least one imager configured to separately receive the third plurality of lights.

In the inspection apparatus, the light receiver may include a plurality of imagers. Each of the imagers may be disposed for a respective light of the third plurality of lights.

In the inspection apparatus, the light receiver may include single imager configured to separately receive the third plurality of lights. The imager may include an imaging plane. The third plurality of lights may be incident on different regions of the imaging plane from each other.

In the inspection apparatus, the processor may be configured to calculate a distribution of at least one of the ellipse azimuth, the degree of polarization, and the polarization component intensity in a plane of the inspection target.

In the inspection apparatus, the processor may be configured to determine whether the inspection target is defective or non-defective based on one of a first determination result whether the ellipse azimuth is greater than a predetermined first threshold value, a second determination result whether the degree of polarization is greater than a predetermined second threshold value, and a third determination result whether the polarization component intensity is greater than a predetermined third threshold value.

In the inspection apparatus, the light receiver may be configured to receive reflected lights of the first plurality of lights or transmitted lights of the first plurality of lights.

In the inspection apparatus, the multiplexer may be configured to multiplex the lights emitted from the light sources while maintaining a polarized wave state of each light.

In the inspection apparatus, the irradiator may be configured to irradiate the inspection target with the first plurality of lights. Each of the first plurality of lights may have a linear polarization state. The light receiver may be configured to perform the wavelength demultiplexing of a second plurality of lights to generate the third plurality of lights and to separately receive the third plurality of lights. Each of the second plurality of lights may have an ellipse polarization state.

In the inspection apparatus, the imager may be configured to output the light-receiving signal associated with an image indicating a luminance distribution of the third plurality of lights.

In the inspection apparatus, the processor may be configured to process the light-receiving signal to calculate a luminance data indicating a luminance for each pixel of the imager, and calculate at least one of the ellipse azimuth, the degree of polarization, and the polarization component intensity using the luminance data.

In the inspection apparatus, each of the imagers may be configured to output the light-receiving signal associated with each of the third plurality of lights.

In the inspection apparatus, the imager may be configured to output the light-receiving signal associated with the third plurality of lights.

In the inspection apparatus, the processor may be configured to divide the light-receiving signal into a plurality of image signals. Each of the image signals may indicate a respective image of the third plurality of lights.

The inspection apparatus according to one aspect of the present invention is not configured to demultiplex and receive one light, but is configured to irradiate an inspection target with a plurality of lights, which have different polarization states from each other and different wavelengths from each other, to perform a wavelength demultiplexing of a light obtained from the inspection target, and separately receive the demultiplexed lights. Therefore, the measurement of the light obtained from the inspection target can be executed without decreasing the light-receiving signal level. In addition, since an analyzer is not disposed in front of an imager, the incident angle dependence can be reduced and the quality of a film included in the inspection target can be inspected accurately in the polarization measurement process. In addition, since there is no movable element in the apparatus, the inspection of the target can be executed rapidly even while the inspection target is being moved.

FIG. 1 is a block diagram showing main elements included in an inspection apparatus using polarized lights according to a first embodiment of the present invention.

FIG. 2 is a diagram showing an example of a spectrum of an illumination light to be incident on an inspection target.

FIG. 3 is a diagram showing an example of polarization states of illumination lights to be incident on the inspection target and polarization states of reflected lights obtained from the inspection target.

FIG. 4 is a block diagram showing main elements included in an inspection apparatus using polarized lights according to a second embodiment of the present invention.

FIG. 5 is a diagram showing a correlation between a demultiplexer and a camera according to the second embodiment of the present invention.

FIG. 6 is a diagram showing a specific configuration example of the inspection apparatus according to the second embodiment of the present invention.

FIG. 7 is a diagram showing another specific configuration example of the inspection apparatus according to the second embodiment of the present invention.

FIG. 8 is a block diagram schematically showing a configuration of a transmission-type inspection apparatus using polarized lights.

Hereinafter, inspection apparatuses using polarized lights according to several embodiments of the present invention will be described with reference to the drawings.

First Embodiment

FIG. 1 is a block diagram showing main elements included in an inspection apparatus using polarized lights according to the first embodiment of the present invention. As shown in FIG. 1 , an inspection apparatus 1 using polarized lights according to the first embodiment includes an irradiator 10 , a light receiver 20 , and a processor 30 and inspects the quality of a film included in an inspection target F in transfer state in a transfer direction X. In particular, the inspection apparatus 1 is a reflection-type inspection apparatus that irradiates the inspection target F with an illumination light L 10 including a plurality of lights L 11 to L 14 , which have different polarization states from each other and different wavelengths from each other, performs a wavelength demultiplexing of a reflected light L 20 obtained from the inspection target F to generate lights L 21 to L 24 , separately receives the lights L 21 to L 24 , and inspects the quality of the film included in the inspection target F.

The inspection target F may include, for example, organic thin films. The organic thin film may include polarizing films used for organic thin film photovoltaic cells, organic EL displays, liquid crystal displays, and the like, and films used for devices such as RFID tags using organic semiconductors and films included in the devices. Hereinafter, the direction, which is perpendicular to the transfer direction X of the inspection target F and is included in the plane of the inspection target F, is referred to as the “width direction Y”.

The irradiator 10 includes a plurality of light sources 11 a to 11 d and a multiplexer 12 and is disposed above a first surface of the inspection target F. The irradiator 10 irradiates an inspection region R 1 defined on the inspection target F with the illumination light L 10 including the plurality of lights L 11 to L 14 , which have different polarization states from each other and different wavelengths from each other. The inspection region R 1 defined on the inspection target F is a rectangular region (two-dimensional region) having a first length in the transfer direction X and a second length in the width direction Y, each of which is, for example, in the range from about several centimeters to about several tens centimeters. The size of the inspection region R 1 is appropriately set based on the size of the inspection target F.

The light sources 11 a to 11 d respectively emit the lights L 11 to L 14 , which have different polarization states from each other and different wavelengths from each other. In particular, the light source 11 a emits a linear polarized light L 11 where the wavelength is λ 1 and the vibration direction of the electric field is 0°. The light source 11 b emits a linear polarized light L 12 where the wavelength is λ 2 and the vibration direction of the electric field is 45°. The light source 11 c emits a linear polarized light L 13 where the wavelength is λ 3 and the vibration direction of the electric field is 90°. The light source 11 d emits a linear polarized light L 14 where the wavelength is λ 4 and the vibration direction of the electric field is 135°.

The wavelengths of the lights L 11 to L 14 respectively emitted by the light sources 11 a to 11 d are appropriately set based on the optical characteristic and the configuration of the inspection target F. The wavelengths of the lights L 11 to L 14 may be in a visible region or in a region other than a visible region (for example, an infrared region). Each of the wavelengths of the lights L 11 to L 14 is required to be set so as to allow the light receiver 20 described below to perform the wavelength demultiplexing. In the first embodiment, the vibration direction of the electric field of each of the lights L 11 to L 14 is represented by an angle in a plane perpendicular to the moving direction of the lights L 11 to L 14 and a direction perpendicular to the incident plane of the inspection target F, into which the lights L 11 to L 14 enter, is defined as 0°. In other words, the direction perpendicular to the sheet of FIG. 1 is defined as 0°.

The multiplexer 12 includes, for example, a dichroic mirror (or prism) and multiplexes the lights L 11 to L 14 respectively emitted from the light sources 11 a to 11 d while maintaining each polarized wave state. The multiplexer 12 irradiates the inspection region R 1 defined on the inspection target F with the multiplexed light (illumination light L 10 ).

The light receiver 20 includes a demultiplexer 21 and a plurality of cameras 22 a to 22 d (imagers). Similarly to the irradiator 10 , the light receiver 20 is disposed above the first surface of the inspection target F. The light receiver 20 performs a wavelength demultiplexing of the reflected light L 20 obtained from the inspection target F to generate the lights L 21 to L 24 and separately receives the dispersed lights L 21 to L 24 . The L 21 to L 24 are respectively obtained from the lights L 11 to L 14 , which are incident on the inspection region R 1 defined on the inspection target F and are reflected by the inspection region R 1 .

Similarly to the multiplexer 12 included in the irradiator 10 , the demultiplexer 21 includes, for example, a dichroic mirror (or prism) and performs a wavelength demultiplexing of the reflected light L 20 to generate the lights L 21 to L 24 . The polarization states of the lights L 21 to L 24 obtained by the wavelength demultiplexing may be or may not be maintained equal to the states before the wavelength demultiplexing.

The cameras 22 a to 22 d are provided associated with the plurality of lights L 21 to L 24 , which are obtained by the wavelength demultiplexing using the demultiplexer 21 . The cameras 22 a to 22 d respectively images (receives) the lights L 21 to L 24 , which are obtained by the wavelength demultiplexing using the demultiplexer 21 . Each of the cameras 22 a to 22 d includes an imaging device such as a Charge Coupled Device (CCD) and a Complementary Metal Oxide Semiconductor (CMOS). The cameras 22 a to 22 d respectively output image signals G 1 to G 4 (light reception signals) according to the imaged images (the images indicating the luminance distributions of the lights L 21 to L 24 obtained from the inspection region R 1 ).

The processor 30 calculates an ellipse azimuth, a degree of polarization, and a polarization component intensity using the plurality of image signals G 1 to G 4 output from the light receiver 20 and determines whether the inspection target F is defective or non-defective. In particular, the processor 30 executes a processing for processing the image signals G 1 to G 4 to calculate luminance data I 1 to I 4 for each pixel (each pixel of the cameras 22 a to 22 d ), a processing for calculating Stokes parameters S (S 0 to S 2 ) for each pixel based on the luminance data I 1 to I 4 , and a processing for calculating an ellipse azimuth Ψ, a degree of polarization DoP, and a polarization component intensity IP for each pixel using the Stokes parameters S (S 0 to S 2 ). In other words, the processor 30 executes a processing for calculating the two-dimensional distribution of the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP in the inspection region R 1 defined on the inspection target F.

The above-stated luminance data I 1 indicates the luminance of the light L 21 , which is obtained by irradiating the inspection target F with the light L 11 , for each pixel. The light L 11 is a linear polarized light where the vibration direction of the electric field is 0°. The above-stated luminance data I 2 indicates the luminance of the light L 22 , which is obtained by irradiating the inspection target F with the light L 12 , for each pixel. The light L 12 is a linear polarized light where the vibration direction of the electric field is 45°. The above-stated luminance data I 3 indicates the luminance of the light L 23 , which is obtained by irradiating the inspection target F with the light L 13 , for each pixel. The light L 13 is a linear polarized light where the vibration direction of the electric field is 90°. The above-stated luminance data I 4 indicates the luminance of the light L 24 , which is obtained by irradiating the inspection target F with the light L 14 , for each pixel. The light L 14 is a linear polarized light where the vibration direction of the electric field is 135°.

The processor 30 calculates the Stokes parameters S (S 0 to S 2 ) for each pixel using the following equation (1), calculates the degree of polarization DoP for each pixel using the following equation (2), calculates the ellipse azimuth Ψ for each pixel using the following equation (3), and calculates the polarization component intensity IP for each pixel using the following equation (4).

As shown in FIG. 1 , the processor 30 includes a correction table TB. The correction table TB stores correction amount for correcting the variation in the intensity of each of the lights L 11 to L 14 respectively emitted from the light sources 11 a to 11 d , the variation in the characteristic of each of the cameras 22 a to 22 d (light-receiving characteristic), and the variation in the reflectance of the surface of the inspection target F according to the wavelengths of the lights L 11 to L 14 . The processor 30 corrects each variation described above using the correction amount stored in the correction table TB and then calculates the Stokes parameters S (S 0 to S 2 ), the degree of polarization DoP, the ellipse azimuth Ψ, and the polarization component intensity IP described above.

The processor 30 further includes an ellipse azimuth threshold value TH 1 (first threshold value), a degree of polarization threshold value TH 2 (second threshold value), and a polarization component intensity threshold value TH 3 (third threshold value). The ellipse azimuth threshold value TH 1 is defined for the ellipse azimuth Ψ calculated using the above-stated equation (3) so as to determine whether the inspection target F is defective or non-defective. The degree of polarization threshold value TH 2 is defined for the degree of polarization DoP calculated using the above-stated equation (2) so as to determine whether the inspection target F is defective or non-defective. The polarization component intensity threshold value TH 3 is defined for the polarization component intensity IP calculated using the above-stated equation (4) so as to determine whether the inspection target F is defective or non-defective.

If the ellipse azimuth Ψ calculated using the above-stated equation (3) is greater than the ellipse azimuth threshold value TH 1 , the degree of polarization DoP calculated using the above-stated equation (2) is greater than the degree of polarization threshold value TH 2 , and the polarization component intensity IP calculated using the above-stated equation (4) is greater than the polarization component intensity threshold value TH 3 , then the processor 30 determines that the inspection target F is defective. Alternatively, if any one (or any two) of the ellipse azimuth Ψ calculated using the above-stated equation (3), the degree of polarization DoP calculated using the above-stated equation (2), and the polarization component intensity IP calculated using the above-stated equation (4) is greater than the threshold value, then the processor 30 may determine that the inspection target F is defective.

Next, the operation of the inspection apparatus 1 having the above-stated configuration will be described. When the inspection is started, an unshown controller controls the irradiator 10 so that the light sources 11 a to 11 d emit the lights L 11 to L 14 , respectively. The lights L 11 to L 14 respectively emitted from the light sources 11 a to 11 d are incident on the multiplexer 12 and are multiplexed while maintaining each polarized wave state. The multiplexed light (illumination light L 10 ) is emitted from the multiplexer 12 and is incident on the inspection region R 1 defined on the inspection target F.

FIG. 2 is a diagram showing an example of a spectrum of an illumination light to be incident on the inspection target. Since the illumination light L 10 to be incident on the inspection target F is obtained by multiplexing the lights L 11 to L 14 respectively emitted from the light sources 11 a to 11 d , the spectrum of the illumination light L 10 has a waveform including peak wavelengths λ 1 to λ 4 as shown in FIG. 2 . The wavelengths λ 1 to λ 4 are aligned at a predetermined interval, for example, an interval of about 200 nm.

FIG. 3 is a diagram showing an example of polarization states of illumination lights to be incident on the inspection target and polarization states of reflected lights obtained from the inspection target. FIG. 3 shows the optical paths of the lights L 11 to L 14 included in the illumination light L 10 , the polarization states P 11 to P 14 of the lights L 11 to L 14 , the optical paths of the lights L 21 to L 24 included in the reflected light L 20 and the polarization states P 21 to P 24 of the lights L 21 to L 24 .

The polarization states P 11 to P 14 shown in FIG. 3 are represented along the direction in which the lights L 11 to L 14 advance, and the polarization states P 21 to P 24 are represented along the direction in which the lights L 21 to L 24 advance. The lights L 11 to L 14 included in the illumination light L 10 advance along the same optical path as each other and the lights L 21 to L 24 included in the reflected light L 20 advance along the same optical path as each other. In FIG. 3 , in order to facilitate the understanding, the optical paths of the lights L 11 to L 14 are shown separately from each other and the optical paths of the lights L 21 to L 24 are shown separately from each other.

As shown in FIG. 3 , each of the polarization states P 11 to P 14 of the lights L 11 to L 14 included in the illumination light L 10 is a linear polarization state. In particular, the light L 11 in the polarization state P 11 is a linear polarized light where the vibration direction of the electric field is 0° and the light L 12 in the polarization state P 12 is a linear polarized light where the vibration direction of the electric field is 45°. The light L 13 in the polarization state P 13 is a linear polarized light where the vibration direction of the electric field is 90° and the light L 14 in the polarization state P 14 is a linear polarized light where the vibration direction of the electric field is 135°. In other words, the lights L 11 to L 14 are incident on the inspection target F while the polarization states at the time when the lights L 11 to L 14 are respectively emitted from the light sources 11 a to 11 d are maintained.

On the other hand, each of the polarization states P 21 to P 24 of the lights L 21 to L 24 included in the reflected light L 20 is an elliptically polarization state. This is because the lights L 11 to L 14 included in the illumination light L 10 are incident on the inspection target F, thereby, each polarization state is changed. The changing of the polarization state of each of the lights L 21 to L 24 included in the reflected light L 20 is depending on the optical characteristic, the configuration, the quality of the film of the inspection target F, and the like.

The reflected light L 20 reflected from the inspection region R 1 defined on the inspection target F is incident on the light receiver 20 and is subjected to the wavelength demultiplexing using using the demultiplexer 21 included in the light receiver 20 to be divided into the lights L 21 to L 24 . The demultiplexed lights L 21 to L 24 are incident on the cameras 22 a to 22 d , respectively and are separately imaged. The cameras 22 a to 22 d inputs the image signals G 1 to G 4 according to the imaged images (the images indicating the luminance distributions of the lights L 21 to L 24 obtained from the inspection region R 1 ) into the processor 30 .

When the processor 30 receives the image signals G 1 to G 4 , the processor 30 firstly processes the image signals G 1 to G 4 to calculate the luminance data I 1 to I 4 , each of which indicates the luminance of each pixel (pixels included in each of the cameras 22 a to 22 d ). In this processing, each variation (the variation in the intensity of each of the lights L 11 to L 14 emitted from the light sources 11 a to 11 d , the variation in the characteristic of each of the cameras 22 a to 22 d (light-receiving characteristic), and the variation in the reflectance of the surface of the inspection target F according to the wavelengths of the lights L 11 to L 14 ) is corrected using the correction amount stored in the correction table TB.

Next, the processor 30 calculates the Stokes parameters S (S 0 to S 2 ) from the luminance data I 1 to I 4 and then calculates the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP for each pixel using the Stokes parameters S (S 0 to S 2 ). After the above-stated processing is finished, the processor 30 compares the calculated ellipse azimuth Ψ, the calculated degree of polarization DoP, and the calculated polarization component intensity IP with the ellipse azimuth threshold value TH 1 , the degree of polarization threshold value TH 2 , and the polarization component intensity threshold value TH 3 , respectively, and determines whether the inspection target F is defective or non-defective.

For example, if the calculated ellipse azimuth is greater than the ellipse azimuth threshold value TH 1 , the calculated degree of polarization DoP is greater than the degree of polarization threshold value TH 2 , and the calculated polarization component intensity IP is greater than the polarization component intensity threshold value TH 3 , then the processor 30 determines that the inspection target F is defective. On the other hand, if any one of the calculated ellipse azimuth Ψ, the calculated degree of polarization DoP, and the calculated polarization component intensity IP is not greater than the threshold value, then the processor 30 determines that the inspection target F is non-defective.

Such a result determined by the processor 30 is displayed on, for example, a display (not-shown) provided in the processor 30 or is reported via sound or the like. Alternatively, the result is transmitted to a host device (not-shown). The above-stated operations are repeated under the condition where the inspection target F is transferred in the transfer direction X, thereby, the quality of the film included in the inspection target F in the transfer direction X is continuously inspected in the range of the width of the inspection region R 1 in the width direction Y.

As described above, in the first embodiment, the illumination light L 10 including the plurality of lights L 11 to L 14 , which have different polarization states from each other and different wavelengths from each other, is incident on the inspection region R 1 defined on the inspection target F, the reflected light L 20 obtained from the inspection target F is subjected to the wavelength demultiplexing to be divided into the lights L 21 to L 24 and the lights L 21 to L 24 are separately imaged, the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP are calculated using the image signals G 1 to G 4 obtained by the above-stated imaging, and whether the inspection target F is defective or non-defective is determined. Therefore, even while the inspection target F is being moved, the quality of the film included in the inspection target F can be inspected accurately. Since, in the first embodiment, the image of the rectangular inspection region R 1 defined on the inspection target F is imaged by the cameras 22 a to 22 d , the quality of the film included in the inspection target F can be inspected even while the inspection target F is not being moved.

Second Embodiment

FIG. 4 is a block diagram showing main elements included in an inspection apparatus using polarized lights according to the second embodiment of the present invention. In FIG. 4 , blocks that correspond to those in FIG. 1 are assigned the same reference numerals. An inspection apparatus 2 using polarized lights shown in FIG. 4 is different from the inspection apparatus 1 shown in FIG. 1 in that a line-shaped inspection region R 2 (one-dimensional region) extending in the width direction Y is defined on the inspection target F and single camera 22 , which is similarly to each of the cameras 22 a to 22 d shown in FIG. 1 , is provided instead of the cameras 22 a to 22 d.

In the inspection apparatus 1 shown in FIG. 1 , the rectangular inspection region R 1 is defined on the inspection target F, the lights L 21 to L 24 , which are included in the reflected light L 20 reflected from the inspection region R 1 , are imaged by the cameras 22 a to 22 d , respectively. However, if, for example, the inspection target F is manufactured by a continuous manufacture process referred to as a roll-to-roll process, then the inspection target F is transferred in the transfer direction X at a constant rate. Therefore, it is not always necessary to image the image of the rectangular inspection region R 1 using the cameras 22 a to 22 d . In the inspection apparatus 2 according to the second embodiment, the line-shaped inspection region R 2 is defined on the inspection target F, and the number of cameras is reduced so as to simplify the configuration. Thereby, the cost is reduced and the problem of alignment caused by the mis-registration among the cameras is resolved.

In the second embodiment, since the line-shaped inspection region R 2 is defined on the inspection target F, a multiplexer 12 included in an irradiator 10 is configured to irradiate the inspection region R 2 with a line-shaped illumination light L 10 . In addition, in the second embodiment, since it is necessary to image lights L 21 to L 24 included in a line-shaped reflected light L 20 by the single camera 22 , a demultiplexer 21 and the camera 22 , which are included in a light receiver 20 , are configured as shown in FIG. 5 .

FIG. 5 is a diagram showing a correlation between a demultiplexer and a camera according to the second embodiment of the present invention. As shown in FIG. 5 , the demultiplexer 21 and the camera 22 are configured so that the lights L 21 to L 24 emitted from the demultiplexer 21 are incident on an imaging plane Q of the camera 22 under the condition where the lights L 21 to L 24 are not superimposed on each other and are spacially separated from each other. In other words, the lights L 21 to L 24 emitted from the demultiplexer 21 are incident on different regions in the imaging plane Q from each other and the camera 22 separately image (receive) the lights L 21 to L 24 . If the intervals among the lights L 21 to L 24 to be incident on the imaging plane Q are narrow, then an image G output from the camera 22 will be an image reflected by the interferences among the lights L 21 to L 24 . Therefore, the interval between the lights L 21 to L 24 to be incident on the imaging plane Q is set to have a spacial allowance (for example, the interval equal to about several tens to about one hundred pixels of the camera 22 ).

Next, a specific configuration of the inspection apparatus according to the second embodiment of the present invention will be described. FIG. 6 is a diagram showing a specific configuration example of the inspection apparatus according to the second embodiment of the present invention. In FIG. 6 , blocks that correspond to those in FIG. 4 are assigned the same reference numerals. Similarly to FIG. 3 , the optical paths of the lights L 11 to L 14 included in the illumination light L 10 are shown separately from each other and the optical paths of the lights L 21 to L 24 included in the reflected light L 20 are shown separately from each other.

As shown in FIG. 6 , each of light sources 11 a to 11 d included in the irradiator 10 includes a light, a polarizer, and a lens. In particular, the light source 11 a includes a light 41 a , a polarizer 42 a and a lens 43 a , the light source 11 b includes a light 41 b , a polarizer 42 b , and a lens 43 b . Similarly, the light source 11 c includes a light 41 c , a polarizer 42 c , and a lens 43 c and the light source 11 d includes a light 41 d , a polarizer 42 d , and a lens 43 d.

Each of the lights 41 a to 41 d includes, for example, a Light Emitting Diode (LED), a Laser Diode (LD), or the like. The light 41 a emits a light having a wavelength λ 1 , the light 41 b emits a light having a wavelength λ 2 , the light 41 c emits a light having a wavelength λ 3 , and the light 41 d emits a light having a wavelength λ 4 . The polarization state of each of the lights emitted from the lights 41 a to 41 d may be one of a circular polarization state, an elliptic polarization state, and a random state. The polarizer 42 a changes the polarization state of the light, which is emitted from the light 41 a and has the wavelength λ 1 , to a linear polarization state where the vibration direction of the electric field is 0°. The polarizer 42 b changes the polarization state of the light, which is emitted from the light 41 b and has the wavelength λ 2 , to a linear polarization state where the vibration direction of the electric field is 45°. The polarizer 42 c changes the polarization state of the light, which is emitted from the light 41 c and has the wavelength λ 3 , to a linear polarization state where the vibration direction of the electric field is 90°. The polarizer 42 d changes the polarization state of the light, which is emitted from the light 41 d and has the wavelength λ 4 , to a linear polarization state where the vibration direction of the electric field is 135°. The lens 43 a is provided so as to focus the light emitted from the polarizer 42 a on the line-shaped inspection region R 2 defined on the inspection target F, the lens 43 b is provided so as to focus the light emitted from the polarizer 42 b on the line-shaped inspection region R 2 , the lens 43 c is provided so as to focus the light emitted from the polarizer 42 c on the line-shaped inspection region R 2 , and the lens 43 d is provided so as to focus the light emitted from the polarizer 42 d on the line-shaped inspection region R 2 .

The multiplexer 12 included in the irradiator 10 includes three dichroic mirrors 12 a to 12 c . The dichroic mirror 12 a has a characteristic to transmit a light, which has a wavelength λ 1 , and to reflect a light, which has a wavelength λ 2 . The dichroic mirror 12 b has a characteristic to transmit a light, which has a wavelength λ 1 or λ 2 , and to reflect a light, which has a wavelength λ 3 . The dichroic mirror 12 c has a characteristic to transmit a light, which has one of wavelengths λ 1 , λ 2 , and λ 3 , and to reflect a light, which has a wavelength λ 4 . The dichroic mirrors 12 a to 12 c are sequentially arranged in a row along the optical path of the illumination light L 10 . The dichroic mirrors 12 a to 12 c multiplex the lights L 11 to L 14 respectively emitted from the light sources 11 a to 11 d while maintaining each polarized wave state.

FIG. 7 is a diagram showing another specific configuration example of the inspection apparatus according to the second embodiment of the present invention. An inspection apparatus 2 using polarized lights shown in FIG. 7 has a configuration where the light sources 11 a to 11 d provided in the inspection apparatus 2 shown in FIG. 6 are changed. In particular, in FIG. 7 , the polarizers 42 a to 42 d provided in the light sources 11 a to 11 d shown in FIG. 6 are omitted, and lights 51 a to 51 d are provided instead of the lights 41 a to 41 d.

Each of the lights 51 a to 51 d includes an LD for emitting a laser where the polarization state is a linear polarization state. In particular, the light 51 a emits a linear polarized light where the wavelength is λ 1 and the vibration direction of the electric field is 0° and the light 51 b emits a linear polarized light where the wavelength is λ 2 and the vibration direction of the electric field is 45°. The light 51 c emits a linear polarized light where the wavelength is λ 3 and the vibration direction of the electric field is 90° and the light 51 d emits a linear polarized light where the wavelength is λ 4 and the vibration direction of the electric field is 135°. In the inspection apparatus 2 shown in FIG. 7 , the polarizers 42 a to 42 d can be omitted. Therefore, compared to the inspection apparatus 2 shown in FIG. 6 , the inspection apparatus 2 shown in FIG. 7 has the simplified configuration.

Next, the operation of the inspection apparatus 2 having the above-stated configuration will be described. Since the operation of the inspection apparatus 2 is basically similar to that of the inspection apparatus 1 shown in FIG. 1 , hereinafter, the description of the operation is simplified. When the inspection is started, an unshown controller controls the irradiator 10 so that the light sources 11 a to 11 d emit the lights L 11 to L 14 , respectively. The lights L 11 to L 14 are multiplexed by the multiplexer 12 while maintaining each polarization state. The multiplexed light (illumination light L 10 ) is incident on the line-shaped inspection region R 2 defined on the inspection target F.

When the illumination light L 10 is incident on the inspection region R 2 , a line-shaped reflected light L 20 is obtained from the inspection target F. The reflected light L 20 is subjected to a wavelength demultiplexing using the demultiplexer 21 provided in the light receiver 20 to be divided into line-shaped lights L 21 to L 24 . As shown in FIG. 5 , the demultiplexed line-shaped lights L 21 to L 24 are incident on the imaging plane Q included in the camera 22 and imaged. The camera 22 outputs an image signal G according to the lights L 21 to L 24 .

When a processor 30 receives the image signal G from the camera 22 , the processor 30 firstly divides the image signal G into four image signals, which indicate four images of the lights L 21 to L 24 , respectively. The processor 30 processes each divided image signal to calculate luminance data I 1 to I 4 , each of which indicates the luminance for each pixel. Similarly to the first embodiment, a correction processing using the correction amount stored in the correction table TB is executed.

After the above-stated processing is finished, similarly to the first embodiment, the processor 30 calculates Stokes parameters S (S 0 to S 2 ) for each pixel from the luminance data I 1 to I 4 and then calculates an ellipse azimuth Ψ, a degree of polarization DoP, and a polarization component intensity IP for each pixel using the Stokes parameters S (S 0 to S 2 ). The processor 30 compares the calculated ellipse azimuth Ψ, the calculated degree of polarization DoP, and the calculated polarization component intensity IP with an ellipse azimuth threshold value TH 1 , a degree of polarization threshold value TH 2 , and a polarization component intensity threshold value TH 3 , respectively, and determines whether the inspection target F is defective or non-defective. The above-stated operations are repeated under the condition where the inspection target F is transferred in the transfer direction X, thereby, the quality of the film included in the inspection target F in the transfer direction X is continuously inspected in the range of the width of the inspection region R 2 in the width direction Y.

As described above, in the second embodiment, the illumination light L 10 including the plurality of lights L 11 to L 14 , which have different polarization states from each other and different wavelengths from each other, is incident on the line-shaped inspection region R 2 defined on the inspection target F, the reflected light L 20 obtained from the inspection target F is subjected to the wavelength demultiplexing to be divided into the lights L 21 to L 24 and the lights L 21 to L 24 are separately imaged by the single camera 22 , the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP are calculated using the image signals G obtained by the above-stated imaging, and whether the inspection target F is defective or non-defective is determined. Therefore, even while the inspection target F is being moved, the quality of the film included in the inspection target F can be inspected accurately.

Although the foregoing has been a description of inspection apparatuses using polarized lights according to several embodiments of the present invention, the present invention is not limited to the embodiments, and can be freely modified within the scope of the present invention. For example, although the above-described embodiment has been described for an example in which the processor 30 calculates the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP and determines whether the inspection target F is defective or non-defective, it is not always necessary to calculate the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP. The processor 30 may calculate any one (or any two) of the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP and determine whether the inspection target F is defective or non-defective.

In addition, the above-stated first embodiment has been described for an example in which the processor 30 calculates the two-dimensional distribution of each of the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP in the inspection region R 1 defined on the inspection target F. However, it is not always necessary to calculate the two-dimensional distribution of each of the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP. For example, the processor 30 may calculate only a representative value of each of the ellipse azimuth Ψ, the degree of polarization DoP, and the polarization component intensity IP.

In addition, in the above-stated first embodiment, the lights L 21 to L 24 , which have been demultiplexed by the demultiplexer 21 , are imaged by the cameras 22 a to 22 d , respectively, but the lights L 21 to L 24 may be imaged by single camera in a similar way to the second embodiment. For example, by providing four shutters (shutters associated with the lights L 21 to L 24 ) between the demultiplexer 21 and the camera and making the lights L 21 to L 24 , which have been demultiplexed by the demultiplexer 21 , sequentially enter the camera, the lights L 21 to L 24 can be separately imaged by single camera.

In addition, the above-described embodiment has been described for an example in which the four light sources 11 a to 11 d are provided in the irradiator 10 . However, the number of light sources provided in the irradiator 10 may be equal to two or three or may be equal to or greater than five.

Each of the inspection apparatuses 1 and 2 described in the above-stated embodiments is a reflection-type inspection apparatus, which is configured to receive the reflected light L 20 obtained from the inspection target F and to inspect the quality of the film included in the inspection target F. However, the present invention is also applicable to a transmission-type inspection apparatus, which is configured to receive a transmitted light transmitting through the inspection target F and to inspect the quality of the film included in the inspection target F. FIG. 8 is a block diagram schematically showing a configuration of a transmission-type inspection apparatus using polarized lights. An inspection apparatus 3 using polarized lights shown in FIG. 8 includes an irradiator 10 disposed above a first surface of an inspection target F (above an inspection region) and a light receiver 20 disposed below a second surface of the inspection target F opposite to the first surface. A processor 30 may be disposed above the first surface of the inspection target F or may be disposed below the second surface of the inspection target F.

In the inspection apparatus 3 , an illumination light L 10 including a plurality of lights, which have different polarization states from each other and different wavelengths from each other, is incident on an inspection region R defined on the inspection target F, a transmitted light obtained from the inspection target F is subjected to a wavelength demultiplexing and the demultiplexed lights are separately imaged, an ellipse azimuth Ψ, a degree of polarization DoP, and a polarization component intensity IP are calculated using image signals obtained by the above-stated imaging, and whether the inspection target F is defective or non-defective is determined. The inspection region R may be the rectangular inspection region R 1 or may be the line-shaped inspection region R 2 .

In addition, the present invention is also applicable to an inspection apparatus using polarized lights, which combines the above-stated reflection-type inspection apparatus and the above-stated transmission-type inspection apparatus. Such an inspection apparatus includes, for example, an irradiator 10 disposed above a first surface of an inspection target F, a first light receiver 20 disposed above the first surface of the inspection target F, and a second light receiver 20 disposed below a second surface of the inspection target F opposite to the first surface.