Solar cell

This application claims priority from prior Japanese Patent Applications No. 2013-196963, filed on Sep. 24, 2013, entitled “SOLAR CELL”, the entire contents of which are incorporated herein by reference.

1. Field of the Invention

This disclosure relates to a back contact solar cell.

2. Description of the Related Art

As a solar cell with higher power generation efficiency, a proposal has been made for a so-called back contact solar cell, which includes p-type, and n-type regions formed in its rear surface (for example, Japanese Patent Application Publication No. 2012-33666). No electrodes have to be provided on a light-receiving side of the back contact solar cell. For this reason, its light-receiving efficiency can be improved.

A solar cell module is formed by connecting a plurality of solar cells together. It has been known that a phenomenon of heat generation by some solar cells (a hot spot phenomenon) happens to the solar cell module when: the solar cells are hindered from receiving light by being shadowed by objects; and accordingly, the total amount of voltage generated by the other solar cells is reversely applied to the former solar cells (for example, Japanese Patent Application Publication No. 2013-33832).

One aspect of the invention provides a solar cell, which is capable of inhibiting the occurrence of the hot spot phenomenon.

A solar cell of an embodiment includes a semiconductor substrate of first conductivity type, including first and second principal surfaces; a region of the first conductivity type, including a semiconductor layer structure of the first conductivity type provided on the first principal surface; and a region of an second conductivity type, including a semiconductor layer structure of the second conductivity type provided on the first principal surface. Here, the semiconductor layer structure of the first conductivity type is formed extending into the region of the second conductivity type, and thereby the solar cell is provided with a stack region where the semiconductor layer structure of the second conductivity type is formed on the semiconductor layer structure of the first conductivity type.

The embodiments above are capable of inhibiting the occurrence of the hot spot phenomenon.

FIG. 1 is a schematic plan view of a solar cell of a first embodiment.

FIG. 2 is a schematic cross-sectional view illustrating a partially-magnified part of the solar cell taken along the II-II line of FIG. 1 .

FIG. 3 is a schematic plan view illustrating stack regions in the first embodiment.

FIG. 4 is a schematic cross-sectional view for explaining manufacturing steps for the solar cell of the first embodiment.

FIG. 5 is another schematic cross-sectional view for explaining the manufacturing steps for the solar cell of the first embodiment.

FIG. 6 is another schematic cross-sectional view for explaining the manufacturing steps for the solar cell of the first embodiment.

FIG. 7 is another schematic cross-sectional view for explaining the manufacturing steps for the solar cell of the first embodiment.

FIG. 8 is another schematic cross-sectional view for explaining the manufacturing steps for the solar cell of the first embodiment.

FIG. 9 is another schematic cross-sectional view for explaining the manufacturing steps for the solar cell of the first embodiment.

FIG. 10 is another schematic cross-sectional view for explaining the manufacturing steps for the solar cell of the first embodiment.

FIG. 11 is another schematic cross-sectional view for explaining the manufacturing steps for the solar cell of the first embodiment.

FIG. 12 is a schematic plan view illustrating stack regions in a second embodiment.

FIG. 13 is a schematic cross-sectional view illustrating a cross section of n-type regions R 1 and p-type region R 2 taken along the XIII-XIII line of FIG. 12 .

FIG. 14 is a schematic plan view illustrating a stack region in a third embodiment.

FIG. 15 is a schematic cross-sectional view illustrating a cross section of n-type region R 1 and p-type regions R 2 a , R 2 b in a fourth embodiment.

Embodiments are described below. It is to be noted, however, that the following embodiments are mere examples and the invention is not limited only to the embodiments. In the drawings, components having virtually the same functions may be referred to by using the same reference numerals when appropriate.

First Embodiment

FIG. 1 is a schematic plan view of a solar cell of a first embodiment. FIG. 2 is a schematic cross-sectional view illustrating a partially-magnified cross section of the solar cell taken along the II-II line of FIG. 1 .

Solar cell 1 is a back contact solar cell. FIG. 1 illustrates the rear surface of solar cell 1 . As illustrated in FIG. 2 , solar cell 1 includes semiconductor substrate 10 . Semiconductor substrate 10 includes light-receiving surface 10 a as a second principal surface, and rear surface 10 b as a first principal surface. Semiconductor substrate 10 generates carriers when receiving light 11 by use of light-receiving surface 10 a . Here, the carriers are holes and electrons, which are generated when the light is absorbed into semiconductor substrate 10 .

Semiconductor substrate 10 is made of a crystalline semiconductor substrate whose conductivity type is n-type or p-type. Concrete examples of the crystalline semiconductor substrate include crystalline silicon substrates such as a monocrystalline silicon substrate and a polycrystalline silicon substrate. It should be noted that the semiconductor substrate may be made of a semiconductor substrate other than the crystalline semiconductor substrate. For example, a compound semiconductor substrate made of GaAs, InP or the like may be used in lieu of semiconductor substrate 10 . The embodiment is hereinbelow described by citing an example where semiconductor substrate 10 is made of a crystalline silicon substrate whose conductivity type is the n-type, one of the conductivity types.

Intrinsic amorphous semiconductor (intrinsic semiconductor is hereinafter referred to as “i-type semiconductor”) is used to make i-type amorphous semiconductor layer 17 i . I-type amorphous semiconductor layer 17 i is formed on light-receiving surface 10 a of semiconductor substrate 10 . To put it concretely, in the embodiment, i-type amorphous semiconductor layer 17 i is made of i-type amorphous silicon including hydrogen. No specific restriction is imposed on the thickness of i-type amorphous semiconductor layer 17 i , as long as the thickness makes virtually no contribution to power generation. The thickness of i-type amorphous semiconductor layer 17 i may be set in a range of several nanometers to about 25 nanometers, for example.

It should be noted that the “amorphous semiconductor” of the embodiment includes microcrystalline semiconductor. The microcrystalline semiconductor is semiconductor in which semiconductor crystals are deposited in the amorphous semiconductor.

N-type amorphous semiconductor layer 17 n whose conductivity type is the same as that of semiconductor substrate 10 is formed on i-type amorphous semiconductor layer 17 i . N-type amorphous semiconductor layer 17 n is an amorphous semiconductor layer which is doped with an n-type dopant, and whose conductivity type is the n-type. To put it concretely, n-type amorphous semiconductor layer 17 n is made of n-type amorphous silicon including hydrogen in the embodiment. No specific restriction is imposed on the thickness of n-type amorphous semiconductor layer 17 n . The thickness of n-type amorphous semiconductor layer 17 n may be set in a range of approximately 2 nanometers to 50 nanometers, for example.

Insulating layer 16 , which exerts both a function as an antireflective film and a function as a protection film is formed on n-type amorphous semiconductor layer 17 n . Insulating layer 16 may be made of silicon oxide, silicon nitride, or silicon oxynitride, for example. The thickness of insulating layer 16 may be set as needed depending on the antireflective characteristics given to the antireflective film. The thickness of insulating film 16 may be set in a range of approximately 80 nanometers to 1000 nanometers, for example.

The stacked structure including i-type amorphous semiconductor layer 17 i , n-type amorphous semiconductor layer 17 n and insulating layer 16 exerts a function as a passivation layer for semiconductor substrate 10 and a function as an antireflective film.

N-type semiconductor stacked structure 12 whose conductivity type is the n-type, the first conductivity type, and semiconductor stacked structure 13 whose conductivity is the p-type, the opposite conductivity type to the first conductivity type (second conductivity type), are formed on rear surface 10 b of semiconductor substrate 10 . N-type regions R 1 , regions having the first conductivity type, include n-type semiconductor stacked structure 12 . P-type regions R 2 , regions having the second conductivity type, include p-type semiconductor stacked structure 13 . As illustrated in FIG. 1 , n-type regions R 1 and p-type regions R 2 are shaped like comb teeth and interdigitate each other. Thereby, n-type regions R 1 and p-type regions R 2 are alternated on rear surface 10 b in a direction x perpendicular to an intersecting width direction y. Insulating region R 3 is formed between n-type regions R 1 and p-type regions R 2 . As illustrated in FIG. 1 , insulating region R 3 is formed in such a manner as to extend in the y direction, then to be folded back, and then to extend in the reverse y direction.

N-type semiconductor stacked structure 12 is formed from a stacked body including i-type amorphous semiconductor layer 12 i as a first intrinsic semiconductor layer, formed on rear surface 10 b ; and n-type amorphous semiconductor layer 12 n formed on i-type amorphous semiconductor layer 12 i . Like i-type amorphous semiconductor layer 17 i described above, i-type amorphous semiconductor layer 12 i is made of amorphous silicon including hydrogen. No specific restriction is imposed on the thickness of i-type amorphous semiconductor layer 12 i , as long as the thickness makes virtually no contribution to power generation. The thickness of i-type amorphous semiconductor layer 12 i may be set in a range of several nanometers to about 25 nanometers, for example.

Like n-type amorphous semiconductor layer 17 n , n-type amorphous semiconductor layer 12 n is doped with an n-type dopant and has the conductivity type of the n-type like semiconductor substrate 10 . To put it concretely, in the embodiment, n-type amorphous semiconductor layer 12 n is made of n-type amorphous silicon including hydrogen. No specific restriction is imposed on the thickness of n-type amorphous semiconductor layer 12 n . The thickness of n-type amorphous semiconductor layer 12 n may be set in a range of approximately 2 nanometers to 50 nanometers, for example.

Insulating layer 18 is formed on the two end portions, excluding the center portion, of n-type semiconductor stacked structure 12 in the direction x. The center portion of n-type semiconductor stacked structure 12 in the direction x is exposed through insulating layer 18 . No specific restriction is imposed on the material of insulating layer 18 . Insulating layer 18 may be made of silicon oxide, silicon nitride, or silicon oxynitride, for example. It is desirable that insulating layer 18 be made of silicon nitride in particular. Furthermore, it is desirable that insulating layer 18 includes hydrogen.

P-type semiconductor stacked structure 13 is formed on portions of rear surface 10 b , which are exposed through n-type semiconductor stacked structure 12 , and end portions of insulating layer 18 . P-type semiconductor stacked structure 13 is formed from a stacked body including i-type amorphous semiconductor layer, 13 i as a second intrinsic semiconductor layer, formed on rear surface 10 b ; and p-type amorphous semiconductor layer 13 p formed on i-type amorphous semiconductor layer 13 i.

I-type amorphous semiconductor layer 13 i is made of amorphous silicon including hydrogen. No specific restriction is imposed on the thickness of i-type amorphous semiconductor layer 13 i , as long as the thickness makes virtually no contribution to power generation. The thickness of i-type amorphous semiconductor layer 13 i may be set in a range of several nanometers to about 25 nanometers, for example.

P-type amorphous semiconductor layer 13 p is an amorphous semiconductor layer which is doped with a p-type dopant, and whose conductivity type is the p-type. To put it concretely, in the embodiment, p-type amorphous semiconductor layer 13 p is made of p-type amorphous silicon including hydrogen. No specific restriction is imposed on the thickness of p-type amorphous semiconductor layer 13 p . The thickness of p-type amorphous semiconductor layer 13 p may be set in a range of approximately 2 nanometers to 50 nanometers, for example.

In the embodiment, i-type amorphous semiconductor layer 13 i with the thickness, which makes virtually no contribution to the power generation is provided between crystalline semiconductor substrate 10 and p-type amorphous semiconductor layer 13 p . When like in the embodiment, i-type amorphous semiconductor layer 13 i is provided between n-type semiconductor substrate 10 and p-type amorphous semiconductor layer 13 p , it is possible to inhibit recombination of minority carriers in the junction interface between semiconductor substrate 10 and p-type semiconductor stacked structure 13 . Consequently, the photoelectric conversion efficiency can be improved.

It is desirable that amorphous semiconductor layers 17 i , 17 n , 12 i , 12 n , 13 i , 13 p include hydrogen in order to enhance the passivation quality.

N-side electrode 14 as an electrode for the first conductivity type configured to collect electrons is formed on n-type amorphous semiconductor layer 12 n . On the other hand, p-side electrode 15 as an electrode for the second conductivity type configured to collect holes is formed on p-type amorphous semiconductor layer 13 p . P-side electrode 15 and n-side electrode 14 are electrically insulated from each other with insulating region R 3 interposed in between.

As described above, n-type regions R 1 and p-type regions R 2 are shaped like comb teeth in the embodiment. Accordingly, as illustrated in FIG. 1 , n-side electrode 14 includes bus bar 14 A and a plurality of fingers 14 B, while p-side electrode 15 includes bus bar 15 A and a plurality of fingers 15 B. Instead, however, each of n- and p-side electrodes 14 , 15 may be a bus bar-less electrode including only a plurality of fingers with no bus bars.

No specific restriction is imposed on either n-side electrode 14 or p-side electrode 15 , as long as the electrodes 14 , 15 are capable of collecting carriers. In the embodiment, n- and p-side electrodes 14 , 15 are each formed from a stacked body including first to fourth conductive layers 19 a to 19 d.

First conductive layer 19 a may be made of, for example, a TCO (Transparent Conductive Oxide) such as ITO (indium tin oxide). To put it concretely, in the embodiment, first conductive layer 19 a is made of ITO. The thickness of first conductive layer 19 a may be set in a range of approximately 50 nanometers to 100 nanometers, for example. It should be noted that first conductive layer 19 a may be formed by use of a thin-film forming method such as sputtering or CVD (Chemical Vapor Deposition).

Second to fourth conductive layers 19 b to 19 d may be made of a metal such as Cu, or its alloy. To put it concretely, in the embodiment, second and third conductive layers 19 b , 19 c are each made of Cu. Fourth conductive layer 19 d is made of Sn. The thicknesses of second to fourth conductive layers 19 b to 19 d may be set, for example, in a range of approximately 50 nanometers to 1000 nanometers, in a range of approximately 10 micrometers to 20 micrometers, and in a range of approximately 1 micrometer to 5 micrometers, respectively.

In the embodiment, of first to fourth conductive layers 19 a to 19 d , second conductive layer 19 b forms a seed layer. In this respect, the “seed layer” means a layer from which plating growth originates. In general, the seed layer is made of a metal or an alloy. As the seed layer, second conductive layer 19 b may be formed by use of a thin-film forming method other than plating, such as sputtering, vapor deposition, printing or ink-jetting.

In the embodiment, third and fourth conductive layers 19 c , 19 d are each formed by electroplating.

(Stack Region R 4 )

As illustrated in FIG. 2 , n-type semiconductor stacked structures 12 are each formed extending to p-type regions R 2 . To put it concretely, n-type semiconductor stacked structure 12 is formed projecting beyond p-type region R 2 -side end portion 18 a of insulating layer 18 further into p-type region R 2 . For this reason, stack region R 4 in which p-type semiconductor stacked structure 13 is formed directly on n-type semiconductor stacked structure 12 is formed in each of the two end portions of p-type region R 2 . In the stack region R 4 , n-type semiconductor stacked structure 12 and p-type semiconductor stacked structure 13 are stacked on n-type semiconductor substrate 10 in this sequence. Accordingly, the p/i/n/i/n semiconductor stacked structure is formed in stack region R 4 .

The p/i/n/i/n semiconductor stacked structure has nonlinear IV characteristics. When a reverse bias voltage of several volts is applied to it, the p/i/n/i/n semiconductor stacked structure yields, and turns into a current leak path. Accordingly, when a reverse bias voltage to trigger the hot spot phenomenon is applied to solar cell 1 , the p/i/n/i/n semiconductor stacked structure serves as a current leak path, and is capable of inhibiting the occurrence of the hot spot phenomenon.

In the embodiment, the p/i/n/i/n semiconductor stacked structure is presented as the semiconductor stacked structure to be formed in stack region R 4 . However, the semiconductor stacked structure to be formed in stack region R 4 is not limited to this. Instead, an n/i/p/i/p semiconductor stacked structure, for example, may be formed in stack region R 4 by stacking a p-type semiconductor stacked structure and an n-type semiconductor stacked structure on a p-type semiconductor substrate in this sequence. The n/i/p/i/p semiconductor stacked structure has nonlinear IV characteristics, too. For this reason, when a reverse bias voltage of several volts is applied to it, the n/i/p/i/p semiconductor stacked structure yields, and turns into a current leak path. Accordingly, when a reverse bias voltage to trigger the hot spot phenomenon is applied to the solar cell, the n/i/p/i/p semiconductor stacked structure serves as a current leak path, and is capable of inhibiting the occurrence of the hot spot phenomenon.

In the embodiment, presented as the example of the semiconductor stacked structure having the first conductivity type is the semiconductor stacked structure having the first conductivity type (n-type semiconductor stacked structure 12 ) including the first intrinsic semiconductor layer (i-type amorphous semiconductor layer 12 i ) provided on first principal surface 10 b , and the semiconductor layer having the first conductivity type (n-type amorphous semiconductor layer 12 n ) provided on the first intrinsic semiconductor layer (i-type amorphous semiconductor layer 12 i ). Furthermore, presented as the example of the semiconductor stacked structure having the second conductivity type is the semiconductor stacked structure having the second conductivity type (p-type semiconductor stacked structure 13 ) including the second intrinsic semiconductor layer (i-type amorphous semiconductor layer 13 i ) provided on first principal surface 10 b , and the semiconductor layer having the second conductivity type (p-type amorphous semiconductor layer 13 p ) provided on the second intrinsic semiconductor layer (i-type amorphous semiconductor layer 13 i ).

However, neither the “semiconductor stacked structure having the first conductivity type” nor the “semiconductor stacked structure having the second conductivity type” in the invention is limited to the above examples. For example, the semiconductor stacked structure having the first conductivity type may be formed from only a semiconductor layer having the first conductivity type, while the semiconductor stacked structure having the second conductivity type may be formed from only a semiconductor layer having the second conductivity type. Accordingly, neither the first intrinsic semiconductor layer nor the second intrinsic semiconductor layer has to be provided to the semiconductor stacked structure having the first conductivity type or the semiconductor stacked structure having the second conductivity type. In this case, therefore, the stack region may have either a p/n/n semiconductor stacked structure or an n/p/p semiconductor stacked structure.

FIG. 3 is a schematic plan view of stack regions in the first embodiment. As illustrated in FIG. 3 , in the embodiment, n-type region R 1 , the region having the first conductivity type, and p-type regions R 2 , the regions having the second conductivity type, are formed extending in a first direction (the y direction). In addition, insulating layer 18 and insulating region R 3 are formed extending in the first direction (the y direction), too. As illustrated in FIG. 1 , in turn region R 5 , insulating region R 3 is formed extending once in the x direction and then extending in the reverse y direction. Accordingly, in turn region R 5 , stack region R 4 is formed in a way to extend in the direction (the x direction) intersecting the first direction (the y direction).

In a plan view, as illustrated in FIG. 3 , each stack region R 4 is formed outside end portion 18 a of insulating layer 18 (inside p-type region R 2 ). It is desirable that the width of stack region R 4 in a direction (for example, the x direction in FIG. 3 ) perpendicular to the longitudinal direction (for example, the y direction in FIG. 3 ) be set in a range of 1 micrometer to 100 micrometers. More desirably, the width thereof is set in a range of 3 micrometers to 30 micrometers.

(Method of Manufacturing Solar Cell)

Referring to FIGS. 4 to 11 , descriptions are hereinbelow provided for a method of manufacturing solar cell 1 of the embodiment.

To begin with, semiconductor substrate 10 is prepared. Thereafter, as illustrated in FIG. 4 , i-type amorphous semiconductor layer 17 i and n-type amorphous semiconductor layer 17 n are formed on light-receiving surface 10 a of semiconductor substrate 10 , as well as i-type amorphous semiconductor layer 21 and n-type amorphous semiconductor layer 22 are formed on rear surface 10 b . No specific restriction is imposed on how to form i-type amorphous semiconductor layers 17 i , 21 and n-type amorphous semiconductor layers 17 n , 22 . i-type amorphous semiconductor layers 17 i , 21 and n-type amorphous semiconductor layers 17 n , 22 may be each formed by, for example, CVD (Chemical Vapor Deposition) such as plasma CVD.

Subsequently, as illustrated in FIG. 5 , insulating layer 16 is formed on n-type amorphous semiconductor layer 17 n , and insulating layer 23 is formed on n-type amorphous semiconductor layer 22 . Here, no specific restriction is imposed on how to form insulating layers 16 , 23 . Insulating layers 16 , 23 may be formed by, for example, a thin-film forming method such as sputtering or CVD.

Next, as illustrated in FIG. 6 , a part of insulating layer is removed by etching insulating layer 23 . To put it concretely, a part located on a region through which the p-type semiconductor layer is joined to semiconductor substrate 10 in a subsequent step is removed from insulating layer 23 . Here, insulating layer 23 may be etched with, for example, an acidic etchant such as a HF aqueous solution when insulating layer 23 is made of silicon oxide, silicon nitride or silicon oxynitride.

Thereafter, as illustrated in FIG. 7 , by using patterned insulating layer 23 as a mask, i-type amorphous semiconductor layer 21 and n-type amorphous semiconductor layer 22 are etched with an alkaline etchant. Thereby, parts of i-type amorphous semiconductor layer 21 and n-type amorphous semiconductor layer 22 , except for their parts covered with insulating layer 23 , are removed. By this, part of rear surface 10 b , above which no insulating layer 23 is located, is exposed. In addition, i-type amorphous semiconductor layer 12 i and n-type amorphous semiconductor layer 12 n (see FIG. 2 ) are formed from semiconductor layers 21 , 22 , respectively.

Here, in the embodiment, as described above, insulating layer 23 is made of silicon oxide, silicon nitride or silicon oxynitride. For this reason, the etching rate at which insulating layer 23 is etched with the acidic etchant is high whereas the etching rate at which insulting layer 23 is etched with the alkaline etchant is low. On the other hand, semiconductor layers 21 , 22 are made of the amorphous silicon. For this reason, the etching rate at which semiconductor layers 21 , 22 are etched with the acidic etchant is low whereas the etching rate at which semiconductor layers 21 , 22 are etched with the alkaline etchant is high. Accordingly, insulating layer 23 is etched with the acidic etchant which is used in the step illustrated in FIG. 6 , while semiconductor layers 21 , 22 are virtually not etched with the acidic etchant. On the other hand, semiconductor layers 21 , 22 are etched with the alkaline etchant which is used in the step illustrated in FIG. 7 , while insulating layer 23 is virtually not etched with the alkaline etchant. For these reasons, insulating layer 23 and semiconductor layers 21 , 22 can be selectively etched in the step illustrated in FIG. 6 and in the step illustrated in FIG. 7 , respectively.

Subsequently, parts corresponding to peripheral portions 23 a of insulating layer 23 , which are illustrated in FIG. 7 , are etched and removed with the same acidic etchant as is used in the step illustrated in FIG. 6 . Thereby, as illustrated in FIG. 8 , end portions 23 b of insulting layer 23 retreat, and n-type semiconductor stacked structure 12 is exposed outside end portions 23 b . It should be noted that in the steps illustrated in FIGS. 7 and 8 , parts corresponding to peripheral portions 23 a of insulating layer 23 may be etched by photolithography or the like.

Thereafter, as illustrated in FIG. 9 , i-type amorphous semiconductor layer 24 and p-type amorphous semiconductor layer 25 are formed in a way to cover rear surface 10 b in this sequence. No specific restriction is imposed on how to form amorphous semiconductor layers 24 , 25 . Semiconductor layers 24 , 25 may be formed by, for example, CVD or the like.

Next, as illustrated in FIG. 10 , parts of portions of amorphous semiconductor layers 24 , 25 located on insulating layer 23 are etched. Thereby, i-type amorphous semiconductor layer 13 i and p-type amorphous semiconductor layer 13 p are formed from amorphous semiconductor layers 24 , 25 . Used in this step is a first etchant, which makes the etching rate on amorphous semiconductor layers 24 , 25 larger than the etching rate on insulating layer 23 . For this reason, among insulating layer and amorphous semiconductor layers 24 , 25 , amorphous semiconductor layers 24 , 25 are selectively etched.

It should be noted that the “etchant” includes paste-like etching paste, and etching ink whose viscosity is adjusted.

Subsequently, as illustrated in FIG. 11 , insulating layer is etched. To put it concretely, by using amorphous semiconductor layers 13 i , 13 p as a mask, an exposed portion of insulating layer 23 is etched and removed with a second etchant. Thereby, n-type amorphous semiconductor layer 12 n is exposed, and insulating layer 18 is formed from insulating layer 23 . End portions 23 b of insulating layer 23 , which are illustrated in FIG. 8 , correspond to end portions 18 a of insulating layer 18 , which are illustrated in FIG. 11 .

Used in this step is the second etchant, which makes the etching rate on insulating layer 23 larger than the etching rate on amorphous semiconductor layers 24 , 25 . For this reason, among insulating layer 23 and amorphous semiconductor layers 24 , 25 , insulating layer 23 is selectively etched.

As described above, n-type semiconductor stacked structure 12 including i-type amorphous semiconductor layer 12 i and n-type amorphous semiconductor layer 12 n , as well as p-type semiconductor stacked structure 13 including i-type amorphous semiconductor layer 13 i and p-type amorphous semiconductor layer 13 p , can be formed on first principal surface 10 b of semiconductor substrate 10 .

Thereafter, an electrode forming step of forming n-side electrode 14 and p-side electrode 15 respectively on n-type amorphous semiconductor layer 12 n and p-type amorphous semiconductor layer 13 p is carried out by use of the same method as is described in Japanese Patent Application Publication No. 2012-33666. Thereby, solar cell 1 illustrated in FIG. 2 can be finished.

To put it concretely, first conductive layer 19 a made of the TCO and second conductive layer 19 b made of the metal such as Cu or its alloy are formed in this sequence by use of the thin-film forming method including CVD (Chemical Vapor Deposition) such as plasma CVD, and sputtering. Thereafter, portions located on insulating layer 18 are separated. Thereby, first and second conductive layers 19 a , 19 b are formed in the state illustrated in FIG. 2 . It should be noted that this separation can be achieved by, for example, photolithography or the like.

Subsequently, third conductive layer 19 c made of Cu and fourth conductive layer 19 d made of Snare formed in this sequence on first and second conductive layers 19 a , 19 b by electrolytic plating. Thereby, n-side electrode 14 and p-side electrode 15 , which are illustrated in FIG. 2 , can be finished.

With the foregoing steps, solar cell 1 illustrated in FIG. 2 can be manufactured.

Second Embodiment

FIG. 12 is a schematic plan view illustrating stack regions R 4 in a second embodiment. FIG. 13 is a schematic cross-sectional view illustrating the cross section of n-type regions R 1 and p-type region R 2 taken along the XIII-XIII line of FIG. 12 .

In the embodiment, as illustrated in FIG. 12 , in a plan view, projecting portions including end portions 18 a , and recessed portions including end portions 18 b are formed in insulating layer 18 . A cross section including the recessed portions corresponds to the cross section illustrated in FIG. 13 , and a cross section including the projecting portions corresponds to the cross section illustrated in FIG. 2 . Since in the plan view, the recessed portions and the projecting portions are formed in insulating layer 18 , parts of stack regions R 4 are formed extending in a second direction (the x direction) intersecting the first direction (the y direction).

To put it concretely, in the embodiment, the recessed portions set back toward n-type region R 1 , the region having the first conductivity type, are formed in stack regions R 4 . Thereby, areas extending in the first direction (the x direction) and areas extending in the second direction (the y direction) are formed in stack region R 4 . For this reason, the embodiment can increase stack regions R 4 , compared with the first embodiment illustrated in FIG. 3 . The increase in stack regions R 4 makes it possible to increase the current leak path when a reverse bias voltage is applied to the solar cell, and to inhibit the occurrence of the hot spot reliably.

Insulating layer 18 of the embodiment can be formed by patterning insulating layer 23 in a way that in the plan view, recessed portions and projecting portions, as illustrated in FIG. 12 , are formed in a step of etching insulating layer 23 illustrated in FIG. 6 . Thereafter, parts corresponding to peripheral portions 23 a (see FIG. 7 ) of insulating layer 23 which include the thus formed recessed and projecting portions are etched and removed. Thereby, stack regions R 4 can be formed in the outer (p-type region R 2 -side) vicinity of end portions 18 a and end portions 18 b of insulting layer 18 .

Third Embodiment

FIG. 14 is a schematic plan view illustrating stack regions R 4 in a third embodiment. In the embodiment, as illustrated in FIG. 14 , in a plan view, projecting portions including end portions 18 a , and recessed portions including end portions 18 b are formed in insulating layer 18 . In the embodiment, the recessed portions are formed in a way that the recessed portions are arranged in the first direction (the y direction); and distances d 1 to d 5 between the recessed portions adjacent in the first direction (the y direction), i.e. the y-direction widths of the projecting portions including stack regions R 4 , are different from one another. The distances between the recessed portions include three or more distances d 1 to d 5 , which are different from one another.

As described above, the recessed and projecting portions of insulating layer 18 are formed by patterning. For this reason, if the distances between the recessed portions are too narrow, it is likely in some cases that the forms of the recessed and projecting portions cannot be clearly formed depending on changes in etching conditions and the like. In this respect, the changes in the etching conditions and the like include a change in the state of a foundation layer, a change in the concentration of the etchant, and a change in the etching temperature.

When like in the embodiment, the recessed portions are formed in a way that the distances between the recessed portions are different from one another, the forming of the recessed and projecting portions in insulating layer 18 can be achieved at least in an area in which the distances between the recessed portions are wider. For this reason, even if the etching conditions and the like change, the forming of the recessed and projecting portions in insulating layer 18 can be achieved between some of the recessed portions, and stack regions R 4 can be increased. In sum, the embodiment can surely increase stack regions R 4 even if the etching conditions and the like change, and thus can surely increase the current leak path when a reverse bias voltage is applied to the solar cell. Accordingly, the embodiment is capable of inhibiting the occurrence of the hot spot more reliably.

In the embodiment, stack regions R 4 in which the recessed and projected portions are formed are presented as an example that can increase stack regions R 4 . The invention, however, is not limited to this. For example, stack regions R 4 may be formed in a zigzag or wavy shape in a plan view. Stack regions R 4 can be increased when stack regions R 4 are formed in the zigzag or wavy shape than when stack regions R 4 are formed in the linear shape.

Fourth Embodiment

FIG. 15 is a schematic cross-sectional view illustrating a cross section of n-type region R 1 and p-type regions R 2 a , R 2 b in a fourth embodiment.

As illustrated in FIG. 15 , in the embodiment, n-type semiconductor stacked structure 12 is formed projecting from p-type region R 2 a -side end portion 18 a of insulating layer 18 further into p-type region R 2 a . As a result, stack region R 4 where p-type semiconductor stacked structure 13 is formed on n-type semiconductor stacked structure 12 is formed in p-type region R 2 a.

Meanwhile, n-type semiconductor stacked structure 12 is formed projecting beyond p-type region R 2 b -side end portion 18 a of insulating layer 18 further to p-type region R 2 b , too. Insulating region R 3 b on the side of p-type region R 2 b is formed closer to p-type region R 2 b than insulating region R 3 a on the side of p-type region R 2 a is. For these reasons, part of n-type semiconductor stacked structure 12 formed projecting beyond end portion 18 a of insulating layer 18 exists inside insulating region R 3 b . Accordingly, in insulating regions R 3 b , p-type semiconductor stacked structure 13 is stacked on n-type semiconductor stacked structure 12 . No stack region R 4 of the embodiment is formed in insulating region R 3 b.

In sum, in the embodiment, stack region R 4 is formed in p-type region R 2 a only, but no stack region R 4 is formed in p-type region R 2 b.

In the embodiment, stack region R 4 only needs to be formed in any one of p-type regions R 2 a , R 2 b on the two sides across n-type region R 1 . Accordingly, positional accuracy to form insulating regions R 1 a , R 3 b may be lower in the embodiment than in the first embodiment illustrated in FIGS. 2 and 3 . For this reason, the degree of integration can be increased by arranging n-type region R 1 and p-type regions R 2 a , R 2 b in a narrower pitch. In other words, it is possible to achieve more reliable inhibition of occurrence of a hot spot in the solar cell and the increase in power generation efficiency at the same time.

The foregoing embodiments are based on the case where the first conductivity type is the n-type and the second conductivity type is the p-type. However, the invention is not limited this. The first conductivity type may be the p-type and the second conductivity type may be the n-type.

The invention includes other embodiments in addition to the above-described embodiments without departing from the spirit of the invention. The embodiments are to be considered in all respects as illustrative, and not restrictive. The scope of the invention is indicated by the appended claims rather than by the foregoing description. Hence, all configurations including the meaning and range within equivalent arrangements of the claims are intended to be embraced in the invention.